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1دورية أكاديمية
المؤلفون: Kerridge, G., Sinclair, D.C., Dean, J.S.
المصدر: In Acta Materialia 1 April 2021 207
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2مؤتمر
المؤلفون: Nodine, W.A., Dean, J.S.
المصدر: 1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century AUTOTESTCON '97 AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings. :346-355 1997
Relation: 1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century
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3مؤتمر
المؤلفون: Zimmermann, D., Dean, J.S.
المصدر: 1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century AUTOTESTCON '97 AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings. :361-364 1997
Relation: 1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century
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4مؤتمر
المؤلفون: Thompson, K.D., Dean, J.S.
المصدر: Conference Record. AUTOTESTCON '96 Autotestcon '96 AUTOTESTCON '96, Test Technology and Commercialization. Conference Record. :194-198 1996
Relation: Conference Record. AUTOTESTCON '96
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5مؤتمر
المؤلفون: Dean, J.S.
المصدر: Conference Record. AUTOTESTCON '96 Autotestcon '96 AUTOTESTCON '96, Test Technology and Commercialization. Conference Record. :309-313 1996
Relation: Conference Record. AUTOTESTCON '96
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6مؤتمر
المؤلفون: Dean, J.S., Kidd, D.
المصدر: Conference Record. AUTOTESTCON '96 Autotestcon '96 AUTOTESTCON '96, Test Technology and Commercialization. Conference Record. :375-379 1996
Relation: Conference Record. AUTOTESTCON '96
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7مؤتمر
المؤلفون: Dean, J.S.
المصدر: Conference Record. AUTOTESTCON '96 Autotestcon '96 AUTOTESTCON '96, Test Technology and Commercialization. Conference Record. :436-440 1996
Relation: Conference Record. AUTOTESTCON '96
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8مؤتمر
المؤلفون: Nodine, W.A., Dean, J.S., Weiss, D.H.
المصدر: Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century' AUTOTESTCON '95 AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record. :204-209 1995
Relation: Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century'
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9مؤتمر
المؤلفون: Kirkland, L.V., Dean, J.S.
المصدر: Proceedings of AUTOTESTCON '94 AUTOTESTCON '94 AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.. :469-483 1994
Relation: Proceedings of AUTOTESTCON '94
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10مؤتمر
المؤلفون: Kirkland, L.V., Dean, J.S.
المصدر: AUTOTESTCON 93 AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings. :197-201 1993
Relation: AUTOTESTCON 93
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