المؤلفون: Federspiel, X., Doyen, L., Courtas, S.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 7(2):236-241 Jun, 2007

المؤلفون: Gregoire, M., Kordic, S., Ignat, M., Federspiel, X., Vannier, P., Courtas, S.

المصدر: Proceedings of the IEEE 2005 International Interconnect Technology Conference, 2005. Interconnect technology Interconnect Technology Conference, 2005. Proceedings of the IEEE 2005 International. :36-38 2005

Relation: Proceedings of the IEEE 2005 International Interconnect Technology Conference

المؤلفون: Federspiel, X., Courtas, S., Gregoire, M.

المصدر: 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual Reliability physics symposium, 2007. proceedings. 45th annual. ieee international. :640-641 Apr, 2007

Relation: 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual

المؤلفون: Chhun, S., Gosset, L.G., Michelon, J., Girault, V., Vitiello, J., Hopstaken, M., Courtas, S., Debauche, C., Bancken, P.H.L., Gaillard, N., Bryce, G., Juhel, M., Pinzelli, L., Guillan, J., Gras, R., Van Schravendijk, B., Dupuy, J.-C., Torres, J.

المصدر: In Microelectronic Engineering 2006 83(11):2094-2100

المؤلفون: Courtas, S., Grégoire, M., Federspiel, X., Bicaïs-Lepinay, N., Wyon, C.

المصدر: In Microelectronics Reliability 2006 46(9):1530-1535

المؤلفون: Baier, N., Mollard, L., Rothman, J., Destéfanis, G., Ballet, P., Bourgeois, G., Zanatta, J. P., Tchagaspanian, M., Courtas, S., Fougères, P., Pautet, C., Pidancier, P., Rubaldo, L.

المصدر: Proceedings of SPIE; Nov2009, Issue 1, p729823-729823-11, 11p

المؤلفون: Pistone, Frederic, Tribolet, P., Lefoul, X., Zecri, M., Courtas, S., Jenouvrier, P., Rothman, Johan

المصدر: Proceedings of SPIE; Nov2009, Issue 1, p729834-729834-10, 10p

المؤلفون: Kwakman, L. F. Tz., Bicais-Lepinay, N., Courtas, S., Delille, D., Juhel, M., Trouiller, C., Wyon, C., de la Bardonnie, M., Lorut, F., Ross, R.

المصدر: AIP Conference Proceedings; 2005, Vol. 788 Issue 1, p51-62, 12p

مصطلحات موضوعية: INTEGRATED circuits, COMPLEMENTARY metal oxide semiconductors, MEASUREMENT, QUALITY control, MANUFACTURED products, PHYSICAL sciences

المؤلفون: Andresen, Bjørn F., Fulop, Gabor F., Miller, John Lester, Zheng, Lucy, Berthoz, Jocelyn, Rubaldo, Laurent, Brunner, Alexandre, Maillard, M., Vojetta, G., Jomard, N., Courtas, S., Péré-Laperne, N., Rochette, F., Gravrand, Olivier, Billon-Lanfrey, D.

المصدر: Proceedings of SPIE; 4/14/2020, Vol. 11407, p1140715-1140715, 1p

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