يعرض 1 - 10 نتائج من 49 نتيجة بحث عن '"Daval, Nicolas"', وقت الاستعلام: 1.20s تنقيح النتائج
  1. 1
    دورية أكاديمية
    Buried SiGe as a performance booster in n-channel FDSOI MOSFETs

    المؤلفون: Clifton, Paul, Goebel, Andreas, Mulfinger, Robert, Child, Amy, Straub, Sherry, Sporer, Ryan, Carter, Rick, Kluth, Jon, Schaeffer, Jamie, Nguyen, Bich-Yen, Chabanne, Guillaume, Daval, Nicolas, Schwarzenbach, Walter, Hemkar, Manish, Chu, Schubert, Moffatt, Steve

    المصدر: In Solid State Electronics December 2019 162

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  2. 2
    مؤتمر
    Overview of FDSOI technology from substrate to device

    المؤلفون: Nguyen, Bich-Yen, Mazure, Carlos, Delprat, Daniel, Aulnette, Cecile, Daval, Nicolas, Andrieu, Francois, Faynot, Olivier

    المصدر: 2009 International Semiconductor Device Research Symposium Semiconductor Device Research Symposium, 2009. ISDRS '09. International. :1-2 Dec, 2009

    Relation: 2009 International Semiconductor Device Research Symposium (ISDRS)

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  3. 3
    مؤتمر
    Simulation analysis of process-induced variability in nanoscale SOI and bulk FinFETs

    المؤلفون: Brown, Andrew R., Daval, Nicolas, Bourdelle, Konstantin K., Nguyen, Bich-Yen, Asenov, Asen

    المصدر: 2012 IEEE International SOI Conference (SOI) SOI Conference (SOI), 2012 IEEE International. :1-2 Oct, 2012

    Relation: 2012 IEEE International SOI Conference

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  4. 4
    مؤتمر
    Strain Engineering of Ultra-Thin Silicon-on-Insulator Structures Using Ion Implant

    المؤلفون: Ding, Yinjie, Cheng, Ran, Zhou, Qian, Du, Anyan, Daval, Nicolas, Nguyen, Bich-Yen, Yeo, Yee-Chia

    المصدر: 2012 International Silicon-Germanium Technology and Device Meeting (ISTDM) Silicon-Germanium Technology and Device Meeting (ISTDM), 2012 International. :1-2 Jun, 2012

    Relation: 2012 International Silicon-Germanium Technology and Device Meeting (ISTDM)

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  5. 5
    مؤتمر
    High performance Ω-gate Ge FinFET featuring low temperature Si2H6 passivation and implantless Schottky-barrier NiGe metallic Source/Drain

    المؤلفون: Liu, Bin, Gong, Xiao, Han, Genquan, Lim, Phyllis Shi Ya, Tong, Yi, Zhou, Qian, Yang, Yue, Daval, Nicolas, Pulido, Matthieu, Delprat, Daniel, Nguyen, Bich-Yen, Yeo, Yee-Chia

    المصدر: 2012 IEEE Silicon Nanoelectronics Workshop (SNW) Silicon Nanoelectronics Workshop (SNW), 2012 IEEE. :1-2 Jun, 2012

    Relation: 2012 IEEE Silicon Nanoelectronics Workshop (SNW)

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  6. 6
    مؤتمر
    Asymetrically strained high performance Germanium gate-all-around nanowire p-FETs featuring 3.5 nm wire width and contractible phase change liner stressor (Ge2Sb2Te5)

    المؤلفون: Cheng, Ran, Liu, Bin, Guo, Pengfei, Yang, Yue, Zhou, Qian, Gong, Xiao, Dong, Yuan, Tong, Yi, Bourdelle, Konstantin, Daval, Nicolas, Delprat, Daniel, Nguyen, Bich-Yen, Augendre, Emmanuel, Yeo, Yee-Chia

    المصدر: 2013 IEEE International Electron Devices Meeting Electron Devices Meeting (IEDM), 2013 IEEE International. :26.6.1-26.6.4 Dec, 2013

    Relation: 2013 IEEE International Electron Devices Meeting (IEDM)

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  7. 7
    دورية أكاديمية
    Strain engineering of ultra-thin silicon-on-insulator structures using through-buried-oxide ion implantation and crystallization

    المؤلفون: Ding, Yinjie, Cheng, Ran, Zhou, Qian, Du, Anyan, Daval, Nicolas, Nguyen, Bich-Yen, Yeo, Yee-Chia

    المصدر: In Solid State Electronics May 2013 83:37-41

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  8. 8
    دورية
    High Sensitivity Surface Defect Inspection of SiC and SmartSiCTM Substrates Using a DUV Laser-Based System

    المؤلفون: Cela, Enrica, Shahidi, Sam, Parangi, Prasant, Shrestha, Ramesh, Simpson, Gavin, Widiez, Julie, Daval, Nicolas, Chapelle, Audrey, Rouchier, Séverin, Schwarzenbach, Walter

    المصدر: Diffusion and Defect Data Part A: Defect and Diffusion Forum; May 2023, Vol. 425 Issue: 1 p57-61, 5p

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  9. 9
    دورية أكاديمية
    Direct Growth of III-V Devices on Silicon

    المؤلفون: Herrick, Katherine, Kazior, Thomas, Liu, Amy, Loubychev, Dmitri I., Fastenau, Joel M., Urteaga, Miguel, Fitzgerald, Eugene A., Bulsara, Mayank T., Clark, David, Brar, Berinder, Ha, Wonill, Bergman, Joshua, Daval, Nicolas, La Roche, Jeffrey

    المصدر: MRS Online Proceedings Library. 1068(1)

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  10. 10
    دورية أكاديمية
    Stress Metrology: The challenge for the next generation of engineered wafers

    المؤلفون: Tiberj, Antoine, Paillard, Vincent, Aulnette, Cécile, Daval, Nicolas, Bourdelle, Konstantin K., Moreau, Myriam, Kennard, Mark, Cayrefourcq, Ian

    المصدر: MRS Online Proceedings Library. 809(1)

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