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المؤلفون: K.-Y. Roy Wong, Chen Po-Chih, C. B. Wu, Ching-Ray Chen, C. W. Hsiung, Ming-Huei Lin, F. J. Yang, Liao Yan-Jie, M. W. Tsai, Yani Lai, Chiu Hsien-Kuang, Tom Tsai, Man-Ho Kwan, Sheng-Da Liu, Burn Jeng Lin, Chang Yu-Chi, Jan-Wen You, Alex Kalnitsky, Chen-Shien Chen, M.-H. Chang, J. L. Yu, L. Y. Tsai, Yu-Syuan Lin, P.-C. Liu, Ru-Yi Su, Fu-Wei Yao, H. C. Tuan, L. C. Chen, Haw-Yun Wu, K.-L. Chiu, Chia-Shiung Tsai, Chung-Yi Yu, S.-P. Wang, G. P. Lansbergen, Chiang Chen-Hao
المصدر: 2015 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: Materials science, business.industry, Transistor, Schottky diode, Gallium nitride, Capacitance, law.invention, chemistry.chemical_compound, chemistry, law, Logic gate, Optoelectronics, business, MISFET, AND gate, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b7faa0d215059670d3d4fc905d6e081b
https://doi.org/10.1109/iedm.2015.7409663 -
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المؤلفون: P. C. Chen, Chang Yu-Chi, Haw-Yun Wu, C. W. Hsiung, C. B. Wu, J. L. Tsai, Alex Kalnitsky, Yu-Syuan Lin, J. L. Yu, Fu-Wei Yao, Ru-Yi Su, M. W. Tsai, Yani Lai, Man Ho Kwan, Chung-Yi Yu, Ming-Huei Lin, M.-H. Chang, Chiu Hsien-Kuang, S.-P. Wang, Lin Hsing-Chih, G. P. Lansbergen, P.-C. Liu, King-Yuen Wong, L. C. Chen, Ching-Ray Chen, Wu Cheng-Ta, F. J. Yang, H. C. Tuan
المصدر: 2014 IEEE International Electron Devices Meeting.
مصطلحات موضوعية: Reliability (semiconductor), Materials science, business.industry, Electrical engineering, Optoelectronics, Breakdown voltage, Field-effect transistor, Wafer, High voltage, business, Epitaxy, Cmos compatible, Power (physics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ae1841ade0c92d1ddbbd5e8ec22c1875
https://doi.org/10.1109/iedm.2014.7047073 -
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المؤلفون: C. W. Hsiung, Chia-Shiung Tsai, C. L. Tsai, J. L. Yu, Chou Chien-Chih, Chiu Hsien-Kuang, Ping Chen Chen, King-Yuen Wong, F. J. Yang, H. C. Tuan, C. J. Yu, Sheng-Da Liu, Fu-Wei Yao, Chung-Hao Tsai, Yu-Syuan Lin, Ru-Yi Su, Xiaomeng Chen, Alex Kalnitsky, G. P. Lansbergen
المصدر: 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD).
مصطلحات موضوعية: Materials science, Silicon, business.industry, chemistry.chemical_element, Algan gan, Substrate (electronics), Nitride, Threshold voltage, Trap (computing), Reliability (semiconductor), chemistry, Optoelectronics, Positive bias, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d01b1c02f3be2ff85e55ca77c2e4bd9b
https://doi.org/10.1109/ispsd.2014.6856034 -
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المؤلفون: Yu-Syuan Lin, Alex Kalnitsky, Ru-Yi Su, C. W. Hsiung, P.-C. Liu, Ming-Huei Lin, Chiu Hsien-Kuang, F. J. Yang, H. C. Tuan, King-Yuen Wong, S. D. Liu, J. L. Yu, Fu-Wei Yao, C. J. Yu, Xiaomeng Chen, C. L. Tsai, Yani Lai, Chia-Shiung Tsai, Ching-Ray Chen, Chen Po-Chih, G. P. Lansbergen, Chung-Yi Yu, Chiang Chen-Hao
المصدر: 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD).
مصطلحات موضوعية: Reliability (semiconductor), Materials science, business.industry, Contact resistance, Electrical engineering, Optoelectronics, Breakdown voltage, Algan gan, Substrate (electronics), business, Epitaxy, Layer (electronics), Bias stress
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::15f0b75d4642c065a0ced749472125e9
https://doi.org/10.1109/ispsd.2014.6855974 -
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المؤلفون: Hun-Jan Tao, Fang-Cheng Chen, Chiu Hsien-Kuang, Chenming Hu, Yee-Chia Yeo, C.H. Chen, Chi-Chuang Lee, Chi-Chun Chen, Chang-Yun Chang, Huan-Tsung Huang, Cheng-Chuan Huang, Mong-Song Liang, Fu-Liang Yang, Hao-Yu Chen
المصدر: Digest. International Electron Devices Meeting.
مصطلحات موضوعية: Physics, business.industry, Transistor, Electrical engineering, Omega, law.invention, CMOS, Gate oxide, law, Low-power electronics, MOSFET, Optoelectronics, business, Low voltage, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9c2c69d8536555f2b5fa12b4b13ac770
https://doi.org/10.1109/iedm.2002.1175826