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1دورية أكاديمية
المؤلفون: Andrew C Payne, Michael Andregg, Kent Kemmish, Mark Hamalainen, Charlotte Bowell, Andrew Bleloch, Nathan Klejwa, Wolfgang Lehrach, Ken Schatz, Heather Stark, Adam Marblestone, George Church, Christopher S Own, William Andregg
المصدر: PLoS ONE, Vol 8, Iss 7, p e69058 (2013)
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: Wenjing Yin, Derrick Brittain, Jay Borseth, Marie E. Scott, Derric Williams, Jedediah Perkins, Christopher S. Own, Matthew Murfitt, Russel M. Torres, Daniel Kapner, Gayathri Mahalingam, Adam Bleckert, Daniel Castelli, David Reid, Wei-Chung Allen Lee, Brett J. Graham, Marc Takeno, Daniel J. Bumbarger, Colin Farrell, R. Clay Reid, Nuno Macarico da Costa
المصدر: Nature Communications, Vol 11, Iss 1, Pp 1-12 (2020)
مصطلحات موضوعية: Science
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2041-1723
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3
المؤلفون: Zhihao Zheng, Christopher S. Own, Adrian A. Wanner, Randal A. Koene, Eric W. Hammerschmith, William M. Silversmith, Nico Kemnitz, David W. Tank, H. Sebastian Seung
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e2b527b8bde62b14a1cd913c3d2ede18
https://doi.org/10.1101/2022.11.23.517701 -
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المؤلفون: Lawrence S. Own, Katherine Thomas-Keprta, Donald R. Pettit, Zachary Morales, James Martinez, Theodore DeRego, Zia Ur Rahman, Christopher S. Own
المصدر: Microscopy and Microanalysis. 26:1578-1581
مصطلحات موضوعية: Physics, Optics, business.industry, law, International Space Station, Electron microscope, business, Instrumentation, law.invention
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5
المؤلفون: Marie E. Scott, Marc Takeno, Daniel Kapner, Daniel J. Bumbarger, Christopher S. Own, R. Clay Reid, M.F. Murfitt, Adam Bleckert, Derric Williams, Brett J. Graham, Wenjing Yin, David Reid, Daniel Castelli, Wei-Chung Allen Lee, Nuno Macarico da Costa, Colin Farrell, Derrick Brittain, Jed Perkins, Jay Borseth, Russel Torres
مصطلحات موضوعية: Microscope, business.industry, Computer science, Pipeline (computing), Resolution (electron density), law.invention, Petascale computing, Transmission (telecommunications), law, Transmission electron microscopy, Electron microscope, business, Throughput (business), Computer hardware
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d589a5578b48ad51be15849931c1685f
https://doi.org/10.1101/791889 -
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المؤلفون: Theodore DeRego, Ashwin Vishwanathan, Adrian A. Wanner, Gerward Weppelman, Eric Hammerschmith, Sebastian Ströh, H. Sebastian Seung, Lawrence S. Own, Christopher S. Own
المصدر: Microsc Microanal
مصطلحات موضوعية: Materials science, Order (business), business.industry, Transmission electron microscopy, Optoelectronics, business, Instrumentation, Throughput (business), Scaling, Article
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7
المؤلفون: Christopher S. Own, Matthew P. Galeano, Donald R. Pettit, James Martinez, Gerward Weppelman
المصدر: Microscopy and Microanalysis. 25:700-701
مصطلحات موضوعية: Ethernet, business.product_category, business.industry, Payload, Computer science, Local area network, High voltage, Safety standards, Space exploration, Rocket, International Space Station, Aerospace engineering, business, Instrumentation
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8
المؤلفون: A McManama-Smith, Ondrej L. Krivanek, Peter D. Nellist, Niklas Dellby, M.F. Murfitt, Christopher S. Own
مصطلحات موضوعية: Diffraction, Optics, Materials science, business.industry, business, Instrumentation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bb5fc0c9d5d4cbab6d8f8ed6c59294c9
https://ora.ox.ac.uk/objects/uuid:9c4ca438-e2dd-4708-ae2a-8a47e8efe633 -
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المؤلفون: James Martinez, Donald R. Pettit, M.F. Murfitt, Lawrence S. Own, Jesse Cushing, Katherine Thomas-Keprta, Christopher S. Own
المصدر: Microscopy and Microanalysis. 23:1082-1083
مصطلحات موضوعية: 010302 applied physics, Materials science, Analytical chemistry, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Microanalysis, law.invention, law, 0103 physical sciences, Extreme environment, Electron microscope, 0210 nano-technology, Instrumentation
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المؤلفون: M.F. Murfitt, Lawrence S. Own, Jesse Cushing, Christopher S. Own
المصدر: Microscopy and Microanalysis. 23:32-33
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, law.invention, law, 0103 physical sciences, Optoelectronics, Reel-to-reel audio tape recording, Electron microscope, 0210 nano-technology, business, Instrumentation