المؤلفون: Miller, Mary A., Cole, Edward I., Kraus, Garth M., Robertson, Perry J.

المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-5 Apr, 2020

Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Helinski, Ryan L., Cole, Edward I., Robertson, Gideon, Woodbridge, Jonathan, Pierson, Lyndon G.

المصدر: 2016 IEEE International Symposium on Hardware Oriented Security and Trust (HOST) Hardware Oriented Security and Trust (HOST), 2016 IEEE International Symposium on. :139-144 May, 2016

Relation: 2016 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)

المؤلفون: Cole, Edward I.

المصدر: 2008 IEEE Custom Integrated Circuits Conference Custom Integrated Circuits Conference, 2008. CICC 2008. IEEE. :53-56 Sep, 2008

Relation: 2008 IEEE Custom Integrated Circuits Conference - CICC 2008

المؤلفون: Cole, Edward I.

المصدر: 2006 International Electron Devices Meeting Electron Devices Meeting, 2006. IEDM '06. International. :1-4 Dec, 2006

Relation: 2006 International Electron Devices Meeting

المؤلفون: Walraven, Jeremy A., Soden, Jerry M., Cole, Edward I., Tanner, Danelle M., Anderson, Richard E.

المصدر: 2001 Electrical Overstress/Electrostatic Discharge Symposium Electrical Overstress/Electrostatic Discharge Symposium, 2001. EOS/ESD '01.. :236-246 Sep, 2001

Relation: 2001 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

المؤلفون: Yang, Benjamin B., Cruz-Campa, Jose L., Haase, Gaddi S., Tangyunyong, Paiboon, Cole, Edward I., Pimentel, Alejandro A., Resnick, Paul J., Okandan, Murat, Nielson, Gregory N.

المصدر: 2013 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2013 IEEE International. :4B.2.1-4B.2.5 Apr, 2013

Relation: 2013 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Cole, Edward I., Jr.^Aff2, Barton, Daniel L.^Aff2

المساهمون: Wagner, Lawrence C., editor^Aff1

المصدر: Failure Analysis of Integrated Circuits : Tools and Techniques. 494:87-112

Degree: Ph.D.

المؤلفون: Cole, Edward I., Jr. ^*, Tangyunyong, Paiboon, Barton, Daniel L.

المصدر: In Microelectronics Reliability 1999 39(5):681-693

المؤلفون: Yang, B. B., Cruz-Campa, J. L., Haase, G. S., Tangyunyong, P., Cole, Edward I., Pimentel, A. A., Resnick, P. J., Okandan, M., Nielson, G. N.

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______2659::299d32a6033b21f5ad63bca70f12b52d
https://zenodo.org/record/1273848

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