يعرض 1 - 10 نتائج من 108 نتيجة بحث عن '"Chu, Wen-Ting"', وقت الاستعلام: 0.89s تنقيح النتائج
  1. 1
    مؤتمر
    15.7 A 32Mb RRAM in a 12nm FinFet Technology with a 0.0249μm2 Bit-Cell, a 3.2GB/S Read Throughput, a 10KCycle Write Endurance and a 10-Year Retention at 105°C

    المؤلفون: Huang, Yi-Cheng, Liu, Shang-Hsuan, Chen, Hsu-Shun, Feng, Hsin-Chang, Li, Chih-Feng, Yang, Chou-Ying, Chang, Wei-Keng, Yang, Chang-Feng, Wu, Chun-Yu, Lin, Yen-Cheng, Yang, Tsung-Tse, Chang, Chih-Yang, Chu, Wen-Ting, Chuang, Harry, Wang, Yih, Chih, Yu-Der, Chang, Tsung-Yung Jonathan

    المصدر: 2024 IEEE International Solid-State Circuits Conference (ISSCC) Solid-State Circuits Conference (ISSCC), 2024 IEEE International. 67:288-290 Feb, 2024

    Relation: 2024 IEEE International Solid-State Circuits Conference (ISSCC)

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  2. 2
    مؤتمر
    Emerging Memory RRAM Embedded in 12FFC FinFET Technology for industrial Applications

    المؤلفون: Wu, Chun-Yu, Yang, Chang-Feng, Lai, Chih-Wei, Wu, Yu-Tien, Chien, Ta-Chun, Yang, Ming-Han, Yang, Ming-Ta, Kao, Yu-Neng, Cheng, Chih-Lin, Wang, Chia-Yu, Tseng, H. W., Chih, Yu-Der, Chu, Wen-Ting, Hung, Arthur, Chuang, W. H.

    المصدر: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023

    Relation: 2023 International Electron Devices Meeting (IEDM)

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  3. 3
    مؤتمر
    Demonstration of High Endurance Capability on Mega-Bit RRAM Macro and Model of ppm Level Failures

    المؤلفون: Yang, Chang-Feng, Wu, Chun-Yu, Shih, Meng-Chun, Yang, Ming-Ta, Yang, Ming-Han, Wu, Yu-Tien, Chien, Ta-Chun, Lai, Chih-Wei, Tsai, Shih-Chi, Chu, Wen-Ting, Hung, Arthur

    المصدر: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :318-319 Jun, 2022

    Relation: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

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  4. 4
    دورية أكاديمية
    Three-metal ion mechanism of cross-linked and uncross-linked DNA polymerase β: A theoretical study.

    المؤلفون: Chu, Wen-Ting, Suo, Zucai, Wang, Jin

    المصدر: Journal of Chemical Physics; 4/21/2024, Vol. 160 Issue 15, p1-9, 9p

    مصطلحات موضوعية: DNA polymerases, EXCISION repair, DNA replication, CHEMICAL reactions, MOLECULAR dynamics, DNA synthesis

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  5. 5
    مؤتمر
    Design Challenges and Solutions of Emerging Nonvolatile Memory for Embedded Applications

    المؤلفون: Chih, Yu-Der, Chou, Chung-Cheng, Shih, Yi-Chun, Lee, Chia-Fu, Khwa, Win-San, Wu, Chun-Yu, Shen, Kuei-Hung, Chu, Wen-Ting, Chang, Meng-Fan, Chuang, Harry, Chang, Tsung-Yung Jonathan

    المصدر: 2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :2.4.1-2.4.4 Dec, 2021

    Relation: 2021 IEEE International Electron Devices Meeting (IEDM)

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  6. 6
    تقرير
    Investigations of the Underlying Mechanisms of HIF-1{\alpha} and CITED2 Binding to TAZ1

    المؤلفون: Chu, Wen-Ting, Chu, Xiakun, Wang, Jin

    مصطلحات موضوعية: Quantitative Biology - Biomolecules, Physics - Biological Physics

    URL الوصول: http://arxiv.org/abs/1909.00911

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  7. 7
    مؤتمر
    An All-Weights-on-Chip DNN Accelerator in 22nm ULL Featuring 24×1 Mb eRRAM

    المؤلفون: Wang, Zhehong, Li, Ziyun, Xu, Li, Dong, Qing, Su, Chin-I, Chu, Wen-Ting, Tsou, George, Chih, Yu-Der, Chang, Tsung-Yung Jonathan, Sylvester, Dennis, Kim, Hun Seok, Blaauw, David

    المصدر: 2020 IEEE Symposium on VLSI Circuits VLSI Circuits, 2020 IEEE Symposium. :1-2 Jun, 2020

    Relation: 2020 IEEE Symposium on VLSI Circuits

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  8. 8
    مؤتمر
    A 22nm 96KX144 RRAM Macro with a Self-Tracking Reference and a Low Ripple Charge Pump to Achieve a Configurable Read Window and a Wide Operating Voltage Range

    المؤلفون: Chou, Chung-Cheng, Lin, Zheng-Jun, Lai, Chien-An, Su, Chin-I, Tseng, Pei-Ling, Chen, Wei-Chi, Tsai, Wu-Chin, Chu, Wen-Ting, Ong, Tong-Chern, Chuang, Harry, Chih, Yu-Der, Chang, Tsung-Yung Jonathan

    المصدر: 2020 IEEE Symposium on VLSI Circuits VLSI Circuits, 2020 IEEE Symposium. :1-2 Jun, 2020

    Relation: 2020 IEEE Symposium on VLSI Circuits

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  9. 9
    مؤتمر
    Industrially Applicable Read Disturb Model and Performance on Mega-Bit 28nm Embedded RRAM

    المؤلفون: Yang, Chang-Feng, Wu, Chun-Yu, Yang, Ming-Han, Wang, Wayne, Yang, Ming-Ta, Chien, Ta-Chun, Fan, Vincent, Tsai, Shih-Chi, Lee, Yung-Huei, Chu, Wen-Ting, Hung, Arthur

    المصدر: 2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020

    Relation: 2020 IEEE Symposium on VLSI Technology

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  10. 10
    دورية أكاديمية

    لا يتم عرض هذه النتيجة على الضيوف.

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