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1مؤتمر
المصدر: 2023 IEEE 13th International Conference on Electronics and Information Technologies (ELIT) Electronics and Information Technologies (ELIT), 2023 IEEE 13th International Conference on. :1-5 Sep, 2023
Relation: 2023 IEEE 13th International Conference on Electronics and Information Technologies (ELIT)
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2
المؤلفون: Zheng Cao, Shengli An, Xiwen Song
المصدر: Journal of Rare Earths. 40:1628-1634
مصطلحات موضوعية: Materials science, Doping, General Chemistry, Crystallographic defect, Metal, Fracture toughness, Thermal conductivity, Geochemistry and Petrology, visual_art, Vickers hardness test, Thermal, visual_art.visual_art_medium, Ceramic, Composite material
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3كتاب إلكتروني
المؤلفون: Awang, MokhtarAff4, Mohammadpour, EhsanAff4, Muhammad, Ibrahim DaudaAff5
المساهمون: Awang, MokhtarAff1, Mohammadpour, EhsanAff2, Muhammad, Ibrahim DaudaAff3
المصدر: Finite Element Modeling of Nanotube Structures : Linear and Non-linear Models. :165-173
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4
المصدر: Acta Astronautica. 194:434-441
مصطلحات موضوعية: Materials science, Evaporation, Aerospace Engineering, chemistry.chemical_element, Nanosecond, Laser, Crystallographic defect, Copper, law.invention, Impact crater, chemistry, law, Grain boundary, Irradiation, Composite material
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5
المؤلفون: Ilgın Nar, Hu Xu, Qian Chen, Feini Yan, Hui Xiao, Armağan Atsay, Danish Khan, Zong-Xiang Xu, Geping Qu
المصدر: Journal of Energy Chemistry. 67:263-275
مصطلحات موضوعية: Materials science, Passivation, Energy conversion efficiency, Energy Engineering and Power Technology, Crystallographic defect, chemistry.chemical_compound, Fuel Technology, Chemical engineering, chemistry, Electrochemistry, Phthalocyanine, Thiophene, Density functional theory, Grain boundary, Energy (miscellaneous), Perovskite (structure)
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6
المؤلفون: Erich H. Kisi, John O'Connor, Liqun Shi, Hongliang Zhang, Peter Richardson, Hanjun Tu, Dongya Zhang
المصدر: Journal of the European Ceramic Society. 42:1311-1321
مصطلحات موضوعية: Lattice constant, Materials science, Rietveld refinement, Electromagnetic shielding, Materials Chemistry, Ceramics and Composites, Analytical chemistry, Radiation damage, Neutron, Irradiation, Neutron radiation, Crystallographic defect
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7
المؤلفون: Hao Wu, Zhigang Chen, Qingfeng Liu, Liang-Cao Yin, Xiaolei Shi, Yuewen Zhang, Han Gao, Yifeng Wang, Wei-Di Liu, Xueping Wu, De-Zhuang Wang
المصدر: Journal of Materials Science & Technology. 106:249-256
مصطلحات موضوعية: Materials science, Polymers and Plastics, Phonon scattering, Condensed matter physics, Mechanical Engineering, Metals and Alloys, Pellets, Thermoelectric materials, Crystallographic defect, Matrix (mathematics), Chemical bond, Mechanics of Materials, Thermoelectric effect, Materials Chemistry, Ceramics and Composites, Figure of merit
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8
المؤلفون: Katsumi Yoshida, Mohd Idzat Idris, Toyohiko Yano
المصدر: Nuclear Engineering and Technology. 54:991-996
مصطلحات موضوعية: Materials science, Nuclear Energy and Engineering, Transmission electron microscopy, Annealing (metallurgy), Sintering, Recrystallization (metallurgy), Grain boundary, Composite material, Microstructure, Crystallographic defect, Black spot
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9
المؤلفون: Alina Manshina, Vassily A. Medvedev, Erkki Lähderanta, Irina M. Shubina, Ilya E. Kolesnikov, Daria V. Mamonova, M. D. Mikhailov
المصدر: Ceramics International. 48:5100-5106
مصطلحات موضوعية: Materials science, Process Chemistry and Technology, Doping, Nanoparticle, Thermal treatment, Crystal structure, Crystallographic defect, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Chemical engineering, Materials Chemistry, Ceramics and Composites, Particle, Dispersion (chemistry), Luminescence
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10
المؤلفون: Jianying Li, Weidong Shi, Kangning Wu, Boyu Zhang, Xia Zhao, Men Guo
المصدر: Journal of the European Ceramic Society. 42:162-168
مصطلحات موضوعية: Materials science, business.industry, Doping, Energy-dispersive X-ray spectroscopy, Crystallographic defect, Dielectric spectroscopy, symbols.namesake, Electrical resistivity and conductivity, Materials Chemistry, Ceramics and Composites, symbols, Optoelectronics, business, Raman spectroscopy, Current density, Diffractometer