المؤلفون: Cordiano, F., Sanfilippo, D., Stassi, A., Mazza, B., Perego, R., Di Martino, G., Calvagno, G., Astuto, M., Di Venere, F., Pulvirenti, G., Patti, D.

المصدر: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2023 7th IEEE. :1-5 Mar, 2023

Relation: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

المؤلفون: Fiorenza, P., Cordiano, F., Alessandrino, S. M., Russo, A., Zanetti, E., Saggio, M., Bongiorno, C., Giannazzo, F., Roccaforte, F.

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-4 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Aboudonia, A., Eichler, A., Cordiano, F., Banjac, G., Lygeros, J.

المصدر: IEEE Transactions on Automatic Control IEEE Trans. Automat. Contr. Automatic Control, IEEE Transactions on. 67(11):6263-6270 Nov, 2022

المؤلفون: Mazza, B., Cordiano, F., Boscaglia, M., Scuderi, V., Frazzica, M., Ricciari, R., Poma, M., Gagliano, C., Patane, S.

المصدر: 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2021 IEEE International Symposium on the. :1-6 Sep, 2021

Relation: 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Mazza, B., Patane, S., Cordiano, F., Giliberto, M., Renna, G., Severino, A., Zanetti, E., Boscaglia, M., Franco, G.

المصدر: 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-4 Mar, 2021

Relation: 2021 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Alessandrino, S., Carbone, B., Cordiano, F., Mazza, B., Russo, A., Coco, W., Boscaglia, M., Salvo, A. Di, Lombardo, A., Scarcella, D., Vitanza, E., Fiorenza, P.

المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :P61-1-P61-4 Mar, 2022

Relation: 2022 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Mazza, B., Patanè, S., Cordiano, F., Giliberto, M., Barletta, G., Franco, G.

المصدر: In Microelectronics Reliability October 2021 125

المؤلفون: Curro, T. ^*, Cordiano, F., Franco, G., Mondio, G., Ippedico, G.

المصدر: In Materials Science & Engineering B 2004 114:290-294

المؤلفون: Curro, T, Cordiano, F, Franco, G, Mondio, Guglielmo, Ippedico, G.

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______3978::1c880bb9a58763978bbd7baa925f9bb6
http://hdl.handle.net/11570/1738662

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