المؤلفون: Chou, G., Wang, H., Berenson, D.

المصدر: IEEE Robotics and Automation Letters IEEE Robot. Autom. Lett. Robotics and Automation Letters, IEEE. 7(2):3827-3834 Apr, 2022

المؤلفون: Knuth, C., Chou, G., Ozay, N., Berenson, D.

المصدر: IEEE Robotics and Automation Letters IEEE Robot. Autom. Lett. Robotics and Automation Letters, IEEE. 6(3):5129-5136 Jul, 2021

المؤلفون: Chou, G., Ozay, N., Berenson, D.

المصدر: IEEE Robotics and Automation Letters IEEE Robot. Autom. Lett. Robotics and Automation Letters, IEEE. 5(2):3682-3690 Apr, 2020

المؤلفون: Chou, G., Wang, R.

المصدر: IEEE Signal Processing Letters IEEE Signal Process. Lett. Signal Processing Letters, IEEE. 27:1230-1234 2020

المؤلفون: Knuth, C., Chou, G., Ozay, N., Berenson, D.

المصدر: IEEE Robotics and Automation Letters IEEE Robot. Autom. Lett. Robotics and Automation Letters, IEEE. 7(1):381-381 Jan, 2022

المؤلفون: Chou, G., Sahin, Y.E., Yang, L., Rutledge, K.J., Nilsson, P., Ozay, N.

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 37(11):2906-2917 Nov, 2018

المؤلفون: Cavaretta, M., Chou, G., Madani, B.

المصدر: NAFIPS 2005 - 2005 Annual Meeting of the North American Fuzzy Information Processing Society North American fuzzy information processing society Fuzzy Information Processing Society, 2005. NAFIPS 2005. Annual Meeting of the North American. :252-256 2005

Relation: NAFIPS 2005. 2005 Annual Meeting of the North American Fuzzy Information Processing Society

المؤلفون: Lin, Y.T., Chiang, P.-Y., Lai, C.S., Chung, S.S., Chou, G., Huang, C.T., Chen, P., Chu, C.H., Hsu, C.C.-H.

المصدر: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :239-242 2004

Relation: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004

المؤلفون: Chung, C.H., Chien, T., Hsiao, J.S., Chu, C.H., Kuo, W.S., Cheng, C.C., Li, F., Nieh, S., Wu, S., Wang, B., Wang, C., Hu, T., Hsiao, G., Che, M., Hon, R.Y., Chen, H.M., Chou, G., Chang, G., Chou, L., Shu, H.C., Huang, K.Y., Tsai, V.

المصدر: 2006 International Symposium on VLSI Technology, Systems, and Applications VLSI Technology, Systems, and Applications, 2006 International Symposium on. :1-2 Apr, 2006

Relation: 2006 International Symposium on VLSI Technology, Systems, and Applications

المؤلفون: Chung, S.S., Chiang, P.-Y., Chou, G., Huang, C.-T., Chen, P., Chu, C.-H., Hsu, C.C.-H.

المصدر: IEEE International Electron Devices Meeting 2003 Electron devices IEDM'03 Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International. :26.6.1-26.6.4 2003

Relation: IEEE International Electron Devices Meeting 2003