المؤلفون: Jiang, Hai, Kim, Jinju, Choi, Kihyun, Shim, Hyewon, Sagong, Hyunchul, Park, Junekyun, Rhee, Hwasung, Lee, Euncheol

المصدر: 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-6 Mar, 2021

Relation: 2021 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Choi, Kihyun, Jeong, Taeyoung, Kim, Jinju, Choo, Seungjin, Kim, Younghan, Yeo, Myung Soo, Lee, Miji, Kim, Jinseok, Lee, Euncheol

المصدر: 2021 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2021 IEEE International. :1-3 Jul, 2021

Relation: 2021 IEEE International Interconnect Technology Conference (IITC)

المؤلفون: Jiang, Hai, Jeong, Taeyoung, Sagong, Hyunchul, Choi, Kihyun, Jin, Minjung, Yeo, Myungsoo, Rhee, Hwasung, Lee, Euncheol

المصدر: 2020 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2020 IEEE International. :1-5 Oct, 2020

Relation: 2020 IEEE International Integrated Reliability Workshop (IIRW)

المؤلفون: Sagong, Hyun Chul, Choi, Kihyun, Jiang, Hai, Park, Junekyun, Rhee, Hwasung, Pae, Sangwoo

المصدر: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2020 4th IEEE. :1-4 Apr, 2020

Relation: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

المؤلفون: Kim, Seongkyung, Jung, Ukjin, Choo, Seungjin, Choi, Kihyun, Chung, Taejin, Chung, Shinyoung, Lee, Euncheol, Park, Juhun, Bae, Deokhan, Um, Myungyoon

المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :11A.1-1-11A.1-7 Mar, 2022

Relation: 2022 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Mahmud, Md Iqbal, Ranjan, Rakesh, Lee, Ki-Don, Perepa, Pavitra Ramadevi, Dongkyun Kwon, Caleb, Choo, Seungjin, Choi, Kihyun

المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :P58-1-P58-4 Mar, 2022

Relation: 2022 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Mun, Hyunsu, Choi, Kihyun, Kim, Jinhyeok, Cho, Isung, Na, Jeasung, Park, Hanul, Kim, Seungtae, Lee, Youngseok, Siebers, Zachary, Rausch, Sarah, Springer, John

المصدر: 2018 IEEE International Conference on Consumer Electronics - Asia (ICCE-Asia) Consumer Electronics - Asia (ICCE-Asia), 2018 IEEE International Conference on. :206-212 Jun, 2018

Relation: 2018 IEEE International Conference on Consumer Electronics - Asia (ICCE-Asia)

المؤلفون: Choi, Kihyun, Sagong, Hyun Chul, Jin, Minjung, Hai, Jiang, Lee, Miji, Jeong, Taeyoung, Yeo, Myung Soo, Shim, Hyewon, Ahn, Da, Kim, Wooyeon, Kim, Yongjeung, Park, JuneKyun, Rhee, Hwasung, Lee, Euncheol

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :9.3.1-9.3.4 Dec, 2020

Relation: 2020 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Choi, Kihyun, Sagong, Hyun Chul, Kang, Wonchang, Kim, Hyunjin, Hai, Jiang, Lee, Miji, Kim, Bomi, Lee, Mi-ji, Lee, Soonyoung, Shim, Hyewon, Park, Junekyun, Cho, Youngwoo, Rhee, Hwasung, Pae, Sangwoo

المصدر: 2019 Symposium on VLSI Technology VLSI Technology, 2019 Symposium on. :T16-T17 Jun, 2019

Relation: 2019 Symposium on VLSI Technology

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