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المصدر: Optics & Laser Technology. 98:121-133
مصطلحات موضوعية: 0209 industrial biotechnology, Materials science, business.industry, Physics::Medical Physics, 02 engineering and technology, Edge (geometry), 021001 nanoscience & nanotechnology, Laser, Atomic and Molecular Physics, and Optics, Standard deviation, Electronic, Optical and Magnetic Materials, law.invention, Perimeter, 020901 industrial engineering & automation, Optics, law, Position (vector), Distortion, Path (graph theory), Counter-scanning, Electrical and Electronic Engineering, 0210 nano-technology, business
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المؤلفون: Jing Liu, Liu Chenguang, Gu Kang, Yue Wang, Jiubin Tan, Xiaoyu You
المصدر: Journal of Microscopy. 266:107-114
مصطلحات موضوعية: Histology, Materials science, business.industry, 02 engineering and technology, Optical field, 021001 nanoscience & nanotechnology, Galvanometer, 01 natural sciences, Signal, Noise (electronics), Pathology and Forensic Medicine, 010309 optics, symbols.namesake, Optics, Optical tweezers, Distortion, 0103 physical sciences, symbols, Counter-scanning, 0210 nano-technology, Raster scan, business
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المصدر: The International Journal of Advanced Manufacturing Technology. 91:3457-3465
مصطلحات موضوعية: Surface (mathematics), 0209 industrial biotechnology, Materials science, Physics::Medical Physics, Diagonal, Geometry, 02 engineering and technology, 01 natural sciences, Scan line, Industrial and Manufacturing Engineering, Standard deviation, law.invention, 010309 optics, 020901 industrial engineering & automation, Optics, law, 0103 physical sciences, business.industry, Mechanical Engineering, Forming processes, Laser, Computer Science Applications, Control and Systems Engineering, Path (graph theory), Counter-scanning, business, Software
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المؤلفون: Xu Chen, Wenjie Meng, Qingyou Lu, Tengfei Guo, Jing Zhang, Yubin Hou
المصدر: Scanning. 2017:1-7
مصطلحات موضوعية: Scanner, Materials science, business.industry, Tantalum, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Atomic and Molecular Physics, and Optics, law.invention, Piezoelectric tube, Rigidity (electromagnetism), Optics, chemistry, law, Atomic resolution, 0103 physical sciences, Electrode, Counter-scanning, Scanning tunneling microscope, 010306 general physics, 0210 nano-technology, business, Instrumentation
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المؤلفون: Li-Chen Fu, Yi-Ting Lin, Kuang-Yao Chang, Wei-Chih Liu, Da-Wei Liu, Jim-Wei Wu, Yu-Ting Lo
المصدر: IEEE/ASME Transactions on Mechatronics. 21:2512-2521
مصطلحات موضوعية: 0209 industrial biotechnology, Materials science, business.industry, 02 engineering and technology, computer.file_format, Grating, 021001 nanoscience & nanotechnology, Computer Science Applications, law.invention, 020901 industrial engineering & automation, Nanolithography, Optics, Optical microscope, Control and Systems Engineering, Feature (computer vision), law, Distortion, Microscopy, Counter-scanning, Electrical and Electronic Engineering, Raster graphics, 0210 nano-technology, business, computer
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المؤلفون: Rostislav V. Lapshin
المصدر: Applied Surface Science. 359:629-636
مصطلحات موضوعية: Scanner, Physics - Instrumentation and Detectors, Microscope, Materials science, FOS: Physical sciences, General Physics and Astronomy, law.invention, Optics, law, Position (vector), Mesoscale and Nanoscale Physics (cond-mat.mes-hall), Calibration, Sensitivity (control systems), Condensed Matter - Materials Science, Condensed Matter - Mesoscale and Nanoscale Physics, business.industry, Materials Science (cond-mat.mtrl-sci), Instrumentation and Detectors (physics.ins-det), Surfaces and Interfaces, General Chemistry, Condensed Matter Physics, Surfaces, Coatings and Films, Nanometrology, Counter-scanning, business, Feature-oriented scanning
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المؤلفون: Yu-Ting Lo, Wei-Chih Liu, Li-Chen Fu, Jim-Wei Wu, Yi-Ting Lin
المصدر: IEEE Transactions on Nanotechnology. 14:810-819
مصطلحات موضوعية: Materials science, business.industry, Conductive atomic force microscopy, Computer Science Applications, Lissajous curve, Scanning probe microscopy, Optics, Scanning ion-conductance microscopy, Counter-scanning, Electrical and Electronic Engineering, Raster scan, business, Feature-oriented scanning, Non-contact atomic force microscopy
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المؤلفون: Xianqi Li, An-Ping Li, Yunmei Chen, Xiaoguang Zhang, Jewook Park, Hao Zhang
المصدر: Scanning, Vol 2017 (2017)
Scanningمصطلحات موضوعية: Article Subject, Computer science, Image registration, 02 engineering and technology, 01 natural sciences, Atomic units, Scan line, law.invention, law, Lattice (order), 0103 physical sciences, Computer vision, lcsh:Microscopy, Instrumentation, 010302 applied physics, Horizontal scan rate, lcsh:QH201-278.5, business.industry, 021001 nanoscience & nanotechnology, Atomic and Molecular Physics, and Optics, Computer Science::Computer Vision and Pattern Recognition, Counter-scanning, Artificial intelligence, Scanning tunneling microscope, 0210 nano-technology, business, Algorithm, Order of magnitude, Research Article
وصف الملف: text/xhtml
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المؤلفون: Kanglong Yu, Ming-Jie Sun
المصدر: Optik. 124:6905-6909
مصطلحات موضوعية: Pixel, Physics::Instrumentation and Detectors, business.industry, Infrared, Computer science, Detector, ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Optical axis, Optics, Machining, Aliasing, Computer Science::Computer Vision and Pattern Recognition, Counter-scanning, Electrical and Electronic Engineering, business, ComputingMethodologies_COMPUTERGRAPHICS, Visible spectrum
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المؤلفون: Hyejeong Ryu, Wan Kyun Chung
المصدر: Electronics Letters. 51:686-688
مصطلحات موضوعية: Line fitting, Matching (graph theory), Angular displacement, business.industry, Measure (mathematics), Distribution (mathematics), Line (geometry), Counter-scanning, Point (geometry), Computer vision, Artificial intelligence, Electrical and Electronic Engineering, business, Mathematics