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المؤلفون: Qais Saadeh, Vicky Philipsen, Devesh Thakare, Philipp Naujok, Meiyi Wu, Frank Scholze, Christian Buchholz, Claudia Tagbo-Fotso, Ayhan Babalik, Bettina Kupper, Victor Soltwisch
المصدر: Optical Materials Express. 13:78
مصطلحات موضوعية: Technology, 10 NM, Science & Technology, SOFT-X-RAY, Materials Science, NICKEL, K ABSORPTION EDGES, COPPER, Materials Science, Multidisciplinary, Optics, WAVELENGTH, Electronic, Optical and Magnetic Materials, REFLECTANCE MEASUREMENTS, Physical Sciences, REFLECTIVITY, PHOTOABSORPTION, MULTILAYER MIRRORS
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4ff8fe1aa8c51a923d5ca3fa58c352ff
https://doi.org/10.1364/ome.474887