المؤلفون: Yang, B. B., Cruz-Campa, J. L., Haase, G. S., Cole, E. I., Tangyunyong, P., Resnick, P. J., Kilgo, A. C., Okandan, M., Nielson, G. N.

المصدر: IEEE Journal of Photovoltaics IEEE J. Photovoltaics Photovoltaics, IEEE Journal of. 4(1):470-476 Jan, 2014

المؤلفون: Cole, E. I., Bagnell, C. R., Davies, B., Neacsu, A., Oxford, W., Roy, S., Propst, R. H.

المصدر: Journal of Applied Physics; 12/15/1987, Vol. 62 Issue 12, p4909, 7p

مصطلحات موضوعية: SECONDARY electron emission, METAL oxide semiconductors

المؤلفون: Cole, E. I.

المصدر: Microelectronic Engineering; 1996, Vol. 31 Issue: 1 p13-24, 12p

المؤلفون: Cole, E. I., Jr., Bagnell, C. R., Jr., Davies, B. G., Neacsu, A. M., Oxford, W. V., Propst, R. H.

المصدر: Scanning Microscopy

مصطلحات موضوعية: capacitive coupling voltage contrast, Failure analysis, electron beam induced current, voltage contrast, resistive contrast imaging, backscattered electron imaging, digital image processing, Biology

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______1459::81ce7e66416fefa0bbaf9b3636de1bcf
https://digitalcommons.usu.edu/context/microscopy/article/1263/viewcontent/WDCcenterscan1988ColeBagnellDavies_AdvancedScanningElectron.pdf

المؤلفون: DiBianca, F. A., Johnson, D. G., Bagnell, C. R., Cole, E. I., Oxford, W. V., Propst, R. H., Smith, C. A.

المصدر: Scanning Electron Microscopy

مصطلحات موضوعية: voltage contrast measurement, normalization, voltage referencing, subtraction, scanning electron microscope, image intensity-to-voltage mapping, integrated circuits, Biology

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______1459::780440b02f04dde9249cc1c1f6f96c67
https://digitalcommons.usu.edu/context/electron/article/1042/viewcontent/WDCcenterscan1986DiBiancaJohnsonBagnell_DataAcquisitionProcessing.pdf

المؤلفون: Cole, E. I., Bagnell, C. R., DiBianca, F. A., Johnson, D., Oxford, W., Smith, C., Propst, R. H.

المصدر: Applied Physics Letters; 3/3/1986, Vol. 48 Issue 9, p599, 2p

مصطلحات موضوعية: SCANNING electron microscopes, INTEGRATED circuits, PASSIVE components