المؤلفون: Avramenko, M., De Schepper, L., Cano, J.-F., Geenen, F., Moens, P., Marcuzzi, A., De Santi, C., Meneghini, M.

المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :P54.SiC-1-P54.SiC-4 Apr, 2024

Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Moens, P., Geenen, F., De Schepper, L., Cano, JF, Lettens, J., Maslougkas, S., Franchi, J., Domeij, M.

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-5 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Moens, P., Banerjee, A., Coppens, P., Constant, A., Vanmeerbeek, P., Li, Z., Declercq, F., De Schepper, L., De Vleeschouwer, H., Liu, C., Padmanabhan, B., Jeon, W., Guo, J., Salih, A., Tack, M.

المصدر: 2015 45th European Solid State Device Research Conference (ESSDERC) Solid State Device Research Conference (ESSDERC), 2015 45th European. :64-67 Sep, 2015

Relation: ESSDERC 2015 - 45th European Solid-State Device Research Conference

المؤلفون: Zhenqiu Ning, Delecourt, H.-X., De Schepper, L., Tack, D., Desoete, B., Gillon, R.

المصدر: 2006 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on. :213-217 2006

Relation: Proceedings of the 2006 International Conference on Microelectronic Test Structures

المؤلفون: Zhenqiu Ning, De Schepper, L., Delecourt, H.-X., Gillon, R., Tack, M.

المصدر: Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. Microelectronic Test Structures Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on. :159-164 2005

Relation: ICMTS 2005. Proceedings of the 2005 International Conference on Microelectronic Test Structures

المؤلفون: Zhenqiu Ning, Delecourt, H.-X., De Schepper, L., Gillon, R., Tack, M.

المصدر: Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :269-272 2005

Relation: Proceedings of ESSDERC 2005. 31st European Solid-State Device Research Conference

المؤلفون: Zhenqiu Ning, De Schepper, L., Gillon, R., Tack, M.

المصدر: ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. Solid-state device research - ESSDERC '03 European Solid-State Device Research, 2003. ESSDERC '03. 33rd Conference on. :79-82 2003

Relation: ESSDERC 2003. Proceedings of the 33rd European Solid-State Device Research - ESSDERC '03

المؤلفون: Petersen, R., De Ceuninck, W., De Schepper, L.

المصدر: 2000 High Frequency Postgraduate Student Colloquium (Cat. No.00TH8539) High frequency postgraduate student colloquium High Frequency Postgraduate Student Colloquium, 2000. :20-25 2000

Relation: 2000 High Frequency Postgraduate Student Colloquium

المؤلفون: Dreesen, R., Croes, K., Manca, J., De Ceuninck, W., De Schepper, L., Pergoot, A., Groeseneken, G.

المصدر: 29th European Solid-State Device Research Conference Solid-State Device Research Conference, 1999. Proceeding of the 29th European. 1:584-587 1999

Relation: 29th European Solid-State Device Research Conference

المؤلفون: Manca, J.V., Wondrak, W., Croes, K., De Ceuninck, W., D'Haeger, V., De Schepper, L., Tielemans, L.

المصدر: HITEN 99. Third European Conference on High Temperature Electronics. (IEEE Cat. No.99EX372) High temperature electronics High Temperature Electronics, 1999. HITEN 99. The Third European Conference on. :29-32 1999

Relation: Proceedings of the Third European Conference on High Temperature Electronics