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1دورية أكاديمية
المؤلفون: A. Redaelli, A. Gandolfo, G. Samanni, E. Gomiero, E. Petroni, L. Scotti, A. Lippiello, P. Mattavelli, J. Jasse, D. Codegoni, A. Serafini, R. Ranica, C. Boccaccio, J. Sandrini, R. Berthelon, J.-C. Grenier, O. Weber, D. Turgis, A. Valery, S. Del Medico, V. Caubet, J.-P. Reynard, D. Dutartre, L. Favennec, A. Conte, F. Disegni, M. De Tomasi, A. Ventre, M. Baldo, D. Ielmini, A. Maurelli, P. Ferreira, F. Arnaud, F. Piazza, P. Cappelletti, R. Annunziata, R. Gonella
المصدر: IEEE Journal of the Electron Devices Society, Vol 10, Pp 563-568 (2022)
مصطلحات موضوعية: ePCM, reliability, BEOL, 28nm FDSOI, embedded memory, emerging memory, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: S. Jay, A. Comar, R. Benicio, J. Beauvois, D. Dutartre, G. Daubige, W. Li, J. Labrosse, S. Thomas, N. Henry, M. Weiss, F. Baret
المصدر: Plant Phenomics, Vol 2020 (2020)
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2643-6515
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المؤلفون: A Portavoce, G Roland, J Remondina, M Descoins, M Bertoglio, M Amalraj, P Eyméoud, D Dutartre, F Lorut, M Putero
المساهمون: Aix Marseille Université (AMU), Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)
المصدر: Nanotechnology
Nanotechnology, 2022, 33 (29), pp.295601. ⟨10.1088/1361-6528/ac6813⟩مصطلحات موضوعية: [PHYS]Physics [physics], crystallization, Mechanical Engineering, Bioengineering, General Chemistry, phase change memory, [SPI]Engineering Sciences [physics], thin films, Mechanics of Materials, Phase change memory Phase change material GST Thin films crystallization Kinetic Monte Carlo simulation, kinetic monte carlo simulation, General Materials Science, Electrical and Electronic Engineering, GST, phase change material
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المؤلفون: J. Kanyandekwe, D. Barge, P. Morin, L. Grenouillet, M. Labrot, S. Maitrejean, E. Augendre, V. Lapras, Y. Morand, D. Dutartre, M. Gros-Jean, O. Gourhant, C. Gaumer, N. Rambal, D. Cooper, L. Clement
المصدر: Extended Abstracts of the 2018 International Conference on Solid State Devices and Materials.
مصطلحات موضوعية: Planar, Materials science, CMOS, business.industry, Optoelectronics, Epitaxy, business, PMOS logic
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0d11f975f51d0660963a7b263064dacb
https://doi.org/10.7567/ssdm.2018.c-3-03 -
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المؤلفون: L. Gaben, R. Berthelon, F. Andrieu, D. Rouchon, D. Dutartre, F. Roze, M. Vinet
المصدر: Extended Abstracts of the 2018 International Conference on Solid State Devices and Materials.
مصطلحات موضوعية: Materials science, Strain (chemistry), business.industry, Optoelectronics, Channel (broadcasting), business, Spectroscopy
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9c591225a5ce1c358c0b8e0f57c40662
https://doi.org/10.7567/ssdm.2018.c-3-02 -
6دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
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المؤلفون: F. Deleglise, D. Le Cunff, D. Dutartre, S. Morris, D. Ristoiu, V. Vachellerie
المصدر: Applied Surface Science. 253:167-172
مصطلحات موضوعية: Materials science, Silicon, Dopant, business.industry, Doping, Analytical technique, General Engineering, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, Germanium, Surfaces and Interfaces, General Chemistry, Dielectric, Epitaxy, Condensed Matter Physics, Surfaces, Coatings and Films, Metrology, Secondary ion mass spectrometry, chemistry, Optoelectronics, Wafer, business, Boron
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المؤلفون: Konstantinos P. Giannakopoulos, C. Fellous, S. Roth, D. Richard, D. Dutartre, M. Burghammer
المصدر: Journal of Applied Physics. 93:259-264
مصطلحات موضوعية: Microprobe, Materials science, business.industry, General Physics and Astronomy, Synchrotron radiation, Chemical vapor deposition, Monocrystalline silicon, Crystallography, Beamline, Selective area epitaxy, Shallow trench isolation, Optoelectronics, Wafer, business
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9دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
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المؤلفون: Lucile Broussous, J. Siniviant, Nathalie Vulliet, D. Dutartre, Peng Sun, C. Perrot, Lieven Verslegers, Attila Mekis, Sebastien Cremer, Daniel Benoit, Charles Baudot, M. Ries, Frederic Boeuf, Olivier Gourhant, Aurélie Souhaité, Y. Chi, Thierry Pinguet, A.M. Jones, G. Courgoulet
المصدر: 11th International Conference on Group IV Photonics (GFP).
مصطلحات موضوعية: Fabrication, Materials science, Silicon photonics, Physics::Instrumentation and Detectors, business.industry, Physics::Optics, Single polarization, Grating, Distributed Bragg reflector, Polarization (waves), Soi substrate, Computer Science::Other, Optics, Insertion loss, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::61cba8069dc0d9f78fbc2c6d0182872a
https://doi.org/10.1109/group4.2014.6961964