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1مؤتمر
المؤلفون: Shi, Limeng, Qian, Jiashu, Jin, Michael, Bhattacharya, Monikuntala, Yu, Hengyu, White, Marvin H., Agarwal, Anant K., Shimbori, Atsushi
المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024
Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)
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2دورية أكاديمية
المصدر: IEEE Access Access, IEEE. 12:75873-75887 2024
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3مؤتمر
المؤلفون: Coscia, Pasquale, Genovese, Angelo, Scotti, Fabio, Piuri, Vincenzo
المصدر: 2023 IEEE International Conference on Image Processing (ICIP) Image Processing (ICIP), 2023 IEEE International Conference on. :1360-1364 Oct, 2023
Relation: 2023 IEEE International Conference on Image Processing (ICIP)
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4مؤتمر
المؤلفون: Bersuker, G., Tang, E., Veksler, D.
المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-5 Mar, 2023
Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)
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5دورية أكاديمية
المصدر: IEEE Access Access, IEEE. 11:82208-82215 2023
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6دورية أكاديمية
المؤلفون: Mustafaev, B., Kim, S., Kim, E.
المصدر: IEEE Access Access, IEEE. 11:113339-113359 2023
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7دورية أكاديمية
المصدر: IEEE Transactions on Industrial Informatics IEEE Trans. Ind. Inf. Industrial Informatics, IEEE Transactions on. 18(10):6743-6755 Oct, 2022
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8مؤتمر
المؤلفون: Akagi, Fumiko, Suzuki, Ryoma, Yayama, Tomoe
المصدر: 2023 IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers) Magnetic Conference - Short Papers (INTERMAG Short Papers), 2023 IEEE International. :1-2 May, 2023
Relation: 2023 IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers)
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9دورية أكاديمية
المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 71:1-14 2022
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10دورية أكاديمية
المؤلفون: Seungmi Oh, Jeongtae Kim
المصدر: IEEE Access, Vol 12, Pp 75873-75887 (2024)
مصطلحات موضوعية: Industrial inspection, machine vision, deep learning, anomaly detection, synthetic defect generation, density estimation, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource