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1مؤتمر
المؤلفون: Raghunathan, U. S., Sirohi, S., Ruparelia, V., Sharma, P. K., Ioannou, D. P., Jain, V., Kakara, H. K., Gedela, S., Vanukuru, V., Dongmo, P., Luce, C., Hazbun, R., Krishnasamy, R., Hwang, J., Levy, M., Welch, K., Liu, S., Cucci, B., Cole, S., Kantarovsky, J., Vallett, A., McCallum-Cook, I., Yu, M., Phelps, R., Divergilio, A., Sturm, A., Peters, M., Johnson, S., Rassel, R., Lagerquist, M., Kerbaugh, M., Newton, K., Pekarik, J., Liu, Q.
المصدر: 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS) BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2022 IEEE. :232-235 Oct, 2022
Relation: 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)
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2مؤتمر
المؤلفون: Ramanathan, E., Jiang, L., Takmeel, Q., MaryClaire, S., Mahalingam, A.K.M., Ghosh, S., Donegan, K., Chandrasekar, A., Singh, S., Johanson, H., Damjanovic, D., Sun, Z., Sircar, A., Eah, S.-K., Bombardier, C., DaSilva, A., O'Brien, B., Roux, A., Cucci, B., Christopher, O., Montgomery, C., Venkatasubramanian, V., Rana, V., Mody, J., Shepard, J., Child, C., Morganfeld, B., Sheraw, R.
المصدر: 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) Advanced Semiconductor Manufacturing Conference (ASMC), 2019 30th Annual SEMI. :1-4 May, 2019
Relation: 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
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3مؤتمر
المؤلفون: Feilchenfeld, N. B., Anderson, F. G., Barwicz, T., Chilstedt, S., Ding, Y., Ellis-Monaghan, J., Gill, D. M., Hedges, C., Hofrichter, J., Horst, F., Khater, M., Kiewra, E., Leidy, R., Martin, Y., McLean, K., Nicewicz, M., Orcutt, J. S., Porth, B., Proesel, J., Reinholm, C., Rosenberg, J. C., Sacher, W. D., Stricker, A. D., Whiting, C., Xiong, C., Agrawal, A., Baker, F., Baks, C. W., Cucci, B., Dang, D., Doan, T., Doany, F., Engelmann, S., Gordon, M., Joseph, E., Maling, J., Shank, S., Tian, X., Willets, C., Ferrario, J., Meghelli, M., Libsch, F., Offrein, B., Green, W. M. J., Haensch, W.
المصدر: 2015 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2015 IEEE International. :25.7.1-25.7.4 Dec, 2015
Relation: 2015 IEEE International Electron Devices Meeting (IEDM)
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4دورية
المؤلفون: Engelmann, Sebastian U., Wise, Rich S., Feilchenfeld, N. B., Nummy, K., Barwicz, T., Gill, D., Kiewra, E., Leidy, R., Orcutt, J. S., Rosenberg, J., Stricker, A. D., Whiting, C., Ayala, J., Cucci, B., Dang, D., Doan, T., Ghosal, M., Khater, M., McLean, K., Porth, B., Sowinski, Z., Willets, C., Xiong, C., Yu, C., Yum, S., Giewont, K., Green, W. M. J.
المصدر: Proceedings of SPIE; April 2017, Vol. 10149 Issue: 1 p101490D-101490D-9, 913420p
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5دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
6مؤتمر
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
7مؤتمر
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.