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1دورية أكاديمية
المؤلفون: Christoph Kerner, Annina Thaller, Thomas Brudermann
المصدر: Environmental Research Communications, Vol 5, Iss 4, p 041003 (2023)
مصطلحات موضوعية: net emission technologies, direct air carbon capture and storage, bioenergy with carbon capture and storage, expert opinion, climate engineering, academic experts, Environmental sciences, GE1-350, Meteorology. Climatology, QC851-999
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2515-7620
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2دورية أكاديمية
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3
المؤلفون: Thomas Brudermann, Christoph Kerner
المصدر: Sustainability, Vol 13, Iss 4774, p 4774 (2021)
Sustainability
Volume 13
Issue 9مصطلحات موضوعية: behavior change, 020209 energy, Geography, Planning and Development, Rebound effect, TJ807-830, moral licensing, 02 engineering and technology, Management, Monitoring, Policy and Law, TD194-195, Renewable energy sources, Empirical research, travel behavior, 0502 economics and business, 0202 electrical engineering, electronic engineering, information engineering, Economics, GE1-350, Environmental effects of industries and plants, Public economics, Renewable Energy, Sustainability and the Environment, flight emissions, 05 social sciences, Behavior change, Carbon offset, carbon offsets, Environmental sciences, Travel behavior, Conceptual framework, Greenhouse gas, flight shame, Sustainability, behavioral rebound effect, VCO, 050212 sport, leisure & tourism
وصف الملف: application/pdf
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4
المؤلفون: Thomas Hoffmann, Liesbeth Witters, C. Ortolland, Bertrand Parvais, Lars-Ake Ragnarsson, S. Kubicek, Anne Lauwers, Thomas Chiarella, Christoph Kerner, S. Brus, Serge Biesemans, Augusto Redolfi, Michal Rakowski, Philippe Absil, A. De Keersgieter, Abdelkarim Mercha, C. Vrancken
المساهمون: Faculty of Economic and Social Sciences and Solvay Business School, Laboratorium for Micro- and Photonelectronics, Electronics and Informatics, Vriendenkring VUB, Faculty of Medicine and Pharmacy
المصدر: Solid-State Electronics. 54:855-860
مصطلحات موضوعية: Bulk FinFET, Engineering, Silicon on insulator, Hardware_PERFORMANCEANDRELIABILITY, Parasitic capacitance/resistance, Capacitance, SOI FinFET, MOSFET, Hardware_INTEGRATEDCIRCUITS, Materials Chemistry, Electrical and Electronic Engineering, Hardware_MEMORYSTRUCTURES, variability, business.industry, Electrical engineering, SRAM, Condensed Matter Physics, Diffusion capacitance, Electronic, Optical and Magnetic Materials, Threshold voltage, CMOS, Parasitic element, Optoelectronics, Ring-oscillator, business, Low voltage, Hardware_LOGICDESIGN
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5
المؤلفون: Shawn G. Thomas, Ernst Hendrik August Granneman, Peter Verheyen, C.S. Kim, Roger Loo, Y. Zhang, Matthias Bauer, W. Vandervorst, Naoto Horiguchi, Sebastian Koelling, Philippe Absil, Vladimir Machkaoutsan, Anne Lauwers, T. Y. Hoffmann, K. Vanormelingen, Alexis Franquet, Christoph Kerner
المصدر: Microelectronic Engineering. 87:306-310
مصطلحات موضوعية: Dynamic random-access memory, Materials science, business.industry, Annealing (metallurgy), Transistor, Condensed Matter Physics, Epitaxy, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, chemistry.chemical_compound, chemistry, law, Silicide, Silicon carbide, Optoelectronics, Thermal stability, Electrical and Electronic Engineering, business, NMOS logic
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6
المؤلفون: Y. Okuno, Marc Aoulaiche, Naoto Horiguchi, C. Ortolland, T. Y. Hoffmann, Christoph Kerner, C. Stapelmann, Peter Verheyen
المصدر: IEEE Transactions on Electron Devices. 56:1690-1697
مصطلحات موضوعية: Computer science, Strained silicon, Hardware_PERFORMANCEANDRELIABILITY, Memorization, Electronic, Optical and Magnetic Materials, PMOS logic, CMOS, Logic gate, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Electrical and Electronic Engineering, NMOS logic, Maskless lithography, Hardware_LOGICDESIGN
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7
المؤلفون: Serge Biesemans, Hugo Bender, Roger Loo, Shawn G. Thomas, T. Y. Hoffmann, Peter Verheyen, Denis Shamiryan, Vladimir Machkaoutsan, Jennifer Spear, Doran Weeks, Philipe Absil, Andriy Hikavyy, Francesca Clemente, Yangting Zhang, Christoph Kerner, Matthias Bauer
المصدر: ECS Transactions. 16:1001-1013
مصطلحات موضوعية: Materials science, business.industry, MOSFET, Electronic engineering, N channel, Optoelectronics, Current (fluid), business, Epitaxy
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8
المؤلفون: S. Van Elshocht, J. Swerts, S. Biesemans, Hui Yu, T. Y. Hoffmann, X.P. Wang, Marc Aoulaiche, Annelies Delabie, A. Akheyar, Laura Nyns, S.Z. Chang, Christoph Kerner, Philippe Absil, C. Adelmann
المصدر: IEEE Electron Device Letters. 29:430-433
مصطلحات موضوعية: Materials science, CMOS, MOSFET, Electrode, Electronic engineering, Analytical chemistry, Equivalent oxide thickness, Dielectric, Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Leakage (electronics), High-κ dielectric, Ion
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9
المؤلفون: Sofie Mertens, M. Niwa, S. Biesemans, Aude Rothschild, Jorge A. Kittl, Christoph Kerner, Hui Yu, T. Y. Hoffmann, Anabela Veloso, S.Z. Chang, G. Whittemore, R. Mitsuhashi, Philippe Absil, Wilfried Vandervorst, M. Ameen, I. Satoru, Christa Vrancken, Caroline Demeurisse, M. A. Pawlak, Marc Demand, Anne Lauwers
المصدر: IEEE Electron Device Letters. 29:34-37
مصطلحات موضوعية: Ytterbium, Materials science, Dopant, business.industry, Annealing (metallurgy), Electrical engineering, chemistry.chemical_element, Dielectric, Electronic, Optical and Magnetic Materials, PMOS logic, CMOS, chemistry, Optoelectronics, Electrical and Electronic Engineering, business, NMOS logic, High-κ dielectric
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10
المؤلفون: Malgorzata Jurczak, J. Ramos, Philippe Absil, Stefan Kubicek, A. De Keersgieter, Serge Biesemans, Simone Severi, Thomas Chiarella, A. Falepin, Christoph Kerner, Pierre Eyben, W. Vandervorst, Bartek Pawlak, D. Vanhaeren, Emmanuel Augendre, T. Y. Hoffmann
المصدر: Solid-State Electronics. 51:1432-1436
مصطلحات موضوعية: Materials science, business.industry, Co implantation, Annealing (metallurgy), Doping, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Ion implantation, MOSFET, Scalability, Materials Chemistry, External resistance, Electronic engineering, Optoelectronics, Field-effect transistor, Electrical and Electronic Engineering, business