المؤلفون: Chih-Yao Chang, Chien-Sheng Wang, Ching-Yao Wang, Yao-Luen Shen, Tian-Li Wu, Wei-Hung Kuo, Suh-Fang Lin, Chih-Fang Huang

المصدر: IEEE Journal of the Electron Devices Society, Vol 9, Pp 2-5 (2021)

مصطلحات موضوعية: GaN, high electron mobility transistor (HEMT), indium–tin–oxide gate electrode, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9223718/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/e88bdee7d92a42968b3d4ce3ce86174b

المؤلفون: Chih-Yao Chang, Yao-Luen Shen, Ching-Yao Wang, Shun-Wei Tang, Tian-Li Wu, Wei-Hung Kuo, Suh-Fang Lin, Chih-Fang Huang

المصدر: IEEE Journal of the Electron Devices Society, Vol 9, Pp 687-690 (2021)

مصطلحات موضوعية: GaN, high electron mobility transistor (HEMT), indium–tin–oxide gate electrode, PBTI, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9480594/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/62d9ad8fc9cf4cc3a126b23577723831

المؤلفون: Ju-Chin Chen, Kawuu Weicheng Lin, Chuan-Wei Ting, Ching-Yao Wang

المصدر: 2016 IEEE International Conference on Systems, Man, and Cybernetics (SMC) Systems, Man, and Cybernetics (SMC), 2016 IEEE International Conference on. :004211-004216 Oct, 2016

Relation: 2016 IEEE International Conference on Systems, Man, and Cybernetics (SMC)

المؤلفون: Ching-Yao Wang, Tzung-Pei Hong, Shian-Shyong Tseng

المصدر: 2002 IEEE International Conference on Data Mining, 2002. Proceedings. Data mining Data Mining, 2002. ICDM 2003. Proceedings. 2002 IEEE International Conference on. :693-696 2002

Relation: Proceedings 2002 IEEE International Conference on Data Mining. ICDM 2002

المؤلفون: Ching-Yao Wang, Tzung-Pei Hong, Shian-Shyong Tseng

المصدر: Proceedings 2001 IEEE International Conference on Data Mining Data mining Data Mining, 2001. ICDM 2001, Proceedings IEEE International Conference on. :536-541 2001

Relation: Proceedings 2001 IEEE International Conference on Data Mining

المؤلفون: Tzung-Pei Hong, Ching-Yao Wang, Yu-Hui Tao

المصدر: KES'2000. Fourth International Conference on Knowledge-Based Intelligent Engineering Systems and Allied Technologies. Proceedings (Cat. No.00TH8516) Knowledge-based intelligent engineering systems and allied technologies Knowledge-Based Intelligent Engineering Systems and Allied Technologies, 2000. Proceedings. Fourth International Conference on. 1:436-439 vol.1 2000

Relation: Fourth International Conference on Knowledge-Based Intelligent Engineering Systems and Allied Technologies/ Proceedings. KES'2000

المؤلفون: Shin-Chih Chang, Liao, Chun-Feng, Yong-Cheng Liu, Fu, Li-Chen, Ching-Yao Wang

المصدر: 2009 Joint Conferences on Pervasive Computing (JCPC) Pervasive Computing (JCPC), 2009 Joint Conferences on. :441-446 Dec, 2009

Relation: 2009 Joint Conferences on Pervasive Computing (JCPC)

المؤلفون: Yu-chen ho, Ching-hu lu, I-han chen, Shih-shinh huang, Ching-yao wang, Li-chen fu

المصدر: 2009 IEEE International Conference on Robotics and Automation Robotics and Automation, 2009. ICRA '09. IEEE International Conference on. :813-818 May, 2009

Relation: 2009 IEEE International Conference on Robotics and Automation (ICRA)

المؤلفون: Ching-Yao Wang, Wei-Hung Kuo, Chih-Fang Huang, Suh-Fang Lin, Tian-Li Wu, Chih-Yao Chang, Chien-Sheng Wang, Yao-Luen Shen

المصدر: IEEE Journal of the Electron Devices Society. 9:2-5

مصطلحات موضوعية: 010302 applied physics, Materials science, Transistor, Analytical chemistry, 02 engineering and technology, High-electron-mobility transistor, 021001 nanoscience & nanotechnology, 01 natural sciences, Omega, Electronic, Optical and Magnetic Materials, Indium tin oxide, law.invention, law, 0103 physical sciences, Electrode, Gan algan, Electrical and Electronic Engineering, 0210 nano-technology, High electron, Biotechnology, Diode

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2617fd2ec5a43bd773b1b292772063c1
https://doi.org/10.1109/jeds.2020.3030911

المؤلفون: Shun-Wei Tang, Yao-Luen Shen, Tian-Li Wu, Suh-Fang Lin, Chih-Yao Chang, Wei-Hung Kuo, Ching-Yao Wang, Chih-Fang Huang

المصدر: IEEE Journal of the Electron Devices Society. 9:687-690

مصطلحات موضوعية: Materials science, Condensed matter physics, Logic gate, Electrode, Breakdown voltage, Trapping, Electrical and Electronic Engineering, Instability, Ohmic contact, Layer (electronics), Electronic, Optical and Magnetic Materials, Biotechnology, Indium tin oxide

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c9513848aba70e846bcdc0b1a75b14ec
https://doi.org/10.1109/jeds.2021.3096389