المؤلفون: Moens, P., Liu, C., Banerjee, A., Vanmeerbeek, P., Coppens, P., Ziad, H., Constant, A., Li, Z., De Vleeschouwer, H., Roig-Guitart, J., Gassot, P., Bauwens, F., De Backer, E., Padmanabhan, B., Salih, A., Parsey, J., Tack, M.

المصدر: 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on. :374-377 Jun, 2014

Relation: 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD)

المؤلفون: Liu, C., Salih, A., Padmanabhan, B., Jeon, W., Moens, P., Tack, M., De Backer, E.

المصدر: IEEE Power Electronics Magazine IEEE Power Electron. Mag. Power Electronics Magazine, IEEE. 2(3):44-50 Sep, 2015

المؤلفون: De Mulder, B., Van Renterghem, K., De Backer, E., Suanet, P., Vandewege, J.

المصدر: The 3rd International IEEE-NEWCAS Conference, 2005. IEEE-NEWCAS Conference IEEE-NEWCAS Conference, 2005. The 3rd International. :377-380 2005

Relation: The 3rd International IEEE-NEWCAS Conference

المؤلفون: Ackaert, J., de Backer, E., Lowe, A., Yao, T., Goessens, C., Greenwood, B., Verpoort, P.

المصدر: 2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005. Integrated circuit design and technology Integrated Circuit Design and Technology, 2005. ICICDT 2005. 2005 International Conference on. :103-106 2005

Relation: 2005 International Conference on Integrated Circuit Design and Technology

المؤلفون: Ackaert, J., Lowe, A., De Backer, E., Boonen, S., Yao, T., Van Houdt, J., Haspeslagh, L.

المصدر: 2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) Integrated circuit design and technology Integrated Circuit Design and Technology, 2004. ICICDT '04. International Conference on. :223-226 2004

Relation: 2004 International Conference on Integrated Circuit Design and Technology

المؤلفون: Moens, P., Bolognesi, D., Delobel, L., Villanueva, D., Hakim, H., Trinh, S.C., Reynders, K., De Pestel, F., Lowe, A., De Backer, E., Van Herzeele, G., Tack, M.

المصدر: Proceedings of the 14th International Symposium on Power Semiconductor Devices and Ics Power semiconductor devices and ICs Power Semiconductor Devices and ICs, 2002. Proceedings of the 14th International Symposium on. :225-228 2002

Relation: Proceedings of the 14th International Symposium on Power Semiconductor Devices and ICs

المؤلفون: Ackaert, J., Zhichun Wang, De Backer, E., Salm, C.

المصدر: 7th International Symposium on Plasma- and Process-Induced Damage Plasma- and process-induced damage Plasma- and Process-Induced Damage, 2002 7th International Symposium on. :45-48 2002

Relation: 2002 7th International Symposium on Plasma- and Process-Induced Damage

المؤلفون: Zhichun Wang, Ackaert, J., Salm, C., De Backer, E., van den Bosch, G., Zawalski, W.

المصدر: Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2002. IPFA 2002. Proceedings of the 9th International Symposium on the. :242-245 2002

Relation: Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits

المؤلفون: Ackaert, J., Chevalier, P., Loheac, J.-L., Ziad, H., De Backer, E., Tack, M.

المصدر: 32nd European Solid-State Device Research Conference Solid-State Device Research Conference, 2002. Proceeding of the 32nd European. :267-270 2002

Relation: 32nd European Solid-State Device Research Conference

المؤلفون: Ackaert, J., Zhichun Wang, De Backer, E., Coppens, P.

المصدر: Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2001. IPFA 2001. Proceedings of the 2001 8th International Symposium on the. :224-227 2001

Relation: Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001