يعرض 1 - 10 نتائج من 100 نتيجة بحث عن '"Dciv"', وقت الاستعلام: 0.90s تنقيح النتائج
  1. 1
    دورية أكاديمية

    المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 22(2):258-266 Jun, 2022

  2. 2
    مؤتمر

    المصدر: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2020 International Conference o. :113-116 Sep, 2020

    Relation: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

  3. 3
    مؤتمر

    المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-6 Jul, 2018

    Relation: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

  4. 4
    دورية أكاديمية

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 65(2):392-403 Feb, 2018

  5. 5
    دورية أكاديمية

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 63(10):4038-4045 Oct, 2016

  6. 6
    مؤتمر

    المصدر: 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) Power Semiconductor Devices & IC's (ISPSD), 2015 IEEE 27th International Symposium on. :397-400 May, 2015

    Relation: 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD)

  7. 7
    دورية أكاديمية

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 61(2):408-415 Feb, 2014

  8. 8
    مؤتمر

    المصدر: 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) Electron Devices and Solid-State Circuits, 2009. EDSSC 2009. IEEE International Conference of. :123-126 Dec, 2009

    Relation: 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC)

  9. 9
    دورية أكاديمية

    المؤلفون: Zhu, S., Nakajima, A., Ohashi, T., Miyake, H.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 53(8):1805-1814 Aug, 2006

  10. 10
    دورية أكاديمية

    المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 34(8):963-965 Aug, 2013