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1مؤتمر
المؤلفون: Wen, Tai-Hao, Hsu, Hung-Hsi, Khwa, Win-San, Huang, Wei-Hsing, Ke, Zhao-En, Chin, Yu-Hsiang, Wen, Hua-Jin, Chang, Yu-Chen, Hsu, Wei-Ting, Lo, Chung-Chuan, Liu, Ren-Shuo, Hsieh, Chih-Cheng, Tang, Kea-Tiong, Teng, Shih-Hsin, Chou, Chung-Cheng, Chih, Yu-Der, Chang, Tsung-Yung Jonathan, Chang, Meng-Fan
المصدر: 2024 IEEE International Solid-State Circuits Conference (ISSCC) Solid-State Circuits Conference (ISSCC), 2024 IEEE International. 67:580-582 Feb, 2024
Relation: 2024 IEEE International Solid-State Circuits Conference (ISSCC)
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2مؤتمر
المؤلفون: Lai, Chien-An, Chou, Chung-Cheng, Weng, Chi-Hsiang, Lin, Zheng-Jun, Tseng, Pei-Ling, Wang, Chien-Fan, Wang, Chih-Chen, Su, Chin-I, Chen, Wei-Chi, Lin, Yu-Cheng, Ong, Tong-Chern, Chang, Chi, Chih, Yu-Der, Chang, Tsung-Yung
المصدر: 2018 IEEE Asian Solid-State Circuits Conference (A-SSCC) Solid-State Circuits Conference (A-SSCC), 2018 IEEE Asian. :13-16 Nov, 2018
Relation: 2018 IEEE Asian Solid-State Circuits Conference (A-SSCC)
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3مؤتمر
المؤلفون: Chih, Yu-Der, Chou, Chung-Cheng, Shih, Yi-Chun, Lee, Chia-Fu, Khwa, Win-San, Wu, Chun-Yu, Shen, Kuei-Hung, Chu, Wen-Ting, Chang, Meng-Fan, Chuang, Harry, Chang, Tsung-Yung Jonathan
المصدر: 2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :2.4.1-2.4.4 Dec, 2021
Relation: 2021 IEEE International Electron Devices Meeting (IEDM)
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4مؤتمر
المؤلفون: Chou, Chung-Cheng, Lin, Zheng-Jun, Lai, Chien-An, Su, Chin-I, Tseng, Pei-Ling, Chen, Wei-Chi, Tsai, Wu-Chin, Chu, Wen-Ting, Ong, Tong-Chern, Chuang, Harry, Chih, Yu-Der, Chang, Tsung-Yung Jonathan
المصدر: 2020 IEEE Symposium on VLSI Circuits VLSI Circuits, 2020 IEEE Symposium. :1-2 Jun, 2020
Relation: 2020 IEEE Symposium on VLSI Circuits
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5مؤتمر
المؤلفون: Chou, Chung-Cheng, Lin, Zheng-Jun, Tseng, Pei-Ling, Li, Chih-Feng, Chang, Chih-Yang, Chen, Wei-Chi, Chih, Yu-Der, Chang, Tsung-Yung Jonathan
المصدر: 2018 IEEE International Solid-State Circuits Conference - (ISSCC) Solid-State Circuits Conference - (ISSCC), 2018 IEEE International. :478-480 Feb, 2018
Relation: 2018 IEEE International Solid-State Circuits Conference - (ISSCC)
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6مؤتمر
المؤلفون: Chiu, Yen-Cheng, Hu, Han-Wen, Lai, Li-Ya, Huang, Tsung-Yuan, Kao, Hui-Yao, Chang, Kuang-Tang, Ho, Mon-Shu, Chou, Chung-Cheng, Chih, Yu-Der, Chang, Tsung-Yung, Chang, Meng-Fan
المصدر: 2019 Symposium on VLSI Technology VLSI Technology, 2019 Symposium on. :T232-T233 Jun, 2019
Relation: 2019 Symposium on VLSI Technology
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7دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
8دورية أكاديمية
المؤلفون: Hung, Je-Min, Xue, Cheng-Xin, Kao, Hui-Yao, Huang, Yen-Hsiang, Chang, Fu-Chun, Huang, Sheng-Po, Liu, Ta-Wei, Jhang, Chuan-Jia, Su, Chin-I, Khwa, Win-San, Lo, Chung-Chuan, Liu, Ren-Shuo, Hsieh, Chih-Cheng, Tang, Kea-Tiong, Ho, Mon-Shu, Chou, Chung-Cheng, Chih, Yu-Der, Chang, Tsung-Yung Jonathan, Chang, Meng-FanAff1, Aff2, IDs41928021006769_cor19
المصدر: Nature Electronics. 4(12):921-930
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9دورية أكاديمية
المؤلفون: Xue, Cheng-Xin, Chiu, Yen-Cheng, Liu, Ta-Wei, Huang, Tsung-Yuan, Liu, Je-Syu, Chang, Ting-Wei, Kao, Hui-Yao, Wang, Jing-Hong, Wei, Shih-Ying, Lee, Chun-Ying, Huang, Sheng-Po, Hung, Je-Min, Teng, Shih-Hsih, Wei, Wei-Chen, Chen, Yi-Ren, Hsu, Tzu-Hsiang, Chen, Yen-Kai, Lo, Yun-Chen, Wen, Tai-Hsing, Lo, Chung-Chuan, Liu, Ren-Shuo, Hsieh, Chih-Cheng, Tang, Kea-Tiong, Ho, Mon-Shu, Su, Chin-Yi, Chou, Chung-Cheng, Chih, Yu-Der, Chang, Meng-FanAff1
المصدر: Nature Electronics. 4(1):81-90
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10
المؤلفون: Ta-Wei Liu, Meng-Fan Chang, Yu-Der Chih, Je-Syu Liu, Chin-Yi Su, Ting-Wei Chang, Shih-Ying Wei, Tsung-Yuan Huang, Cheng-Xin Xue, Wei-Chen Wei, Je-Min Hung, Chun-Ying Lee, Tai-Hsing Wen, Mon-Shu Ho, Yi-Ren Chen, Yen-Kai Chen, Kea-Tiong Tang, Yun-Chen Lo, Jing-Hong Wang, Sheng-Po Huang, Chou Chung-Cheng, Shih-Hsih Teng, Chung-Chuan Lo, Chih-Cheng Hsieh, Ren-Shuo Liu, Hui-Yao Kao, Yen-Cheng Chiu, Tzu-Hsiang Hsu
المصدر: Nature Electronics. 4:81-90
مصطلحات موضوعية: Resistive touchscreen, Edge device, Computer science, business.industry, Process (computing), Energy consumption, Electronic, Optical and Magnetic Materials, Resistive random-access memory, CMOS, Electrical and Electronic Engineering, Macro, business, Instrumentation, Computer hardware, Electronic circuit