المؤلفون: De La Cruz, Em Julius

المصدر: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2019 IEEE 26th International Symposium on. :1-6 Jul, 2019

Relation: 2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Casabuena, Carlo M., De La Cruz, Em Julius

المصدر: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2019 IEEE 26th International Symposium on. :1-4 Jul, 2019

Relation: 2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Casabuena, Carlo M., De La Cruz, Em Julius

المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-4 Jul, 2018

Relation: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Apolinaria, Ronald, Rimbon, David Joseph, De La Cruz, Em Julius

المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-3 Jul, 2018

Relation: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: de La Cruz, Em Julius, Yusof, Yusnani Mohamad, Bruno, Micaella

المصدر: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2015 IEEE 22nd International Symposium on the. :305-309 Jun, 2015

Relation: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: De La Cruz, Em Julius, De La Rea, Sheenel Karl, McDonough, Stephen, Chai, S. F

المصدر: Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2014 IEEE 21st International Symposium on the. :127-130 Jun, 2014

Relation: 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: De La Cruz, Em Julius N., Sabate, Andrew C., Estrera, Shiela Lyn A.

المصدر: Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the. :455-459 Jul, 2013

Relation: 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Karlberg, T, Hornyak, P, Pinto, AF, Milanova, S, Ebrahimi, M, Lindberg, M, Pullen, N, Nordstrom, A, Loverli, E, Caraballo, R, Wong, EV, Nareoja, K, Thorsell, AG, Elofsson, M, De la Cruz, EM, Bjorkegren, C, Schuler, H

المصدر: Nature communications. 9(1):3785

مصطلحات موضوعية: Medicin och hälsovetenskap

URL الوصول: http://kipublications.ki.se/Default.aspx?queryparsed=id:139183875

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