المؤلفون: Zhou Tian, Deng Yi

المصدر: Measurement: Sensors, Vol 32, Iss , Pp 101056- (2024)

مصطلحات موضوعية: Artificial intelligence, Big data analysis, Psychological health of students, System design, Crisis prediction, Electric apparatus and materials. Electric circuits. Electric networks, TK452-454.4

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2665917424000321; https://doaj.org/toc/2665-9174

URL الوصول: https://doaj.org/article/1e29d1060fc845ffb8eb96ff9e0e6f5d

المؤلفون: Deng Yi, Yin Shitao, Jing Xinyun, Zheng Yuguo

المصدر: Heterocyclic Communications, Vol 29, Iss 1, Pp 531-61 (2023)

مصطلحات موضوعية: quinazoline derivatives, sulfonamide moiety, anti-tmv activity, Organic chemistry, QD241-441

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2191-0197

URL الوصول: https://doaj.org/article/7369b9385a4741888789c8c0ae1ab464

المؤلفون: DENG Yi, WU Li-li, YANG Sha-sha

المصدر: Liang you shipin ke-ji, Vol 30, Iss 5, Pp 219-226 (2022)

مصطلحات موضوعية: nutrition security, food security, consumption preferences, Food processing and manufacture, TP368-456, Nutrition. Foods and food supply, TX341-641

وصف الملف: electronic resource

Relation: http://lyspkj.ijournal.cn/lyspkj/article/abstract/20220526?st=article_issue; https://doaj.org/toc/1007-7561

URL الوصول: https://doaj.org/article/3f5d8e480d8343db903255b06d57e9c0

المؤلفون: DENG Yi-lin, ZHANG Hu

المصدر: He huaxue yu fangshe huaxue, Vol 44, Iss 3, Pp 356-361 (2022)

مصطلحات موضوعية: reo-4, platinum electrode, cyclic voltammogram, bulk electrolysis with coulometry, Nuclear engineering. Atomic power, TK9001-9401, Chemical technology, TP1-1185

وصف الملف: electronic resource

Relation: http://www.jnrc.org.cn/CN/10.7538/hhx.2022.YX.2021036; https://doaj.org/toc/0253-9950

URL الوصول: https://doaj.org/article/839e128cd7fd420ba7ead4a6fbf15004

المؤلفون: SUN Chengyang, LU Taijin, SONG Zhonghua, HE Mingyue, DENG Yi

المصدر: Yankuang ceshi, Vol 41, Iss 2, Pp 199-210 (2022)

مصطلحات موضوعية: diamond, zimbabwe, graphite, abnormal birefringence, strain, polarized light microscopy, scanning electron microscopy, infrared spectroscopy, raman spectroscopy, Geology, QE1-996.5, Ecology, QH540-549.5

وصف الملف: electronic resource

Relation: https://doaj.org/toc/0254-5357

URL الوصول: https://doaj.org/article/fcf3da0b2a9e4bacbad2972deb87393b

المؤلفون: Wang, Hao, Deng, Yi, Hou, Ru Xin, Liu, Qie

المصدر: 2024 IEEE 13th Data Driven Control and Learning Systems Conference (DDCLS) Data Driven Control and Learning Systems Conference (DDCLS), 2024 IEEE 13th. :220-226 May, 2024

Relation: 2024 IEEE 13th Data Driven Control and Learning Systems Conference (DDCLS)

المؤلفون: Huang, Fei, Deng, Yi, Zhang, Chen, Guo, Menghao, Zhan, Kai, Sun, Shanxin, Jiang, Jinling, Sun, Zeyi, Wu, Xindong

المصدر: 2023 IEEE International Conference on Data Mining Workshops (ICDMW) ICDMW Data Mining Workshops (ICDMW), 2023 IEEE International Conference on. :499-505 Dec, 2023

Relation: 2023 IEEE International Conference on Data Mining Workshops (ICDMW)

المؤلفون: YANG Yang, YU Zhishuang, DUAN Xiaoyuan, WU Weili, DENG Yi, YAO Ji

المصدر: 口腔疾病防治, Vol 28, Iss 6, Pp 367-371 (2020)

مصطلحات موضوعية: short root anomaly, root-crown ratio, maxillary central incisors, orthodontics, skeletal malocclusion, axial inclination, Medicine

وصف الملف: electronic resource

Relation: http://www.kqjbfz.com/CN/10.12016/j.issn.2096-1456.2020.06.005; https://doaj.org/toc/2096-1456

URL الوصول: https://doaj.org/article/92e23d8a2d574c4e9c6d2180ee189b28

المؤلفون: Lee, Tzung-Je, Deng, Yi-Ting

المصدر: 2023 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia) Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia), 2023 IEEE Workshop on. :1-4 Aug, 2023

Relation: 2023 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia)

المؤلفون: Wang, Ruizhou, Deng, Yi, Zhang, Yulong

المصدر: 2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2023 IEEE International Conference on. :108-113 Jul, 2023

Relation: 2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)