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1مؤتمر
المؤلفون: Cohen, Charles J., Haanpaa, Doug, Zott, James P.
المصدر: 2015 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) Applied Imagery Pattern Recognition Workshop (AIPR), 2015 IEEE. :1-7 Oct, 2015
Relation: 2015 IEEE Applied Imagery Pattern Recognition Workshop (AIPR)
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2مؤتمر
المؤلفون: Beach, Glenn, Cohen, Charles J., Haanpaa, Doug, Rowe, Steve, Mahal, Pritpaul
المصدر: 2015 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) Applied Imagery Pattern Recognition Workshop (AIPR), 2015 IEEE. :1-6 Oct, 2015
Relation: 2015 IEEE Applied Imagery Pattern Recognition Workshop (AIPR)
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3دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
4مؤتمر
المؤلفون: Rowe, Steve, Mahal, Pritpaul, Burkowski, Lucas, Beach, Glenn, Cohen, Charles J.
المصدر: 2012 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) Applied Imagery Pattern Recognition Workshop (AIPR), 2012 IEEE. :1-6 Oct, 2012
Relation: 2012 IEEE Applied Imagery Pattern Recognition Workshop (AIPR 2012)
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5دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
6مؤتمر
المؤلفون: Cohen, Charles J., Haanpaa, Doug, Rowe, Steve, Zott, James P.
المصدر: 2011 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) Applied Imagery Pattern Recognition Workshop (AIPR), 2011 IEEE. :1-5 Oct, 2011
Relation: 2011 IEEE Applied Imagery Pattern Recognition Workshop: Imaging for Decision Making (AIPR 2011)
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7مؤتمر
المصدر: 2008 37th IEEE Applied Imagery Pattern Recognition Workshop Applied Imagery Pattern Recognition Workshop, 2008. AIPR '08. 37th IEEE. :1-8 Oct, 2008
Relation: 2008 37th IEEE Applied Imagery Pattern Recognition Workshop (AIPR)
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8مؤتمر
المؤلفون: Cohen, Charles J., Morelli, Frank, Scott, Katherine A.
المصدر: 2008 IEEE Conference on Technologies for Homeland Security Technologies for Homeland Security, 2008 IEEE Conference on. :559-565 May, 2008
Relation: 2008 IEEE Conference on Technologies for Homeland Security
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9مؤتمر
المؤلفون: Haanpaa, Douglas, Beach, Glenn, Cohen, Charles J.
المصدر: 35th IEEE Applied Imagery and Pattern Recognition Workshop (AIPR'06) Applied Imagery and Pattern Recognition Workshop, 2006. AIPR 2006. 35th IEEE. :22-22 Oct, 2006
Relation: 35th IEEE Applied Imagery and Pattern Recognition Workshop
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10دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.
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