المؤلفون: Fanjas, Clement, Aboulkassimi, Driss, Pontie, Simon, Clediere, Jessy

المصدر: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2023 IEEE International Symposium on. :1-6 Oct, 2023

Relation: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

المؤلفون: Trouchkine, Thomas, Bouffard, Guillaume, Clediere, Jessy

المصدر: 2021 Workshop on Fault Detection and Tolerance in Cryptography (FDTC) FDTC Fault Detection and Tolerance in Cryptography (FDTC), 2021 Workshop on. :31-38 Sep, 2021

Relation: 2021 Workshop on Fault Detection and Tolerance in Cryptography (FDTC)

المؤلفون: Maingault, Laurent^Aff10, Anceau, Stéphanie^Aff10, Sulmont, Manuel^Aff10, Salvo, Luc^Aff11, Clediere, Jessy^Aff10, Lhuissier, Pierre^Aff11, Beliard, Emrick^Aff10, Rainard, Jean Luc^Aff10

المساهمون: Goos, Gerhard, Founding Editor^Aff1, Hartmanis, Juris, Founding Editor^Aff2, Bertino, Elisa, Editorial Board Member^Aff3, Gao, Wen, Editorial Board Member^Aff4, Steffen, Bernhard, Editorial Board Member^Aff5, Woeginger, Gerhard, Editorial Board Member^Aff6, Yung, Moti, Editorial Board Member^Aff7, Grosso, Vincent, editor^Aff8, Pöppelmann, Thomas, editor^Aff9

المصدر: Smart Card Research and Advanced Applications : 20th International Conference, CARDIS 2021, Lübeck, Germany, November 11–12, 2021, Revised Selected Papers. 13173:139-150

المؤلفون: Zussa, Loic, Dutertre, Jean-Max, Clediere, Jessy, Robisson, Bruno

المصدر: 2014 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) Hardware-Oriented Security and Trust (HOST), 2014 IEEE International Symposium on. :130-135 May, 2014

Relation: 2014 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST)

المؤلفون: Zussa, Loic, Dehbaoui, Amine, Tobich, Karim, Dutertre, Jean-Max, Maurine, Philippe, Guillaume-Sage, Ludovic, Clediere, Jessy, Tria, Assia

المصدر: 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014. :1-6 Mar, 2014

Relation: 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)

المؤلفون: Zussa, Loic, Dutertre, Jean-Max, Clediere, Jessy, Tria, Assia

المصدر: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International. :110-115 Jul, 2013

Relation: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS)

المؤلفون: Soucarros, Mathilde, Canovas-Dumas, Cecile, Clediere, Jessy, Elbaz-Vincent, Philippe, Real, Denis

المصدر: 2011 IEEE International Symposium on Hardware-Oriented Security and Trust Hardware-Oriented Security and Trust (HOST), 2011 IEEE International Symposium on. :24-27 Jun, 2011

Relation: 2011 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST)

المؤلفون: Trouchkine, Thomas^Aff10, Bouffard, Guillaume^{Aff10, Aff11}, Clédière, Jessy^Aff12

المساهمون: Goos, Gerhard, Founding Editor^Aff1, Hartmanis, Juris, Founding Editor^Aff2, Bertino, Elisa, Editorial Board Member^Aff3, Gao, Wen, Editorial Board Member^Aff4, Steffen, Bernhard, Editorial Board Member^Aff5, Woeginger, Gerhard, Editorial Board Member^Aff6, Yung, Moti, Editorial Board Member^Aff7, Laurent, Maryline, editor^Aff8, Giannetsos, Thanassis, editor^Aff9

المصدر: Information Security Theory and Practice : 13th IFIP WG 11.2 International Conference, WISTP 2019, Paris, France, December 11–12, 2019, Proceedings. 12024:123-138

المؤلفون: Canivet, Gaetan, Leveugle, Regis, Clediere, Jessy, Valette, Frederic, Renaudin, Marc

المصدر: 2009 27th IEEE VLSI Test Symposium VLSI Test Symposium, 2009. VTS '09. 27th IEEE. :327-332 May, 2009

Relation: 2009 27th IEEE VLSI Test Symposium (VTS)

المؤلفون: Real, Denis, Canovas, Cecile, Clediere, Jessy, Drissi, Mhamed, Valette, Frederic

المصدر: 2008 Design, Automation and Test in Europe Design, Automation and Test in Europe, 2008. DATE '08. :1274-1279 Mar, 2008

Relation: 2008 Design, Automation and Test in Europe