-
1
المؤلفون: Paul C. Parries, John E. Barth, James P. Norum, L. R. Logan, S.S. Iyer, J. P. Rice, D. Hoyniak
المصدر: IBM Journal of Research and Development. 49:333-350
مصطلحات موضوعية: Engineering, Hardware_MEMORYSTRUCTURES, General Computer Science, business.industry, Sense amplifier, Memory controller, CAS latency, Embedded system, Universal memory, Non-volatile random-access memory, Memory rank, Static random-access memory, business, Dram
-
2
المؤلفون: R. Srivastava, M.A. Bakhle, K T.G., D. Hoyniak
المصدر: International Journal of Numerical Methods for Heat & Fluid Flow. 14:382-402
مصطلحات موضوعية: Computer science, business.industry, Applied Mathematics, Mechanical Engineering, Numerical analysis, Computation, Structural engineering, Aeroelasticity, Stability (probability), Computer Science Applications, Physics::Fluid Dynamics, symbols.namesake, Mechanics of Materials, Turbomachinery, Euler's formula, symbols, Boundary value problem, Representation (mathematics), business
-
3
المؤلفون: M. I. Younus, Michael J. Hauser, Rebecca D. Mih, D. Hoyniak, J. M. Johnson, Matthew J. Breitwisch, W. G. Crocco, Peter E. Cottrell, Wagdi W. Abadeer, A. Moriwaki, Terence B. Hook, E. Phipps, J. Rivard, Orest Bula, Beth Ann Rainey, Randy W. Mann, Jeffrey S. Brown, Christopher S. Putnam, Chung Hon Lam, J. Toomey, Stephen S. Furkay, Bryant C. Colwill
المصدر: IBM Journal of Research and Development. 47:553-566
مصطلحات موضوعية: Engineering, General Computer Science, Cell leakage, business.industry, Sram cell, Electrical engineering, Static random-access memory, business, Dual gate, Lithography, Leakage (electronics)
-
4
المؤلفون: Terence B. Hook, Jeffrey S. Brown, Randy W. Mann, Eric Adler, D. Hoyniak, J. Johnson, Peter E. Cottrell
المصدر: IEEE Transactions on Electron Devices. 50:1946-1951
مصطلحات موضوعية: Condensed Matter::Quantum Gases, Materials science, Condensed Matter::Other, business.industry, Scattering, Analytical chemistry, Edge (geometry), Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, Electronic, Optical and Magnetic Materials, Threshold voltage, Ion, stomatognathic diseases, Ion implantation, Proximity effect (audio), MOSFET, Optoelectronics, Astrophysics::Earth and Planetary Astrophysics, Implant, Electrical and Electronic Engineering, business
-
5
المصدر: IEEE Transactions on Electron Devices. 49:1623-1627
مصطلحات موضوعية: Shadow mask, Masking (art), Materials science, business.industry, Transistor, ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION, Electrical engineering, Photoresist, Electronic, Optical and Magnetic Materials, law.invention, Integrated injection logic, Ion implantation, CMOS, law, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Halo, Electrical and Electronic Engineering, business
-
6
المؤلفون: D. Hoyniak, Richard L. Anderson, Edward J. Nowak
المصدر: Journal of Applied Physics. 87:876-881
مصطلحات موضوعية: Electron mobility, Condensed matter physics, Field (physics), Chemistry, Electric field, Velocity saturation, Induced high electron mobility transistor, Analytical chemistry, General Physics and Astronomy, Charge density, Saturation velocity, Field-effect transistor
-
7
المؤلفون: Jeffrey S. Brown, Peter E. Cottrell, Matthew J. Breitwisch, Terence B. Hook, Randy W. Mann, Chung H. Lam, D. Hoyniak
المصدر: IEEE Transactions on Electron Devices. 49:1499-1501
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Materials science, Dopant, Sram cell, Hardware_PERFORMANCEANDRELIABILITY, Chip, Electronic, Optical and Magnetic Materials, Threshold voltage, Noise margin, Low-power electronics, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Static random-access memory, Electrical and Electronic Engineering, Leakage (electronics)
-
8
المؤلفون: R. Srivastava, M.A. Bakhle, T.G. Keith Jr., D. Hoyniak
المصدر: Computational Mechanics: Techniques and Developments.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::da0f19dae0b2e12319e2a88f01283b2a
https://doi.org/10.4203/ccp.66.6.5 -
9
المؤلفون: J. Toomey, D. Hoyniak, Randy W. Mann, D. Lea, M. Weybright, C. Wann, Yoo-Mi Lee, Shang-Bin Ko, Robert C. Wong, P. Croce, David J. Frank, J. Sudijono
المصدر: IEEE VLSI-TSA International Symposium on VLSI Technology, 2005. (VLSI-TSA-Tech)..
مصطلحات موضوعية: Engineering, business.industry, Spice, Sram cell, Redundancy (engineering), Electronic engineering, Sigma, Figure of merit, Integrated circuit design, Static random-access memory, business, Scaling, Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::56fb8d516c6b82aa9b3fc45214f8e21e
https://doi.org/10.1109/vtsa.2005.1497065 -
10
المؤلفون: D. Hoyniak, Jay G. Harrington, Andrew Lu, Rebecca D. Mih, Eric Jasinski, Orest Bula, Anne E. McGuire
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Engineering, business.industry, computer.software_genre, Optical proximity correction, Resist, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Computer Aided Design, Wafer, Static random-access memory, Photomask, business, computer, Lithography, Aerial image
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f61dacca3f7d7e94a486c8e6295ae015
https://doi.org/10.1117/12.410741