المؤلفون: Yuan, Sicong, Yaldagard, Mohammad Amin, Xun, Hanzhi, Fieback, Moritz, Marinissen, Erik Jan, Kim, Woojin, Rao, Siddharth, Couet, Sebastien, Taouil, Mottaqiallah, Hamdioui, Said

المصدر: 2024 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2024 IEEE. :1-6 May, 2024

Relation: 2024 IEEE European Test Symposium (ETS)

المؤلفون: Suzano, Juan, Chastand, Antoine, Valea, Emanuele, Di Natale, Giorgio, Philippe, Anthony, Abouzeid, Fady, Roche, Philippe

المصدر: 2024 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2024 IEEE. :1-6 May, 2024

Relation: 2024 IEEE European Test Symposium (ETS)

المؤلفون: Mustafa, Y., Kose, S.

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 32(6):1100-1109 Jun, 2024

المؤلفون: Lee, S., Park, J., Park, S., Kim, H., Kang, S.

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المصدر: 2024 IEEE 42nd VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2024 IEEE 42nd. :1-7 Apr, 2024

Relation: 2024 IEEE 42nd VLSI Test Symposium (VTS)

المؤلفون: Sao, Y., Ali, S.S., Mazumdar, B.

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 43(8):2326-2339 Aug, 2024

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المصدر: 2024 Optical Fiber Communications Conference and Exhibition (OFC) Optical Fiber Communications Conference and Exhibition (OFC), 2024. :1-3 Mar, 2024

Relation: 2024 Optical Fiber Communications Conference and Exhibition (OFC)

المؤلفون: Callebaut, G., Liu, L., Eriksson, T., Van der Perre, L., Edfors, O., Fager, C.

المصدر: IEEE Microwave Magazine IEEE Microwave Microwave Magazine, IEEE. 25(4):14-31 Apr, 2024

المؤلفون: Quigley, J.M.

المصدر: IEEE Reliability Magazine IEEE Rel. Mag. Reliability Magazine, IEEE. 1(1):30-36 Mar, 2024

المؤلفون: Litton, M.L., Drusinsky, D., Michael, J.B.

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