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1دورية أكاديمية
المؤلفون: David J. Larson, Geoffrey G. E. Scudder
المصدر: ZooKeys, Vol 889, Iss , Pp 17-22 (2019)
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: Ye Wei, Rama Srinivas Varanasi, Torsten Schwarz, Leonie Gomell, Huan Zhao, David J. Larson, Binhan Sun, Geng Liu, Hao Chen, Dierk Raabe, Baptiste Gault
المصدر: Patterns, Vol 2, Iss 2, Pp 100192- (2021)
مصطلحات موضوعية: time-of-flight mass spectrometry, machine learning, atom probe tomography, secondary ion mass spectrometry, pattern recognition, Computer software, QA76.75-76.765
وصف الملف: electronic resource
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3
المؤلفون: Constantinos Hatzoglou, Gérald Da Costa, Peter Wells, Xiaochen Ren, Brian P Geiser, David J Larson, Remi Demoulin, Kasper Hunnestad, Etienne Talbot, Baishakhi Mazumder, Dennis Meier, François Vurpillot
المساهمون: Groupe de physique des matériaux (GPM), Université de Rouen Normandie (UNIROUEN), Normandie Université (NU)-Normandie Université (NU)-Institut national des sciences appliquées Rouen Normandie (INSA Rouen Normandie), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche sur les Matériaux Avancés (IRMA), Université de Caen Normandie (UNICAEN), Normandie Université (NU)-Normandie Université (NU)-École Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), Normandie Université (NU)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université de Rouen Normandie (UNIROUEN), Normandie Université (NU)-Institut national des sciences appliquées Rouen Normandie (INSA Rouen Normandie), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Université de Caen Normandie (UNICAEN), Normandie Université (NU)-École Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), Normandie Université (NU)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS), Department of Materials Science and Engineering [Trondheim] (IMA NTNU), Norwegian University of Science and Technology [Trondheim] (NTNU), Norwegian University of Science and Technology (NTNU)-Norwegian University of Science and Technology (NTNU), Intel Corporation [Hillsboro], Intel Corporation [USA], Cameca, University at Buffalo [SUNY] (SUNY Buffalo), State University of New York (SUNY)
المصدر: Microscopy and Microanalysis
Microscopy and Microanalysis, 2023, 29 (3), pp.1124-1136. ⟨10.1093/micmic/ozad054⟩مصطلحات موضوعية: multilayered structure, atom probe tomography, field evaporation simulation, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], dynamic reconstruction, Instrumentation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ef92547619e485f3f3b5fa590dcf0cf0
https://normandie-univ.hal.science/hal-04152106 -
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المؤلفون: David A Reinhard, Katherine P Rice, Robert M Ulfig, Isabelle Martin, Brian P Geiser, David J Larson
المصدر: Microscopy and Microanalysis. 28:706-708
مصطلحات موضوعية: Instrumentation
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5
المؤلفون: David J Larson, Ty J Prosa, David Reinhard, Robert M Ulfig, Michael Holman, Dan Lenz
المصدر: Microscopy and Microanalysis. 28:718-720
مصطلحات موضوعية: Instrumentation
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6
المؤلفون: David A Reinhard, Daniel Lenz, Isabelle Martin, Ty J Prosa, Robert M Ulfig, Peter H Clifton, Brian P Geiser, Joseph H Bunton, David J Larson
المصدر: Microscopy and Microanalysis. 28:3188-3189
مصطلحات موضوعية: Instrumentation
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7
المؤلفون: Robert Ulfig, Daniel Lenz, Gard Groth, Joseph H Bunton, Isabel Martin, Ty J Prosa, David A Reinhard, Peter H Clifton, Brian P Geiser, David J Larson
المصدر: Microscopy and Microanalysis. 28:3190-3191
مصطلحات موضوعية: Instrumentation
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8
المصدر: Microscopy and Microanalysis. 27:2032-2034
مصطلحات موضوعية: Materials science, Milli, Nanotechnology, Instrumentation, Quantitative analysis (chemistry), Nanoscopic scale
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9
المؤلفون: Joe Bunton, Brian P. Geiser, D Lenz, Peter H. Clifton, Ty J. Prosa, David A. Reinhard, David J. Larson, I. Martin, Robert M. Ulfig
المصدر: Microscopy and Microanalysis. 27:2464-2466
مصطلحات موضوعية: Materials science, Nuclear magnetic resonance, law, Atom probe, Instrumentation, law.invention
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10
المؤلفون: I. Martin, D Lenz, Robert M. Ulfig, Brian P. Geiser, David A. Reinhard, Joe Bunton, David J. Larson, Ty J. Prosa, Peter H. Clifton
المصدر: Microscopy and Microanalysis. 27:2038-2040
مصطلحات موضوعية: Materials science, Optics, business.industry, law, Instrumentation (computer programming), Atom probe, business, Instrumentation, law.invention