المؤلفون: Hoenigschmid, H., Frey, A., DeBrosse, J.K., Kirihata, T., Mueller, G., Storaska, D.W., Daniel, G., Frankowsky, G., Guay, K.P., Hanson, D.R., Hsu, L.L.-C., Ji, B., Netis, D.G., Panaroni, S., Radens, C., Reith, A.M., Terletzki, H., Weinfurtner, O., Alsmeier, J., Weber, W., Wordeman, M.R.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 35(5):713-718 May, 2000

المؤلفون: Kirihata, T., Gall, M., Hosokawa, K., Dortu, J.-M., Hing Wong, Pfefferi, P., Ji, B.L., Weinfurtner, O., DeBrosse, J.K., Terletzki, H., Selz, M., Ellis, W., Wordeman, M.R., Kiehl, O.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 33(11):1711-1719 Nov, 1998

المؤلفون: Kirihata, T., Hing Wong, DeBrosse, J.K., Watanabe, Y., Hara, T., Yoshida, M., Wordeman, M.R., Fujii, S., Asao, Y., Krsnik, B.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 32(10):1525-1534 Oct, 1997

المؤلفون: Kirihata, T., Watanabe, Y., Hing Wong, DeBrosse, J.K., Yoshida, M., Kato, D., Fujii, S., Wordeman, M.R., Poechmueller, P., Parke, S.A., Asao, Y.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 31(4):558-566 Apr, 1996

المؤلفون: Watanabe, Y., Hing Wong, Kirihata, T., Kato, D., DeBrosse, J.K., Hara, T., Yoshida, M., Mukai, H., Quader, K.N., Nagai, T., Poechmueller, P., Pfefferl, P., Wordeman, M.R., Fujii, S.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 31(4):567-574 Apr, 1996

المؤلفون: Radens, C.J., Gruening, U., Weybright, M.E., DeBrosse, J.K., Kleinhenz, R.L., Hoenigschmid, H., Thomas, A.C., Mandelman, J.A., Alsmeier, J., Bronner, G.B.

المصدر: 1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216) VLSI technology VLSI Technology, 1998. Digest of Technical Papers. 1998 Symposium on. :36-37 1998

Relation: 1998 Symposium on VLSI Technology Digest of Technical Papers

المؤلفون: Mandelman, J.A., Barth, J.E., DeBrosse, J.K., Dennard, R.H., Kalter, H.L., Gautier, J., Hanafi, H.I.

المصدر: 1996 IEEE International SOI Conference Proceedings SOI SOI Conference, 1996. Proceedings., 1996 IEEE International. :136-137 1996

Relation: 1996 IEEE International SOI Conference Proceedings

المؤلفون: Davarik, B., Koburger, C.W., Schulz, R., Warnock, J.D., Furukawa, T., Jost, M., Taur, Y., Schwittek, W.G., DeBrosse, J.K., Kerbaugh, M.L., Mauer, J.L.

المصدر: International Technical Digest on Electron Devices Meeting Electron Devices Meeting, 1989. IEDM '89. Technical Digest., International. :61-64 1989

Relation: Proceedings of IEEE International Electron Devices Meeting

المؤلفون: Hoenigschmid, H., Frey, A., DeBrosse, J.K., Kirihata, T., Mueller, G., Storaska, D.W., Daniel, G., Frankowsky, G., Guay, K.P., Hanson, D.R., Hsu, L.L.-C., Ji, B., Netis, D.G., Panaroni, S., Radens, C., Reith, A.M., Terletzki, H., Weinfurtner, O., Alsmeier, J., Weber, W.

المصدر: IEEE Journal of Solid-State Circuits; May2000, Vol. 35 Issue 5, p713-718, 6p

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