المؤلفون: Guo, Y., Degraeve, R., Vandemaele, M., Saraza-Canflanca, P., Franco, J., Kaczer, B., Bury, E., Verbauwhede, I.

المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-7 Apr, 2024

Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Saraza-Canflanca, P., Fodor, F., Diaz-Fortuny, J., Gierlichs, B., Degraeve, R., Kaczer, B., Verbauwhede, I., Bury, E.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(5):750-753 May, 2024

المؤلفون: Kaczer, B., Degraeve, R., Franco, J., Grasser, T., Roussel, Ph. J., Bury, E., Weckx, P., Chasin, A., Tyaginov, S., Vandemaele, M., Grill, A., O'Sullivan, B., Fortuny, J. Diaz, Canflanca, P. Saraza, Waltl, M., Rinaudo, P., Zhao, Y., Kao, E., Asanovski, R., Catapano, E., Beckers, A., Vici, A., Truijen, B., Higashi, Y., Clima, S., Xiang, Y., Sangani, D., Panarella, L., Smets, Q., Knobloch, T., Waldhor, D., Van Troeye, B., Guo, Y., Kruv, A., Viswakarma, K., Gonzalez, M., Linten, D.

المصدر: 2024 IEEE Silicon Nanoelectronics Workshop (SNW) Silicon Nanoelectronics Workshop (SNW), 2024 IEEE. :3-4 Jun, 2024

Relation: 2024 IEEE Silicon Nanoelectronics Workshop (SNW)

المؤلفون: Kumar, A., Degraeve, R., Beckers, A., Fantini, A., Verbauwhede, I., Linten, D., Kar, G.S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(8):4170-4177 Aug, 2023

المؤلفون: Fang, Y., Ciofi, I., Roussel, P.J., Lesniewska, A., Degraeve, R., De Wolf, I., Croes, K.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(8):4332-4337 Aug, 2023

المؤلفون: Coenen, D., Oprins, H., Degraeve, R., Wolf, I.D.

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(7):2264-2275 Jul, 2023

المؤلفون: Saraza-Canflanca, P., Diaz-Fortuny, J., Vici, A., Bury, E., Degraeve, R., Kaczer, B.

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-6 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Vici, A., Degraeve, R., Roussel, P. J., Franco, J., Kaczer, B., De Wolf, I.

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-7 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Ravsher, T., Garbin, D., Fantini, A., Degraeve, R., Clima, S., Donadio, G.L., Kundu, S., Hody, H., Devulder, W., Van Houdt, J., Afanas'ev, V., Delhougne, R., Kar, G.S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(5):2276-2281 May, 2023

المؤلفون: Buscemi, F., Piccinini, E., Vandelli, L., Nardi, F., Padovani, A., Kaczer, B., Garbin, D., Clima, S., Degraeve, R., Kar, G.S., Tavanti, F., Slassi, A., Calzolari, A., Larcher, L.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(4):1808-1814 Apr, 2023