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1
المؤلفون: Ajith Amerasekera, Clive Bittlestone
المصدر: 2012 International Electron Devices Meeting.
مصطلحات موضوعية: Engineering, Ultra low power, Semiconductor, Integrated injection logic, business.industry, Low-power electronics, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Process (computing), Electrical engineering, Mixed-signal integrated circuit, Electronics, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d32dea5b453c9ddcb1c196d235e49852
https://doi.org/10.1109/iedm.2012.6478972 -
2
المؤلفون: Clive Bittlestone
المصدر: Proceedings of the 2012 ACM/IEEE international symposium on Low power electronics and design.
مصطلحات موضوعية: Power (social and political), Focus (computing), Multimedia, Computer science, Session (computer science), computer.software_genre, computer
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e71030ff0beb3cb10941534abbc5a172
https://doi.org/10.1145/3259248 -
3
المصدر: CICC
مصطلحات موضوعية: Engineering, business.industry, Semiconductor technology, Circuit design, Systems engineering, Electrical engineering, Technology scaling, Electronic design automation, Design and Technology, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a1bb8cbaeed5eccafedbf47da91ae801
https://doi.org/10.1109/cicc.2011.6055353 -
4
المؤلفون: Clive Bittlestone
المصدر: Proceedings of the 45th annual Design Automation Conference.
مصطلحات موضوعية: Computer science, Session (computer science), Simulation, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8ffe4ecc6682c533699bd1784e1f897f
https://doi.org/10.1145/3255546 -
5
المؤلفون: Yajun Ran, Mark E. Mason, Anand Rajaram, Robert Ritchie, Philippe Hurat, Bala Kasthuri, Nishath Verghese, Clive Bittlestone, Haizhou Chen, Arjun Rajagopal, Raguram Damodaran, Jac Condella, Mark Terry, Srinivas Swaminathan, Frank Cano
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Silicon, chemistry, law, Computer science, Transistor, Hardware_INTEGRATEDCIRCUITS, chemistry.chemical_element, Integrated circuit design, Lithography, Algorithm, Simulation, law.invention, Design for manufacturability
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a0cac00d83a2c930841dde78418608ac
https://doi.org/10.1117/12.778836 -
6
المؤلفون: Shankar Krishnamoorthy, Jacques Benkoski, Tsuyoshi Yamamoto, Andrew Kanhg, Ravi Subramanian, Michelle Clancy, David Holt, Clive Bittlestone
المصدر: ISQED
مصطلحات موضوعية: Engineering, Product design, Iterative design, business.industry, Computer-automated design, Design flow, Electronic design automation, business, Industrial engineering, Process corners, Manufacturing engineering, Technology management, Design technology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9a12151d9ece93253e7b63d49a9f50ee
https://doi.org/10.1109/isqed.2007.64 -
7
المؤلفون: Sani R. Nassif, Vijay Pitchumani, Dennis Sylvester, W.H. Joyner, Shishpal Rawat, Clive Bittlestone, Riko Radojcic, Norma Rodriguez
المصدر: DAC
مصطلحات موضوعية: Very-large-scale integration, Engineering, Computer engineering, Design styles, business.industry, Order (exchange), Variation (game tree), Integrated circuit design, Analysis tools, business, Data science, Variety (cybernetics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7089a3df21c7994f88060bd8da849d3f
https://doi.org/10.1145/1146909.1147018 -
8
المؤلفون: Clive Bittlestone
المصدر: Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005..
مصطلحات موضوعية: Engineering, Focus (computing), business.industry, Hardware_INTEGRATEDCIRCUITS, Critical zone, Entitlement, business, Manufacturing engineering, Reliability (statistics), Design for manufacturability
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8bb0b29e2c2747863c1097c221bb12b7
https://doi.org/10.1109/esscir.2005.1541593 -
9
المؤلفون: Viet Le, Abha Singh, Usha Narasimha, Clive Bittlestone, N.S. Nagaraj, Anthony M. Hill, Tom Bonifield
المصدر: DAC
مصطلحات موضوعية: Process variation, Interconnection, Back end of line, Engineering, Parasitic capacitance, business.industry, Electronic engineering, Extraction (military), Signal integrity, RC circuit, business, Capacitance
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4d20d0567bba314021832f22ba09fcee
https://doi.org/10.1145/1065579.1065778 -
10
المؤلفون: Andrew B. Kahng, A. Bootehsaz, E. Chen, K. Keutzer, Lou Scheffer, Clive Bittlestone, Chandramouli Visweswariah, Shekhar Borkar, R. Goldman
المصدر: DAC
مصطلحات موضوعية: Process variation, International Technology Roadmap for Semiconductors, Engineering, Noise, Coupling (computer programming), business.industry, Design flow, Process (computing), Electronic engineering, Static timing analysis, business, Power (physics), Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::29cb6149d3f68803d084592650e4c4ed
https://doi.org/10.1145/996566.996757