المؤلفون: J. Y. Zhang, S. B. Liu, H. Wu, P. Chen, Y. J. Zhang, N. Angkawisittpan, S. Sonasang, O. M. Dardeer, A. N. Basmaci, T. A. Khan, E. A. Hajlaoui, E. Jin, Huirun Chen, D. N. Aloi, X. Q. Li, M. H. B. Ucar, Bo Li, S. Ji, J.-S. Park, D. Li, Hong Zhang, Z. Li, J. Luo, S. Ding, Y. Feng, J. Park, W. Tang, J. Zhao, Y. Hu, Z. Song, B. K. Hornbuckle, A. Tariq, D. M. Elsheakh, Wei Wang, K. F. A. Hussein, L. Yuan, Q. Yu, B. Du, S. Pan, Z. Yan, Y. Zhu, S. Guan, S.-Y. Kim, G. Li, K. Mao, X. Kong, X. L. Wang, W. Zhou, M. I. Khattak, J. Yuan, Y. Ji, P. Gurrala, X. Yang, Q. Ren, X. Yu, X. F. Deng, A. Wang, W.-S. Lee, J. Tian, P. D. Sathya, X. Fan, Z. Huang, D. Wang, S. K. A. Rahim, N. RajeshKumar, Yanchu Wang, A. E. Farahat, Z. Yu, J. Liu, A. A. Eteng, Q. Feng, A. M. Yacoub, F. Fan, Z. M. Almohaimeed, M. O. Khalifa, J. Song, J. Yang, Z. Luo, H. Dai, R. Ma, Y. Wen, Q. Wu

المصدر: Applied Computational Electromagnetics Society. 36:610-621

مصطلحات موضوعية: Physics, Scattering, business.industry, Plane wave, Astronomy and Astrophysics, Fresnel equations, Polarization (waves), Optics, Angle of incidence (optics), Surface roughness, Light beam, Ray tracing (graphics), Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cc572f773fe10a688177729456345181
https://doi.org/10.47037/2020.aces.j.360601