المؤلفون: Chul-min Choi, Soyoung Park, On Lee

المصدر: Cheyuk gwahag yeon-gu, Vol 33, Iss 3, Pp 308-319 (2022)

مصطلحات موضوعية: athlete, sports injury, record competition sports, injury rate, Sports, GV557-1198.995

وصف الملف: electronic resource

Relation: http://kjss.sports.re.kr/upload/pdf/kjss-2022-33-3-308.pdf; https://doaj.org/toc/1598-2920; https://doaj.org/toc/2233-7938

URL الوصول: https://doaj.org/article/1c6caae5f86c45289dda8cbc1a9804fb

المؤلفون: Chul-Min Choi, Jin-Oh Song, Seong-Rae Lee

المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 41(10):2667-2669 Oct, 2005

المؤلفون: Chul-Min Choi, Seong-Rae Lee

المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 40(4):2281-2283 Jul, 2004

المؤلفون: Chul-Min Choi, Jin-Oh Song, Seong-Rae Lee

المصدر: INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005. Magnetics Conference Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International. :1999-2000 2005

Relation: INTERMAG Asia 2005: Digest of the IEEE International Magnetics Conference

المؤلفون: Chul Min Choi, Yongwoo Kwon, Yuji Sutou, Satoshi Shindo, Yun-Heub Song, Junseop An

المصدر: Journal of Computational Electronics. 15:1570-1576

مصطلحات موضوعية: 010302 applied physics, Random access memory, Materials science, Condensed matter physics, Contact resistance, Nanometer size, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Phase change, Electrical resistivity and conductivity, Modeling and Simulation, 0103 physical sciences, Memory window, Electrical and Electronic Engineering, 0210 nano-technology, Contact area, Order of magnitude

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c6976dc1daec3e40d1f15eba7c02ac34
https://doi.org/10.1007/s10825-016-0905-3

المؤلفون: Gyu Hyun Kil, Seiji Mitani, Yun-Heub Song, Jung Min Lee, Chul Min Choi, Hiroaki Sukegawa, Gae Hun Lee

المصدر: Journal of the Korean Physical Society. 64:1144-1149

مصطلحات موضوعية: Stress (mechanics), Tunnel magnetoresistance, Crystallinity, Materials science, Electrical resistivity and conductivity, Alloy, engineering, General Physics and Astronomy, FEAL, engineering.material, Composite material, Layer (electronics), Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5336f8a99e1fff4e942ecebb05198218
https://doi.org/10.3938/jkps.64.1144

المؤلفون: Seiji Mitani, Yun-Heub Song, Hiroaki Sukegawa, Chul Min Choi

المصدر: Semiconductor Science and Technology. 33:015006

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Condensed Matter Physics, Screen test, 01 natural sciences, Electronic, Optical and Magnetic Materials, Stress (mechanics), Tunnel magnetoresistance, 0103 physical sciences, Materials Chemistry, Optoelectronics, Breakdown voltage, Electrical and Electronic Engineering, 010306 general physics, business, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::177e1d9902300c75ce4716f60e95eb11
https://doi.org/10.1088/1361-6641/aa99bb

المؤلفون: Seiji Mitani, Hiroaki Sukegawa, Yun-Heub Song, Chul Min Choi

المصدر: Semiconductor Science and Technology. 32:105007

مصطلحات موضوعية: 010302 applied physics, Materials science, Dielectric strength, Condensed matter physics, Time-dependent gate oxide breakdown, 02 engineering and technology, Dielectric, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, Stress (mechanics), 0103 physical sciences, Materials Chemistry, Constant voltage, Electrical and Electronic Engineering, 0210 nano-technology, Reliability model, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a865c166bed5444177261116f74d03fe
https://doi.org/10.1088/1361-6641/aa856e

المؤلفون: Chul Min Choi, Yun-Heub Song, Seiji Mitani, Hiroaki Sukegawa, Young-Taek Oh, Kyungjun Kim

المصدر: Japanese Journal of Applied Physics. 56:04CN02

مصطلحات موضوعية: 010302 applied physics, Physics and Astronomy (miscellaneous), Dielectric strength, Chemistry, business.industry, General Engineering, General Physics and Astronomy, Biasing, Time-dependent gate oxide breakdown, 02 engineering and technology, Test method, 021001 nanoscience & nanotechnology, 01 natural sciences, Stress (mechanics), Reliability (semiconductor), 0103 physical sciences, Constant voltage, Optoelectronics, 0210 nano-technology, business, Quantum tunnelling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3dae10bf2c50ddeb2640981c4203e590
https://doi.org/10.7567/jjap.56.04cn02

المؤلفون: Young-Taek Oh, Yun-Heub Song, Hiroaki Sukegawa, Chul Min Choi, Jeong Yong Lee, Kyung Jun Kim, Seiji Mitani, Jin Suk Park, Sungkyu Kim

المصدر: Semiconductor Science and Technology. 31:075004

مصطلحات موضوعية: 010302 applied physics, Materials science, Dielectric strength, Condensed matter physics, Time-dependent gate oxide breakdown, 02 engineering and technology, Dielectric, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Temperature measurement, Electronic, Optical and Magnetic Materials, Stress (mechanics), Reliability (semiconductor), 0103 physical sciences, Materials Chemistry, Electrical and Electronic Engineering, 0210 nano-technology, Quantum tunnelling, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a2195354d8045feffd43768b69786664
https://doi.org/10.1088/0268-1242/31/7/075004