-
1دورية أكاديمية
المؤلفون: Fabia Farlin Athena, Omobayode Fagbohungbe, Nanbo Gong, Malte J. Rasch, Jimmy Penaloza, SoonCheon Seo, Arthur Gasasira, Paul Solomon, Valeria Bragaglia, Steven Consiglio, Hisashi Higuchi, Chanro Park, Kevin Brew, Paul Jamison, Christopher Catano, Iqbal Saraf, Claire Silvestre, Xuefeng Liu, Babar Khan, Nikhil Jain, Steven McDermott, Rick Johnson, I. Estrada-Raygoza, Juntao Li, Tayfun Gokmen, Ning Li, Ruturaj Pujari, Fabio Carta, Hiroyuki Miyazoe, Martin M. Frank, Antonio La Porta, Devi Koty, Qingyun Yang, Robert D. Clark, Kandabara Tapily, Cory Wajda, Aelan Mosden, Jeff Shearer, Andrew Metz, Sean Teehan, Nicole Saulnier, Bert Offrein, Takaaki Tsunomura, Gert Leusink, Vijay Narayanan, Takashi Ando
المصدر: Frontiers in Electronics, Vol 4 (2024)
مصطلحات موضوعية: resistive random access memory, HfOx, deep learning, analog hardware, transfer learning, open loop training, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
-
2
المؤلفون: Daniel Schmidt, Manasa Medikonda, Michael Rizzolo, Claire Silvestre, Julien Frougier, Andrew Greene, Mary Breton, Aron Cepler, Jacob Ofek, Itzik Kaplan, Roy Koret, Igor Turovets
المصدر: Journal of Micro/Nanopatterning, Materials, and Metrology. 22
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::efec40642400718dad045060d2eddd91
https://doi.org/10.1117/1.jmm.22.3.031203 -
3
المؤلفون: Daniel Schmidt, Manasa Medikonda, Michael Rizzolo, Claire Silvestre, Julien Frougier, Andrew Greene, Mary A. Breton, Aron Cepler, Jacob Ofek, Itzik Kaplan, Roy Koret, Igor Turovets
المصدر: Metrology, Inspection, and Process Control XXXVI.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3b7df66fb6830c90dae8516a7276ceb8
https://doi.org/10.1117/12.2614077 -
4
المؤلفون: Fee Li Lie, Wei-Tsu Tseng, Claire Silvestre, Chen Jim C, Donald F. Canaperi, Carol Boye
المصدر: 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
مصطلحات موضوعية: 010302 applied physics, Materials science, Consumables, business.industry, 02 engineering and technology, Blanket, 021001 nanoscience & nanotechnology, 01 natural sciences, Conditioning process, Surface cleaning, Reduction (complexity), 0103 physical sciences, Wafer, Defect size, 0210 nano-technology, Process engineering, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::dec210092f25af7db5772e2f29f84f55
https://doi.org/10.1109/asmc51741.2021.9435652 -
5
المؤلفون: Claire Silvestre, Cody Stanford, David Lynch, Mateo Montelongo, Jake Cautilli, Noah Larson, Lizzy Fanning, Freddie Haberecht, Maxx Ives
المصدر: Conference Proceedings for The 3rd Global Virtual Conference of the Youth Environmental Alliance in Higher Education.
مصطلحات موضوعية: Beaver, Geography, biology, biology.animal, Archaeology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::67c640df542cd8479680b801b10ea083
https://doi.org/10.37099/mtu.dc.yeah-conference/april2021/all-events/31 -
6
المؤلفون: Terry A. Spooner, James Hsueh-Chung Chen, James J. Kelly, Lawrence A. Clevenger, Ghosh Somnath, Mary-Claire Silvestre, Yann Mignot
المصدر: 2020 IEEE International Interconnect Technology Conference (IITC).
مصطلحات موضوعية: Interconnection, Materials science, business.industry, Process (computing), Copper interconnect, law.invention, Mandrel, law, Process integration, Multiple patterning, Optoelectronics, Photolithography, business, Lithography
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7bc0e9a6a4e3be5f7055e8f393edbc50
https://doi.org/10.1109/iitc47697.2020.9515650 -
7
المؤلفون: Sanjay Mehta, Scott DeVries, Carol Boye, Wei-Tsu Tseng, Chen Jim C, Mary-Claire Silvestre, Thamarai S. Devarajan, Fee Li Lie, Massud A. Aminpur
المصدر: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
مصطلحات موضوعية: 0209 industrial biotechnology, 020901 industrial engineering & automation, Computer science, 02 engineering and technology, GeneralLiterature_MISCELLANEOUS, Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c3ab67580a5a169b0d541b34e2414f61
https://doi.org/10.1109/asmc49169.2020.9185337 -
8
المؤلفون: Eswar Ramanathan, Zhiguo Sun, Vijaya Rana, Vijayalakshmi Seshachalam, Anbu Selvam Km Mahalingam, Chauhan Kripa Nidhan, Joseph F. Shepard, Tingge Xu, Minrui Wang, Mary Claire Silvestre, Yang Bum Lee
المصدر: 2019 China Semiconductor Technology International Conference (CSTIC).
مصطلحات موضوعية: Stress (mechanics), Back end of line, Outgassing, Materials science, Stack (abstract data type), business.industry, Optoelectronics, Wafer, Dielectric, business, Lithography, Layer (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::de9b2ad9e98e3877a46e1262eb526a5c
https://doi.org/10.1109/cstic.2019.8755634 -
9
المؤلفون: Dhruv Singh, A. Gassaria, V. Chauhan, A. da Silva, P. Lindo, Daniel J. Dechene, M. Gribelyuk, I. Ahsan, M. Hasan, Judson R. Holt, Rod Augur, Jaeger Daniel, G. Northrop, G. Gomba, Ghosh Somnath, H. Narisetty, Basanth Jagannathan, Ting-Hsiang Hung, P. Liu, Y. Zhong, T. Gordon, Y. Fan, C. Schiller, A. Blauberg, O. Patterson, B. Morganfeld, Andres Bryant, J. Choo, T. Nigam, B. Senapati, V. Sardesai, N. Baliga, C. An, I. Ramirez, Rishikesh Krishnan, Arkadiusz Malinowski, S. Lucarini, Z. Sun, Sadanand V. Deshpande, R. Bhelkar, Mahender Kumar, Kong Boon Yeap, D. Conklin, Q. Fang, R. Gauthier, Purushothaman Srinivasan, S. Crown, M. Ozbek, Linjun Cao, G. Han, Z. Song, L. Huang, C. Serrau, R. Sweeney, M. Tan, Keith Donegan, Souvick Mitra, A. Zainuddin, P. Agnello, Balasubramanian S. Haran, Haifeng Sheng, B. Greene, A. Hassan, Tabakman Keith, Xin Wang, Sanjay Parihar, L. Cheng, M. Lagus, Jessica Dechene, D. Xu, G. Gifford, M. Zhao, Jeyaraj Antony Johnson, Y. Yan, Rick Carter, Manoj Joshi, W. Kim, Gabriela Dilliway, Jack M. Higman, S. Kalaga, Kai Zhao, Jinping Liu, A. Ogino, M. Lipinski, Amanda L. Tessier, Garo Jacques Derderian, S. Madisetti, N. Shah, Christopher Ordonio, M. Aminpur, Rakesh Ranjan, S. Saudari, Christa Montgomery, Tony Tae-Hyoung Kim, Jeric Sarad, Jae Gon Lee, Bharat Krishnan, Joseph F. Shepard, L. Hu, J. Sporre, Akil K. Sutton, Eswar Ramanathan, Cathryn Christiansen, J.H. Han, J. Lemon, Patrick Justison, Natalia Borjemscaia, Scott C. Johnson, B. Cohen, Kan Zhang, Srikanth Samavedam, G. Xu, T. Xuan, Unoh Kwon, C. Meng, Katsunori Onishi, Y. Shi, C. Huang, R. Coleman, Manfred Eller, Shreesh Narasimha, B. Kannan, J. Yang, Vivek Joshi, W. Ma, Christopher D. Sheraw, A. K. M. Mahalingam, Craig Child, E. Woodard, Tao Chu, Y. Jin, D. K. Sohn, Hasan M. Nayfeh, Mary Claire Silvestre, M. Lingalugari, G. Biery, Tian Shen, Carl J. Radens, E. Kaste, C-H. Lin, K. Han, K. Anil, Ankur Arya, Mehta Jaladhi, Jia Zeng, S.L. Liew, Michael V. Aquilino, M. Yu, M. Chen, Rohit Pal, E. Maciejewski, Stephan Grunow, Robert Fox, Rinus T. P. Lee
المصدر: 2017 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Computer science, Extreme ultraviolet lithography, Process (computing), 02 engineering and technology, 021001 nanoscience & nanotechnology, Low voltage sram, 01 natural sciences, Capacitance, CMOS, Computer architecture, Logic gate, 0103 physical sciences, Leverage (statistics), 0210 nano-technology, Immersion lithography
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5545f519d7dcbb19a8a64d95e77053fd
https://doi.org/10.1109/iedm.2017.8268476 -
10
المؤلفون: Chun Hui Low, Anbu Selvam Km Mahalingam, Ming He, DeNeil Park, Alycia Roux, Yue Zhou, Mert Karakoy, Daniel Fisher, Mary Claire Silvestre, Craig Child
المصدر: 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
مصطلحات موضوعية: Interconnection, Yield (engineering), Materials science, Real-time computing, Process (computing), 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Engineering physics, 010309 optics, 0103 physical sciences, Macro, 0210 nano-technology, Critical dimension
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ce8c06de8656b2d11b892a74af58948c
https://doi.org/10.1109/asmc.2017.7969189