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المؤلفون: Y. Yamamoto, Martin Knaipp, D. Bolze, Ewald Wachmann, M. Sekowski, Peter Pichler, Martin Schrems, S. Koffel, Alexander Burenkov, Damiano Giubertoni, Massimo Bersani
المصدر: physica status solidi c. 11:12-15
مصطلحات موضوعية: Materials science, Dopant, business.industry, Doping, Transistor, Analytical chemistry, chemistry.chemical_element, Condensed Matter Physics, Threshold voltage, law.invention, PMOS logic, chemistry, Gate oxide, law, Optoelectronics, Electrical measurements, business, Boron
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المؤلفون: Filadelfo Cristiano, Silke Paul, H. Kheyrandish, Wilfried Lerch, J. Niess, Fabrice Severac, J. Gelpey, Pier-Francesco Fazzini, D. Bolze, A. Martinez-Limia, S. McCoy, Peter Pichler
المصدر: Materials Science and Engineering: B. :3-13
مصطلحات موضوعية: Materials science, Dopant, Annealing (metallurgy), Mechanical Engineering, Analytical chemistry, chemistry.chemical_element, Dopant Activation, Condensed Matter Physics, PMOS logic, Secondary ion mass spectrometry, chemistry, Mechanics of Materials, General Materials Science, Wafer, Boron, Sheet resistance
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المؤلفون: Peter Zaumseil, I. Costina, J. Niess, O. Fursenko, D. Bolze, T. Huelsmann, W. Lerch
المصدر: physica status solidi c. 5:1370-1373
مصطلحات موضوعية: Materials science, Analytical chemistry, chemistry.chemical_element, Condensed Matter Physics, Characterization (materials science), chemistry.chemical_compound, X-ray photoelectron spectroscopy, chemistry, Stack (abstract data type), Silicide, Surface layer, Tin, Reflectometry, Layer (electronics)
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المؤلفون: Mario Birkholz, P. Zaumseil, D. Bolze, G. Weidner, J. Bauer
المصدر: Materials Science and Engineering: C. 27:1154-1157
مصطلحات موضوعية: Materials science, business.industry, Scattering, Doping, Bioengineering, Biomaterials, Reciprocal lattice, Optics, Semiconductor, Ion implantation, Mechanics of Materials, Wafer, Specular reflection, business, Lithography
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المؤلفون: D. Wolansky, J. Nieíß, S. Buschbaum, W. Lerch, Viktor Melnik, O. Fursenko, D. Bolze
المصدر: Microelectronic Engineering. 76:311-317
مصطلحات موضوعية: Materials science, Silicon, Annealing (metallurgy), Analytical chemistry, chemistry.chemical_element, Atmospheric temperature range, Condensed Matter Physics, Salicide, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry, Rapid thermal processing, Electrical and Electronic Engineering, Tin, Sheet resistance, Titanium
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المؤلفون: R. Scholz, M. Marschmeyer, D. Knoll, Thomas Grabolla, Johannes Borngraber, R. Barth, H.-E. Wulf, Bernd Heinemann, Peter Schley, Rainer Kurps, B. Kuck, K.E. Ehwald, D. Wolansky, Holger Rucker, W. Hoppner, U. Haak, D. Bolze, Bernd Tillack, H.H. Richter, J. Drews, D. Krüger, J. Bauer, Peter Zaumseil, Wolfgang Winkler, D. Schmidt, Yuji Yamamoto
المصدر: Applied Surface Science. 224:297-305
مصطلحات موضوعية: Materials science, business.industry, Transistor, Bipolar junction transistor, General Physics and Astronomy, Hardware_PERFORMANCEANDRELIABILITY, Surfaces and Interfaces, General Chemistry, Integrated circuit, BiCMOS, Condensed Matter Physics, Surfaces, Coatings and Films, law.invention, CMOS, law, Extremely high frequency, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Wired communication, business, Hardware_LOGICDESIGN, Electronic circuit
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المؤلفون: Bernd Tillack, Peter Zaumseil, Dirk Wolansky, Joachim Bauer, O. Fursenko, Eberhard Bugiel, D. Bolze, A. Goryachko, D. Krüger
المصدر: Thin Solid Films. 450:248-254
مصطلحات موضوعية: Auger electron spectroscopy, Materials science, Metals and Alloys, Analytical chemistry, chemistry.chemical_element, Surfaces and Interfaces, Salicide, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, Ellipsometry, Silicide, Materials Chemistry, Thin film, Tin, Refractive index, Sheet resistance
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المؤلفون: Dirk Wolansky, D. Bolze, D. Knoll, Bernd Tillack, Peter Schley, G. G. Fischer, Y. Yamamoto
المصدر: Solid State Phenomena. :249-254
مصطلحات موضوعية: Materials science, Heterostructure-emitter bipolar transistor, business.industry, Heterojunction bipolar transistor, Bipolar junction transistor, Heterojunction, Condensed Matter Physics, Crystallographic defect, Atomic and Molecular Physics, and Optics, Current injection technique, Optoelectronics, General Materials Science, business, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::30971f39cb571e867292effaf5fc89a8
https://doi.org/10.4028/www.scientific.net/ssp.95-96.249 -
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المؤلفون: Tzanimir Arguirov, K.-E. Ehwald, Peter Formanek, Winfried Seifert, Jürgen Reif, Martin Kittler, D. Bolze
المصدر: Solid State Phenomena. :289-296
مصطلحات موضوعية: Materials science, chemistry, Silicon, Phosphorus, Inorganic chemistry, chemistry.chemical_element, General Materials Science, Condensed Matter Physics, Luminescence, Crystallographic defect, Atomic and Molecular Physics, and Optics
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e594d966af2a232dd1675072b779a26c
https://doi.org/10.4028/www.scientific.net/ssp.95-96.289