المؤلفون: Hou, Yonggang, Sun, Lunye, Wang, Jiaqi, Shi, Shanliang, Chu, Shaofu, Li, Xianguo

المصدر: 2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2023 IEEE International Conference on. :400-405 Jul, 2023

Relation: 2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)