المؤلفون: Karthikeyan, M., Fox, S., Cote, W., Yeric, G., Hall, M., Garcia, J., Mitchell, B., Wolf, E., Agarwal, S.

المصدر: 2006 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on. :104-109 2006

Relation: Proceedings of the 2006 International Conference on Microelectronic Test Structures

المؤلفون: Edelstein, D., Rathore, H., Davis, C., Clevenger, L., Cowley, A., Nogami, T., Agarwala, B., Arai, S., Carbone, A., Chanda, K., Chen, F., Cohen, S., Cote, W., Cullinan, M., Dalton, T., Das, S., Davis, P., Demarest, J., Dunn, D., Dziobkowski, C., Filippi, R., Fitzsimmons, J., Flaitz, P., Gates, S., Gill, J., Grill, A., Hawken, D., Ida, K., Klaus, D., Klymko, N., Lane, M., Lane, S., Lee, J., Landers, W., Li, W.-K., Lin, Y.-H., Liniger, E., Liu, X.-H., Madan, A., Malhotra, S., Martin, J., Molis, S., Muzzy, C., Nguyen, D., Nguyen, S., Ono, M., Parks, C., Questad, D., Restaino, D., Sakamoto, A., Shaw, T., Shimooka, Y., Simon, A., Simonyi, E., Swift, A., Van Kleeck, T., Vogt, S., Wang, Y.-Y., Wille, W., Wright, J., Yang, C.-C., Yoon, M., Ivers, T.

المصدر: 2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :316-319 2004

Relation: 2004 IEEE International Reliability Physics Symposium. Proceedings

المؤلفون: Karthikeyan, M., Fox, S., Cote, W., Yeric, G., Hall, M., Garcia, J., Mitchell, B., Wolf, E., Agarwal, S.

المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 21(2):161-168 May, 2008

المؤلفون: Edelstein, D., Heidenreich, J., Goldblatt, R., Cote, W., Uzoh, C., Lustig, N., Roper, P., McDevitt, T., Motsiff, W., Simon, A., Dukovic, J., Wachnik, R., Rathore, H., Schulz, R., Su, L., Luce, S., Slattery, J.

المصدر: International Electron Devices Meeting. IEDM Technical Digest Electron Devices Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International. :773-776 1997

Relation: International Electron Devices Meeting. IEDM Technical Digest

المؤلفون: Gray, A.P., Cote, W.

المصدر: In Public Health November 2019 176:77-81

المؤلفون: Ettinger, G.J., Grimson, W.E.L., Leventon, M.E., Kikinis, R., Gugino, V., Cote, W., Karapelou, M., Aglio, L., Shenton, M., Potts, G., Alexander, E.

المصدر: Proceedings of the Workshop on Mathematical Methods in Biomedical Image Analysis Mathematical methods in biomedical image analysis Mathematical Methods in Biomedical Image Analysis, 1996., Proceedings of the Workshop on. :32-41 1996

Relation: Proceedings of the Workshop on Mathematical Methods in Biomedical Image Analysis

المؤلفون: Edelstein, D., Davis, C., Clevenger, L., Yoon, M., Cowley, A., Nogami, T., Rathore, H., Agarwala, B., Arai, S., Carbone, A., Chanda, K., Cohen, S., Cote, W., Cullinan, M., Dalton, T., Das, S., Davis, P., Demarest, J., Dunn, D., Dziobkowski, C., Filippi, R., Fitzsimmons, J., Flaitz, P., Gates, S., Gill, J., Grill, A., Hawken, D., Ida, K., Klaus, D., Klymko, N., Lane, M., Lane, S., Lee, J., Landers, W., Li, W.-K., Lin, Y.-H., Liniger, E., Liu, X.-H., Madan, A., Malhotra, S., Martin, J., Molis, S., Muzzy, C., Nguyen, D., Nguyen, S., Ono, M., Parks, C., Questad, D., Restaino, D., Sakamoto, A., Shaw, T., Shimooka, Y., Simon, A., Simonyi, E., Tempest, S., Van Kleeck, T., Vogt, S., Wang, Y.-Y., Wille, W., Wright, J., Yang, C.-C., Ivers, T.

المصدر: Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729) Interconnect technology Interconnect Technology Conference, 2004. Proceedings of the IEEE 2004 International. :214-216 2004

Relation: Proceedings of the IEEE 2004 International Interconnect Technology Conference

المؤلفون: White, F., Hill, W., Eslinger, S., Payne, E., Cote, W., Chen, B., Johnson, K.

المصدر: 1992 International Technical Digest on Electron Devices Meeting Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International. :301-304 1992

Relation: Proceedings of IEEE International Electron Devices Meeting

المؤلفون: Heidenreich, J., Edelstein, D., Goldblatt, R., Cote, W., Uzoh, C., Lustig, N., McDevitt, T., Stamper, A., Simon, A., Dukovic, J., Andricacos, P., Wachnik, R., Rathore, H., Katsetos, T., McLaughlin, P., Luce, S., Slattery, J.

المصدر: Proceedings of the IEEE 1998 International Interconnect Technology Conference (Cat. No.98EX102) Interconnect technology Interconnect Technology Conference, 1998. Proceedings of the IEEE 1998 International. :151-153 1998

Relation: Proceedings of the IEEE 1998 International Interconnect Technology Conference

المؤلفون: Shang, Huiling, Jain, S., Josse, E., Alptekin, E., Nam, M.H., Kim, S.W., Cho, K.H., Kim, I., Liu, Y., Yang, X., Wu, X., Ciavatti, J., Kim, N.S., Vega, R., Kang, L., Meer, H.V., Samavedam, S., Celik, M., Soss, S., Utomo, H., Ramachandran, R., Lai, W., Sardesai, V., Tran, C., Kim, J.Y., Park, Y.H., Tan, W.L., Shimizu, T., Joy, R., Strane, J., Tabakman, K., Lalanne, F., Montanini, P., Babich, K., Kim, J. B., Economikos, L., Cote, W., Reddy, C., Belyansky, M., Arndt, R., Kwon, U., Wong, K., Koli, D., Levedakis, D., Lee, J.W., Muncy, J., Krishnan, S., Schepis, D., Chen, X., Kim, B.D., Tian, C., Linder, B.P., Cartier, E., Narayanan, V., Northrop, G., Menut, O., Meiring, J., Thomas, A., Aminpur, M., Park, S.H., Lee, K.Y., Kim, B.Y., Rhee, S.H., Hamieh, B., Srivastava, R., Koshy, R., Goldberg, C., Pallachalil, M., Chae, M., Ogino, A., Watanabe, T., Oh, M., Mallela, H., Codi, D., Malinge, P., Weybright, M., Mann, R., Mittal, A., Eller, M., Lian, S., Li, Y., Divakaruni, R., Bukofsky, S., Kim, J.D., Sudijono, J., Neumueller, W., Matsuoka, F., Sampson, R.

المصدر: 2012 Symposium on VLSI Technology (VLSIT) VLSI Technology (VLSIT), 2012 Symposium on. :129-130 Jun, 2012

Relation: 2012 IEEE Symposium on VLSI Technology