المؤلفون: C. Perrot, Sebastien Kerdiles, J. Gaudy, Delphine Marris-Morini, Stephane Monfray, Philippe Grosse, J. Lassarre, D. Pellissier-Tanon, Sylvain Guerber, P. Acosta-Abla, C. Barrera, C. Euvard-Colnat, N. Michit, Yohan Desieres, Bertrand Szelag, S. Messaoudène, K. Rovayaz, Nathalie Vulliet, Sebastien Cremer, Frederic Boeuf, Laurent Vivien, Maurin Douix, Ismael Charlet

المصدر: Integrated Photonics Platforms: Fundamental Research, Manufacturing and Applications.

مصطلحات موضوعية: Silicon photonics, Materials science, Fabrication, Silicon, Electro-optic effect, business.industry, Capacitive sensing, chemistry.chemical_element, Interferometry, chemistry, Dispersion (optics), Optoelectronics, business, Layer (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::45ead3b15bdfabf9d260bad5bb4a4cbd
https://doi.org/10.1117/12.2556460

المؤلفون: F. Roy, Nayera Ahmed, C. Perrot, Bastien Mamdy, G-N. Lu, B. Orlando, D. Pellissier-Tanon, Francois Leverd, Arnaud Tournier, Maurice Rivoire, J.-P. Carrere, N. Virollet, A. Seignard

المصدر: 2014 IEEE International Electron Devices Meeting.

مصطلحات موضوعية: Materials science, Fabrication, Pixel, Silicon, business.industry, chemistry.chemical_element, CMOS, chemistry, Gate oxide, Electronic engineering, Optoelectronics, Quantum efficiency, Image sensor, business, Dark current

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f2790f983320d9bb942740b2881a4975
https://doi.org/10.1109/iedm.2014.7046979

المؤلفون: Nicolas Planes, J. Pradelle, Pierre Perreau, P. Brun, Olivier Weber, Konstantin Bourdelle, Thierry Poiroux, Bich-Yen Nguyen, J. Ducote, Claire Fenouillet-Beranger, Remi Beneyton, R. Bianchini, B. Orlando, Francois Andrieu, A. Margain, L. Tosti, F. Abbate, C. Borowiak, C. Richard, D. Pellissier-Tanon, O. Faynot, C. Richier, T. Benoist, Magali Gregoire, Pascal Gouraud, Frederic Boeuf, Thomas Skotnicki, J. Bustos, Sebastien Haendler, E. Gourvest

المساهمون: Laboratoire d'Electronique et des Technologies de l'Information (CEA-LETI), Université Grenoble Alpes (UGA)-Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), STMicroelectronics [Crolles] (ST-CROLLES), Institut de Recherches sur les lois Fondamentales de l'Univers (IRFU), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay, Unité Commune d'Expérimentation Animale, Institut National de la Recherche Agronomique (INRA), Silicon-on-Insulator Technologies (SOITEC), Parc Technologique des Fontaines, Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS), Centre National de la Recherche Scientifique (CNRS)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Université Grenoble Alpes (UGA)

المصدر: Solid-State Electronics
Solid-State Electronics, Elsevier, 2013, 88, pp.15-20,. ⟨10.1016/j.sse.2013.04.008⟩
Solid-State Electronics, 2013, 88, pp.15-20,. ⟨10.1016/j.sse.2013.04.008⟩

مصطلحات موضوعية: Power management, Engineering, Materials science, Silicon on insulator, 02 engineering and technology, 01 natural sciences, law.invention, law, 0103 physical sciences, Materials Chemistry, Electrical and Electronic Engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Metal gate, ComputingMilieux_MISCELLANEOUS, Ground plane, High-κ dielectric, 010302 applied physics, business.industry, Transistor, Electrical engineering, Biasing, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Threshold voltage, Modulation, Logic gate, Optoelectronics, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a4d8055efd4e4d214521e76c15c3c374
https://hal.archives-ouvertes.fr/hal-01002051

المؤلفون: D. Barge, Gerard Ghibaudo, C. Leroux, D. Pellissier-Tanon, F. Abbate, Denis Rideau, G. Bidal, Clement Tavernier, O. Saxod, G. Reimbold, Alain Toffoli, A. Soussou, G. Romano

المساهمون: Institut des Matériaux Jean Rouxel (IMN), Université de Nantes - UFR des Sciences et des Techniques (UN UFR ST), Université de Nantes (UN)-Université de Nantes (UN)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Ecole Polytechnique de l'Université de Nantes (EPUN), Université de Nantes (UN)-Université de Nantes (UN), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)

المصدر: Microelectronic Engineering
Microelectronic Engineering, Elsevier, 2013, 109, pp.282-285. ⟨10.1016/j.mee.2013.03.008⟩

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Gate stack, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Threshold voltage, Dipole, 0103 physical sciences, Optoelectronics, Work function, Flat band, Electrical and Electronic Engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 0210 nano-technology, business, ComputingMilieux_MISCELLANEOUS, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4a250045984f0f0de0160a27ad361368
https://hal.archives-ouvertes.fr/hal-00996510

المؤلفون: Jeremy Passieux, Pascal Gouraud, Michel Haond, Romain Bon, D. Barge, David Petit, D. Pellissier-Tanon, F. Abbate, Frederic Boeuf, Sebastien Haendler, Thierry Poiroux, B. Dumont, Dominique Golanski, Francois Andrieu, Olivier Weber, A. Bajolet, C. Fenouillet-Beranger, Antoine Cros, I. Ben-Akkez, O. Bonin, O. Faynot, E. Richard, Pascal Fonteneau, V. Barral, Walter Schwarzenbach, Nicolas Planes, P. Perreau

المصدر: 2012 Symposium on VLSI Technology (VLSIT).

مصطلحات موضوعية: Materials science, Electrostatic discharge, CMOS, business.industry, Logic gate, Silicon on insulator, Optoelectronics, Biasing, Substrate (electronics), business, NMOS logic, Threshold voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bdcd83febc962172b55fc8cac6bc872f
https://doi.org/10.1109/vlsit.2012.6242488

المؤلفون: C. Fenouillet-Beranger, Thomas Skotnicki, I. Ben Akkez, Olivier Weber, A. Margain, Francis Balestra, Pascal Gouraud, P. Perreau, Sebastien Haendler, Frederic Boeuf, Konstantin Bourdelle, D. Pellissier-Tanon, C. Borowiak, E. Gourvest, C. Richard, Antoine Cros, Remi Beneyton, Gerard Ghibaudo, O. Faynot, F. Abbate, Bich-Yen Nguyen, Thierry Poiroux, Francois Andrieu

المصدر: Proceedings of Technical Program of 2012 VLSI Technology, System and Application.

مصطلحات موضوعية: Materials science, Access resistance, business.industry, Electrical engineering, Optoelectronics, Silicon on insulator, Substrate (printing), business, NMOS logic, High-κ dielectric, PMOS logic

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::41402023f01948b117c12b71a11b450d
https://doi.org/10.1109/vlsi-tsa.2012.6210158

المؤلفون: Frederic Boeuf, Remi Beneyton, Antoine Cros, Sebastien Haendler, P. Perreau, C. Fenouillet-Beranger, Thomas Skotnicki, I. Ben Akkez, Thierry Poiroux, Gerard Ghibaudo, O. Faynot, Bich-Yen Nguyen, E. Gourvest, Francis Balestra, Olivier Weber, Konstantin Bourdelle, A. Margain, Pascal Gouraud, Francois Andrieu, C. Borowiak, C. Richard, F. Abbate, D. Pellissier-Tanon

المصدر: 2012 13th International Conference on Ultimate Integration on Silicon (ULIS).

مصطلحات موضوعية: Electron mobility, Materials science, Scattering, business.industry, Impurity, Logic gate, MOSFET, Electrical engineering, Silicon on insulator, Optoelectronics, Substrate (electronics), business, NMOS logic

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::92a7959c2628c7d3c29160736b0074d4
https://doi.org/10.1109/ulis.2012.6193386

المؤلفون: Jean-François Carpentier, Bertrand Dubus, M. Borel, M. Gorisse, Lionel Buchaillot, I. Kone, G. Parat, H. Jacquinot, D. Pellissier-Tanon, Alexandre Reinhardt, F. Casset, F. Domingue

المساهمون: Minatec, Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), STMicroelectronics [Crolles] (ST-CROLLES), Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)

المصدر: Applied Physics Letters
Applied Physics Letters, 2010, 96 (22), pp.223504. ⟨10.1063/1.3440370⟩
Applied Physics Letters, American Institute of Physics, 2010, 96, pp.223504-1-3. ⟨10.1063/1.3440370⟩

مصطلحات موضوعية: Physics, Physics and Astronomy (miscellaneous), Acoustics, Surface acoustic wave, 02 engineering and technology, Acoustic wave, 021001 nanoscience & nanotechnology, Distributed Bragg reflector, 01 natural sciences, Piezoelectricity, Resonator, Lamb waves, Band-pass filter, 0103 physical sciences, Radio frequency, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 0210 nano-technology, 010301 acoustics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c7669bba516d1b674b3a1c1b049877bc
https://hal.science/hal-00548560/document

المؤلفون: Pascal Ancey, X. Gagnard, R. Hida, M. Audoin, B. Orlando, R. Cuchet, Bernard Viala, D. Pellissier-Tanon

المصدر: INTERMAG 2006 - IEEE International Magnetics Conference.

مصطلحات موضوعية: Toroid, Materials science, business.industry, Inductor, Inductance, Nuclear magnetic resonance, visual_art, Electronic component, visual_art.visual_art_medium, Microelectronics, Optoelectronics, business, Electrical impedance, Electronic circuit, DC bias

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a5927e04facc05cfe234cbca85e1f7bf
https://doi.org/10.1109/intmag.2006.375560

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