المؤلفون: Both, T.H., Croon, J.A., Banaszeski da Silva, M., Tuinhout, H.P., Scholten, A.J., Zegers-van Duijnhoven, A., Wirth, G.I.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(7):2919-2926 Jul, 2017

المؤلفون: Rossetto, I., Meneghini, M., Pandey, S., Gajda, M., Hurkx, G.A.M., Croon, J.A., Sonsky, J., Meneghesso, G., Zanoni, E.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(1):73-77 Jan, 2017

المؤلفون: Croon, J.A., Kaczer, B., Lujan, G.S., Kubicek, S., Groeseneken, G., Meuris, M.

المصدر: Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. Microelectronic Test Structures Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on. :191-196 2005

Relation: ICMTS 2005. Proceedings of the 2005 International Conference on Microelectronic Test Structures

المؤلفون: Croon, J.A., Decoutere, S., Sansen, W., Maes, H.E.

المصدر: Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) Solid-state device research conference Solid-State Device Research Conference, 2004. ESSDERC 2004. Proceeding of the 34th European. :193-196 2004

Relation: Proceedings of the 34th European Solid-State Device Research Conference

المؤلفون: Croon, J.A., Leunissen, L.H.A., Jurczak, M., Benndorf, M., Rooyackers, R., Ronse, K., Decoutere, S., Sansen, W., Maes, H.E.

المصدر: ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. Solid-state device research - ESSDERC '03 European Solid-State Device Research, 2003. ESSDERC '03. 33rd Conference on. :227-230 2003

Relation: ESSDERC 2003. Proceedings of the 33rd European Solid-State Device Research - ESSDERC '03

المؤلفون: Croon, J.A., Tuinhout, H.P., Difrenza, R., Knol, J., Moonen, A.J., Decoutere, S., Maes, H.E., Sansen, W.

المصدر: Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. Microelectronic test structures Microelectronic Test Structures, 2002. ICMTS 2002. Proceedings of the 2002 International Conference on. :235-240 2002

Relation: ICMTS 2002. Proceedings of the 2002 International Conference on Microelectronic Test Structures

المؤلفون: Croon, J.A., Augendre, E., Decoutere, S., Sansen, W., Maes, H.E.

المصدر: 32nd European Solid-State Device Research Conference Solid-State Device Research Conference, 2002. Proceeding of the 32nd European. :579-582 2002

Relation: 32nd European Solid-State Device Research Conference

المؤلفون: Croon, J.A., Storms, G., Winkelmeier, S., Pollentier, I., Ercken, M., Decoutere, S., Sansen, W., Maes, H.E.

المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :307-310 2002

Relation: IEEE International Electron Devices Meeting

المؤلفون: Croon, J.A., Rosmeulen, M., Decoutere, S., Sansen, W., Maes, H.E.

المصدر: ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) Microelectronic test structures Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on. :213-218 2001

Relation: ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures

المؤلفون: Croon, J.A., Rosmeulen, M., Decoutere, S., Sansen, W., Maes, H.E.

المصدر: 30th European Solid-State Device Research Conference Solid-State Device Research Conference, 2000. Proceeding of the 30th European. :356-359 2000

Relation: 30th European Solid-State Device Research Conference