المؤلفون: Barrera, Cyrille^{Aff5, Aff6, Aff7}, Désières, Yohan^Aff6, Dussaigne, Amélie^Aff6, Kempf, Eva^{Aff5, Aff8}, Dupré, Ludovic^Aff6, Ferret, Pierre^Aff6, Alonso-Ramos, Carlos^Aff7, Barbier, Frédéric^Aff6, Mattei, Jean-Gabriel^Aff5, Clément, Laurent^Aff5, Adelmini, Laetitia^Aff6, Vivien, Laurent^Aff7, Boeuf, Frédéric^Aff5

المساهمون: Witzens, Jeremy, editor^Aff1, Poon, Joyce, editor^Aff2, Zimmermann, Lars, editor^Aff3, Freude, Wolfgang, editor^Aff4

المصدر: The 25th European Conference on Integrated Optics : Proceedings of ECIO 2024, June 17–19, Aachen, Germany. 402:270-275

المؤلفون: Borrel, Julien, Gauthier, Alexis, Deprat, Fabien, Lu, Vincent, Abbate, Francesco, Joblot, Sylvain, Clement, Laurent-Renaud, Tupin, Heloise, Zou, Wei, Arevalo, Edwin, Chevalier, Pascal, Dutartre, Didier

المصدر: 2018 22nd International Conference on Ion Implantation Technology (IIT) Ion Implantation Technology (IIT), 2018 22nd International Conference on. :29-32 Sep, 2018

Relation: 2018 22nd International Conference on Ion Implantation Technology (IIT)

المؤلفون: Joblot, Sylvain, Duru, Romain, Guitard, Nicolas, Lu, Vincent, Nassiet, Thomas, Beneyton, Remi, Cristiano, Fuccio, Dabertrand, Karen, Borrel, Julien, Juhel, Marc, Arevalo, Edwin, Monsieur, Frederic, Borowiak, Celine, Ghegin, Elodie, Clement, Laurent, Oudot, Evan, Rideau, Denis, Zou, Wei, Pinzelli, Luc

المصدر: 2018 22nd International Conference on Ion Implantation Technology (IIT) Ion Implantation Technology (IIT), 2018 22nd International Conference on. :121-124 Sep, 2018

Relation: 2018 22nd International Conference on Ion Implantation Technology (IIT)

المؤلفون: Solaro, Yohann, Fonteneau, Pascal, Legrand, Charles-Alexandre, Marin-Cudraz, David, Passieux, Jeremy, Guyader, Pascal, Clement, Laurent-Renaud, Fenouillet-Beranger, Claire, Ferrari, Philippe, Cristoloveanu, Sorin

المصدر: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th. :1-6 Sep, 2014

Relation: 2014 36th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

المؤلفون: Henry, Loïc, Bernier, Nicolas, Jacob, Martin, Navarro, Gabriele, Clément, Laurent, Rouvière, Jean-Luc, Robin, Eric

المصدر: In Acta Materialia December 2020 201:72-78

المؤلفون: Solaro, Yohann, Fonteneau, Pascal, Legrand, Charles-Alexandre, Marin-Cudraz, David, Passieux, Jeremy, Guyader, Pascal, Clement, Laurent-Renaud, Fenouillet-Beranger, Claire, Ferrari, Philippe, Cristoloveanu, Sorin

المصدر: 2013 IEEE International Electron Devices Meeting Electron Devices Meeting (IEDM), 2013 IEEE International. :7.3.1-7.3.4 Dec, 2013

Relation: 2013 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Morin, Pierre, Maitrejean, Sylvain, Allibert, Frederic, Augendre, Emmanuel, Liu, Qing, Loubet, Nicolas, Grenouillet, Laurent, Pofelski, Alexandre, Chen, Kangguo, Khakifirooz, Ali, Wacquez, Romain, Reboh, Shay, Bonnevialle, Aurore, le Royer, Cyrille, Morand, Yves, Kanyandekwe, Joel, Chanemougamme, Daniel, Mignot, Yann, Escarabajal, Yann, Lherron, Benoit, Chafik, Fadoua, Pilorget, Sonia, Caubet, Pierre, Vinet, Maud, Clement, Laurent, Desalvo, Barbara, Doris, Bruce, Kleemeier, Walter

المصدر: In Solid State Electronics March 2016 117:100-116

المؤلفون: Clement Laurent, Chamuganda

مصطلحات موضوعية: Systemvetenskap, informationssystem och informatik med samhällsvetenskaplig inriktning, Information Systems, Social aspects, Democratic Republic of Congo

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::8775dc98a2cd8c40b41fbd0fdae8229e
http://urn.kb.se/resolve?urn=urn:nbn:se:umu:diva-186506

المؤلفون: Clement, Laurent^Aff4, Dumoulin, Elisabeth^Aff4, Lagarde, Stéphane^{Aff4, Aff5}, Bourlier, Christian^{Aff4, Aff5}

المساهمون: Yano, Toshimasa, editor^Aff1, Matsuno, Ryuichi, editor^Aff2, Nakamura, Kozo, editor^Aff3

المصدر: Developments in Food Engineering : Proceedings of the 6th International Congress on Engineering and Food. :439-441

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