المؤلفون: Daraio, E., Cagliero, L., Chiusano, S., Garza, P.

المصدر: IEEE Transactions on Intelligent Transportation Systems IEEE Trans. Intell. Transport. Syst. Intelligent Transportation Systems, IEEE Transactions on. 23(11):21216-21227 Nov, 2022

المؤلفون: Baralis, E., Cerquitelli, T., Chiusano, S.

المصدر: 21st International Conference on Data Engineering (ICDE'05) Data engineering Data Engineering, 2005. ICDE 2005. Proceedings. 21st International Conference on. :754-765 2005

Relation: Proceedings. 21st International Conference on Data Engineering

المؤلفون: Chiusano, S., Di Carlo, S., Prinetto, P.

المصدر: Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) On-line testing workshop On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International. :26-31 2002

Relation: Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002)

المؤلفون: Chiusano, S., Di Carlo, S., Prinetto, P., Wunderlich, H.-J.

المصدر: Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001 Design, automation and test in Europe Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings. :156-160 2001

Relation: Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001

المؤلفون: Chiusano, S., Di Natale, G., Prinetto, P., Bigongiari, F.

المصدر: Proceedings International Test Conference 2001 (Cat. No.01CH37260) International test conference Test Conference, 2001. Proceedings. International. :250-257 2001

Relation: Proceedings International Test Conference

المؤلفون: Benso, A., Chiusano, S., Prinetto, P., Simonotti, P., Ugo, G.

المصدر: Proceedings IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Defect and fault tolerance in VLSI systems Defect and Fault Tolerance in VLSI Systems, 2000. Proceedings. IEEE International Symposium on. :231-239 2000

Relation: Proceedings IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

المؤلفون: Baldini, A., Benso, A., Chiusano, S., Prinetto, P.

المصدر: Proceedings IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Defect and fault tolerance in VLSI systems Defect and Fault Tolerance in VLSI Systems, 2000. Proceedings. IEEE International Symposium on. :387-395 2000

Relation: Proceedings IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

المؤلفون: Benso, A., Chiusano, S., Prinetto, P.

المصدر: Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) On-line testing On-Line Testing Workshop, 2000. Proceedings. 6th IEEE International. :9-16 2000

Relation: 6th IEEE International On-Line Testing Workshop

المؤلفون: Benso, A., Chiusano, S., Di Natale, G., Prinetto, P., Bodoni, M.L.

المصدر: Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) On-line testing On-Line Testing Workshop, 2000. Proceedings. 6th IEEE International. :214-218 2000

Relation: 6th IEEE International On-Line Testing Workshop

المؤلفون: Benso, A., Chiusano, S., Prinetto, P., Tagliaferri, L.

المصدر: Proceeding International Conference on Dependable Systems and Networks. DSN 2000 Dependable systems and networks Dependable Systems and Networks, 2000. DSN 2000. Proceedings International Conference on. :71-78 2000

Relation: Proceedings of International Conference on Dependable Systems and Networks (includes FTCS-30 30th Annual International Symposium on Fault-Tolerant Computing and DCCA-8)