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1دورية أكاديمية
المؤلفون: Eyup Cinar, Ferat Sahin, Dalia Yablon
المصدر: Beilstein Journal of Nanotechnology, Vol 6, Iss 1, Pp 2015-2027 (2015)
مصطلحات موضوعية: atomic force microscopy (AFM), mechanical characterization, nanoindentation, Technology, Chemical technology, TP1-1185, Science, Physics, QC1-999
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2190-4286
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2دورية أكاديمية
المؤلفون: Daniel Kiracofe, Arvind Raman, Dalia Yablon
المصدر: Beilstein Journal of Nanotechnology, Vol 4, Iss 1, Pp 385-393 (2013)
مصطلحات موضوعية: atomic force microscopy, bimodal AFM, cantilever eigenmodes, polymer characterization, Technology, Chemical technology, TP1-1185, Science, Physics, QC1-999
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2190-4286
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3
المؤلفون: Dalia Yablon, Ishita Chakraborty, Hillary Passino, Krishnan Iyer, Antonios Doufas, Maksim Shivokhin, John Thornton, Bede Pittenger
المصدر: ACS Symposium Series ISBN: 9780841297630
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5bf5a6b214496fb4d63a8605f62e062f
https://doi.org/10.1021/bk-2022-1416.ch003 -
4
المؤلفون: Dalia Yablon, Matthew Libera
المصدر: Microscopy Today. 27:32-38
مصطلحات موضوعية: Nanostructure, Microscope, Materials science, General Computer Science, Scanning electron microscope, Transmission electron microscopy, law, Resolution (electron density), Microscopy, Nanotechnology, Microscale chemistry, Characterization (materials science), law.invention
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5
المؤلفون: Bede Pittenger, Dalia Yablon, Thomas Mueller, Sergey Osechinskiy
المصدر: JOM. 71:3390-3398
مصطلحات موضوعية: chemistry.chemical_classification, Materials science, 0211 other engineering and technologies, General Engineering, 02 engineering and technology, Polymer, Dynamic mechanical analysis, 021001 nanoscience & nanotechnology, Viscoelasticity, Superposition principle, chemistry, Indentation, Dynamic modulus, Dissipation factor, General Materials Science, Composite material, 0210 nano-technology, Nanoscopic scale, 021102 mining & metallurgy
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6
المؤلفون: Paul Werten, P. L. T. M. Frederix, Dalia Yablon, Christian A. Bippes
المصدر: Microscopy Today. 25:20-25
مصطلحات موضوعية: Modularity (networks), Materials science, General Computer Science, Computer architecture, Atomic force microscopy, 02 engineering and technology, 010402 general chemistry, 021001 nanoscience & nanotechnology, 0210 nano-technology, 01 natural sciences, 0104 chemical sciences
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7كتاب إلكتروني
المؤلفون: Yuling An, Luis M. Antunes, Vikram, Jose J. Plata, Anthony V. Powell, Keith T. Butler, Ricardo Grau-Crespo, Hadi Abroshan, Paul Winget, H. Shaun Kwak, Christopher T. Brown, Mathew D. Halls, Dalia Yablon, Ishita Chakraborty, Hillary Passino, Krishnan Iyer, Antonios Doufas, Maksim Shivokhin, John Thornton, Bede Pittenger, Cheng Qiu, Jinglei Yang, Alejandro E. Rodríguez-Sánchez, Aditya Sonpal, Mohammad Atif Faiz Afzal, Anand Chandrasekaran, Jon Paul Janet, Shinichi Ookawara, Tomoki Yasuda, Yosuke Matsuda, Shiro Yoshikawa, Hideyuki Matsumoto, Wei-Chih Chen, Da Yan, Cheng-Chien Chen, Keisuke Takahashi, Lauren Takahashi
نوع المادة: eBook.
تصنيفات: COMPUTERS / Data Science / Machine Learning, TECHNOLOGY & ENGINEERING / Mechanical, TECHNOLOGY & ENGINEERING / Materials Science / General
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8
المؤلفون: Dalia Yablon, Eyup Cinar, Ferat Sahin
المصدر: Beilstein Journal of Nanotechnology
Beilstein Journal of Nanotechnology, Vol 6, Iss 1, Pp 2015-2027 (2015)مصطلحات موضوعية: mechanical characterization, Materials science, nanoindentation, Silicon, Instrumentation, General Physics and Astronomy, chemistry.chemical_element, Nanotechnology, lcsh:Chemical technology, lcsh:Technology, Full Research Paper, Scanning probe microscopy, Indentation, lcsh:TP1-1185, atomic force microscopy (AFM), General Materials Science, Electrical and Electronic Engineering, lcsh:Science, lcsh:T, business.industry, Resolution (electron density), Nanoindentation, lcsh:QC1-999, Characterization (materials science), Nanoscience, chemistry, Optoelectronics, lcsh:Q, Material properties, business, lcsh:Physics
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9
المؤلفون: Oleg Fedoroyov, Anatoly Komissar, Dalia Yablon, Hisham Taha, A. Ignatov, Aaron Lewis, Eran Maayan
المصدر: Microscopy Today. 21:26-31
مصطلحات موضوعية: Materials science, General Computer Science, Ion beam, Scanning electron microscope, Atomic force microscopy, Basic research, Nanotechnology, Nanoscopic scale
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10
المؤلفون: Dalia Yablon, Daniel Kiracofe, Arvind Raman
المصدر: Beilstein Journal of Nanotechnology
Beilstein Journal of Nanotechnology, Vol 4, Iss 1, Pp 385-393 (2013)مصطلحات موضوعية: Work (thermodynamics), cantilever eigenmodes, Materials science, Cantilever, General Physics and Astronomy, Nanotechnology, 02 engineering and technology, Kinetic energy, lcsh:Chemical technology, 01 natural sciences, Molecular physics, lcsh:Technology, Full Research Paper, polymer characterization, Normal mode, 0103 physical sciences, General Materials Science, lcsh:TP1-1185, Electrical and Electronic Engineering, bimodal AFM, lcsh:Science, Nanoscopic scale, 010302 applied physics, atomic force microscopy, lcsh:T, Resolution (electron density), Mode (statistics), 021001 nanoscience & nanotechnology, lcsh:QC1-999, Nanoscience, lcsh:Q, 0210 nano-technology, Material properties, lcsh:Physics
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a05ddd2110cbf27e534ecdbab87ece30
http://europepmc.org/articles/PMC3701429