المؤلفون: Emteborg, Håkan^Aff1, Florian, Doris, Choquette, Steven, Ellison, Stephen L. R., Fernandes-Whaley, Maria, Mackay, Lindsey, McCarron, Pearse, Panne, Ulrich, Sander, Sylvia G., Kim, Sook-Kyung, Held, Andrea, Linsinger, Thomas, Trapmann, Stefanie

المصدر: Accreditation and Quality Assurance: Journal for Quality, Comparabilityand Reliability in ChemicalMeasurement. 23(6):371-377

المؤلفون: May, Willie E.^Aff01, Cavanagh, Richard R.^Aff02, Turk, Gregory C.^Aff03, Winchester, Michael^Aff04, Travis, John^Aff05, Smith, Melody V.^Aff06, DeRose, Paul^Aff07, Choquette, Steven J.^Aff08, Kramer, Gary W.^Aff09, Sieber, John R.^Aff010, Greenberg, Robert R.^Aff011, Lindstrom, Richard^Aff012, Lamaze, George^Aff013, Zeisler, Rolf^Aff014, Schantz, Michele^Aff015, Sander, Lane^Aff016, Phinney, Karen W.^Aff017, Welch, Michael^Aff018, Vetter, Thomas^Aff019, Pratt, Kenneth W.^Aff020, Scott, John H. J.^Aff021, Small, John^Aff022, Wight, Scott^Aff023, Stranick, Stephan J.^Aff024, Matschat, Ralf^Aff025, Reich, Peter^Aff026

المساهمون: Czichos, Horst, editor^Aff1, Saito, Tetsuya, editor^Aff2, Smith, Leslie, editor^Aff3

المصدر: Springer Handbook of Metrology and Testing. :145-203

Degree: Prof.
Dr.
Ph.D.
B.S.

المؤلفون: Laiz, Héctor, Hackel, Siegfried, Härtig, Frank, Schrader, Thorsten, Shanna, Shanna, Loewe, Jan, Doering, Lutz, Gloger, Benjamin, Jagieniak, Justin, Hutzschenreuter, Daniel, Söylev-Öktem, Gamze, Phuaknoi, Pawat, Mongkolsuttirat, Kittisun, Chantawong, Narin, Limthunyalak, Wasin, Buajarern, Jariya, Hanisch, Robert, Fedchak, James Antony, Choquette, Steven, Rimmer, Caterine, Long, Benjamin, Plante, Raymond, Lippa, Katrice, Camara, Dinis, Saxholm, Sari, Kärkkäinen, Anu, Hemming, Björn, Sairanen, Hannu, Koskinen, Sami, Nummiluikki, Juho, Riska, Kennet, Järnefelt, Tapio, Mustapää, Tuukka, Viitala, Raine, Ijäs, Miikka, Brandt, Jari, Haapalainen, Mikko, Videnoja, Emmi, Banholzer, Karlheinz, Müller-Schöll, Christian, Haller, Julian, Reitzer, Heiko, Kuenz, Eric, Koch, Hans, Lopez-Celis, Jose Armando, Dominguez-Mendoza, Itzel, Galvan-Hernandez, Carlos, Garcia-Gonzalez, Aldo, Gasca Aragon, Hugo, Ramos-Monsalvo, Oscar, Kuster, Mark, Tobola, Andreas, Bernien, Matthias, Bock, Thomas, Niepraschk, Rolf, Jousten, Karl, Matamala, Antonio, Proskurin, Pavel, Engel, Thomas, Smith, Ian, Stotz, Maik, Stobe, Caroline, Röske, Dirk, Schwartz, Schwartz Michael L., Cenker, Greg, Kuch, Susanne, Kirmes, Raoul, Witt, Florian, Bakri, Saad Ali Haj, Al-Rahali, Talaat, Busser, Lisa, Xiong, Xingchuang, Brown, Robert, Morse, Ed, Krah, Thomas

مصطلحات موضوعية: Digital Test Certificate (DTC), DCC Good Practice, Digital SchemaX (DX), Envelope Digital Certificate (EDC), Digital SI (D-SI), Security in DCC, Quality Information Framework (QIF), Digital Calibration Certificate (DCC), Excel tool for generating DCCs, Digital Reference Materials (DRM)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b7f861f45b95b3569361c833c718f14b

المؤلفون: Etz, Edgar S., Choquette, Steven J., Hurst, Wilbur S.

المصدر: Microchimica Acta: Micro and Trance Analysis. April 2005 149(3-4):175-184

المؤلفون: May, Willie E, Cavanagh, Richard R, Turk, Gregory C, Winchester, Michael, Travis, John, Smith, Melody V, DeRose, Paul, Choquette, Steven J, Kramer, Gary W, Sieber, John R, Greenberg, Robert R, Lindstrom, Richard, Lamaze, George, Zeisler, Rolf, Schantz, Michele, Sander, Lane, Phinney, Karen W, Welch, Michael, Vetter, Thomas, Pratt, Kenneth W, scott, John Henry, Small, John, Wight, Scott, Stranick, Stephan J

المصدر: Springer Handbook of Materials Measurement Methods. 2006, p105-152.

المؤلفون: Duewer, David L., Choquette, Steven J., O’Neal, Lindsey, Filliben, James J.

المصدر: In Analytica Chimica Acta 2003 490(1):85-98

المؤلفون: Choquette, Steven J., Duewer, David L., Sharpless, Katherine E.

المصدر: Annual Review of Analytical Chemistry; Jun2020, Vol. 13, p453-474, 16p

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