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1دورية أكاديمية
المؤلفون: Remi Helleboid, Denis Rideau, Jeremy Grebot, Isobel Nicholson, Norbert Moussy, Olivier Saxod, Marie Basset, Antonin Zimmer, Bastien Mamdy, Dominique Golanski, Megan Agnew, Sara Pellegrini, Mathieu Sicre, Christel Buj, Guillaume Marchand, Jerome Saint-Martin, Marco Pala, Philippe Dollfus
المصدر: IEEE Journal of the Electron Devices Society, Vol 10, Pp 584-592 (2022)
مصطلحات موضوعية: Avalanche breakdown probability, breakdown voltage, jitter, photon detection efficiency (PDE), single-photon avalanche diode (SPAD), technology computer-aided design (TCAD), Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: Thibauld Cazimajou, Marco Pala, Jerome Saint-Martin, Remi Helleboid, Jeremy Grebot, Denis Rideau, Philippe Dollfus
المصدر: IEEE Journal of the Electron Devices Society, Vol 9, Pp 1098-1102 (2021)
مصطلحات موضوعية: Avalanche breakdown, Monte Carlo methods, avalanche photodiodes, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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المؤلفون: Salim El Ghouli, Denis Rideau
المصدر: Springer Handbook of Semiconductor Devices ISBN: 9783030798260
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bb9ecac87aa2816826b4da5662438d4c
https://doi.org/10.1007/978-3-030-79827-7_12 -
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المؤلفون: Dorian Saint-Pierre, Raphael Clerc, Remi Helleboid, Denis Rideau
المصدر: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::90de564292b5bf45528f1db6ca931477
https://doi.org/10.1109/essderc55479.2022.9947121 -
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المؤلفون: Rémi Helleboid, Denis Rideau, Jeremy Grebot, Isobel Nicholson, Norbert Moussy, Olivier Saxod, Jérôme Saint-Martin, Marco Pala, Philippe Dollfus
المساهمون: Centre de Nanosciences et de Nanotechnologies (C2N), Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), STMicroelectronics [Crolles] (ST-CROLLES), ANR-20-CE24-0004,GeSPAD,Diode à avalanche à photon unique en Germanium : de la caractérisation à la simulation avancée(2020)
المصدر: Solid-State Electronics
Solid-State Electronics, 2022, 194, pp.108376. ⟨10.1016/j.sse.2022.108376⟩مصطلحات موضوعية: Materials Chemistry, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], Electrical and Electronic Engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Condensed Matter Physics, [PHYS.COND.CM-MSQHE]Physics [physics]/Condensed Matter [cond-mat]/Mesoscopic Systems and Quantum Hall Effect [cond-mat.mes-hall], Electronic, Optical and Magnetic Materials
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المؤلفون: Rémi Helleboid, Denis Rideau, Isobel Nicholson, Jeremy Grebot, Bastien Mamdy, Gabriel Mugny, Marie Basset, Megan Agnew, Dominique Golanski, Sara Pellegrini, Jérôme Saint-Martin, Marco Pala, Philippe Dollfus
المساهمون: STMicroelectronics [Crolles] (ST-CROLLES), Centre de Nanosciences et de Nanotechnologies (C2N), Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), INL - Conception de Systèmes Hétérogènes (INL - CSH), Institut des Nanotechnologies de Lyon (INL), École Centrale de Lyon (ECL), Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-École Supérieure de Chimie Physique Électronique de Lyon (CPE)-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-École Centrale de Lyon (ECL), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), Université de Genève = University of Geneva (UNIGE), Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA), Université catholique de Lille (UCL)-Université catholique de Lille (UCL), ANR-20-CE24-0004,GeSPAD,Diode à avalanche à photon unique en Germanium : de la caractérisation à la simulation avancée(2020)
المصدر: Journal of Physics D: Applied Physics
Journal of Physics D: Applied Physics, IOP Publishing, In press, ⟨10.1088/1361-6463/ac9b6a⟩
Journal of Physics D: Applied Physics, In press, ⟨10.1088/1361-6463/ac9b6a⟩مصطلحات موضوعية: Advection-Diffusion Monte Carlo (ADMC), jitter, Acoustics and Ultrasonics, technology computed aided design (TCAD), Condensed Matter Physics, avalanche breakdown probability, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, electronic transport, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], drift-diffusion, electronic avalanche, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Fokker-Planck, singlephoton avalanche diode (SPAD), Monte Carlo simulation, [PHYS.COND.CM-MSQHE]Physics [physics]/Condensed Matter [cond-mat]/Mesoscopic Systems and Quantum Hall Effect [cond-mat.mes-hall]
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المؤلفون: Remi Helleboid, Philippe Dollfus, Jeremy Grebot, Thibauld Cazimajou, Jérôme Saint-Martin, Denis Rideau, Marco G. Pala
المساهمون: Centre de Nanosciences et de Nanotechnologies (C2N), Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)
المصدر: IEEE Journal of the Electron Devices Society
IEEE Journal of the Electron Devices Society, IEEE Electron Devices Society, 2021, pp.1-1. ⟨10.1109/JEDS.2021.3127013⟩
IEEE Journal of the Electron Devices Society, Vol 9, Pp 1098-1102 (2021)مصطلحات موضوعية: Physics, Quenching, Coupling, Photon, Silicon, Physics::Instrumentation and Detectors, Monte Carlo method, chemistry.chemical_element, Photodetector, Monte Carlo methods, Avalanche breakdown, TK1-9971, Electronic, Optical and Magnetic Materials, Computational physics, chemistry, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], Electrical engineering. Electronics. Nuclear engineering, avalanche photodiodes, Electrical and Electronic Engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [PHYS.COND.CM-MSQHE]Physics [physics]/Condensed Matter [cond-mat]/Mesoscopic Systems and Quantum Hall Effect [cond-mat.mes-hall], Biotechnology, Diode
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المؤلفون: Y. oussaiti, Marco G. Pala, E. Bourreau, H. Wehbe Alause, Dominique Golanski, Sara Pellegrini, T. Cazimajou, G. Mugny, Philippe Dollfus, Megan Agnew, C.E. Vlimant, Jérôme Saint-Martin, I. Nicholson, Bastien Mamdy, Remi Helleboid, A. Lopez, J. Grebot, Denis Rideau
المساهمون: Centre de Nanosciences et de Nanotechnologies (C2N), Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)
المصدر: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Sep 2021, Dallas, United States. pp.293-296, ⟨10.1109/SISPAD54002.2021.9592567⟩مصطلحات موضوعية: 010302 applied physics, Physics, Photon, Detector, Monte Carlo method, Ranging, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Single-photon avalanche diode, 0103 physical sciences, Electronic engineering, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], Figure of merit, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 0210 nano-technology, ComputingMilieux_MISCELLANEOUS, [PHYS.COND.CM-MSQHE]Physics [physics]/Condensed Matter [cond-mat]/Mesoscopic Systems and Quantum Hall Effect [cond-mat.mes-hall], Diode, Jitter
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e992be93be8768a49e21e7eb290113b1
https://hal.archives-ouvertes.fr/hal-03445562/document -
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المؤلفون: Anne Hémeryck, Nicolas Salles, Layla Martin-Samos, Sylvain Joblot, Antoine Jay, Pierre-Louis Julliard, Thomas Cabout, Fuccio Cristiano, Frederic Monsieur, Denis Rideau, Nicolas Guitard, Miha Gunde
المساهمون: Équipe Modélisation Multi-niveaux des Matériaux (LAAS-M3), Laboratoire d'analyse et d'architecture des systèmes (LAAS), Université Toulouse - Jean Jaurès (UT2J)-Université Toulouse 1 Capitole (UT1), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées-Université Toulouse - Jean Jaurès (UT2J)-Université Toulouse 1 Capitole (UT1), Université Fédérale Toulouse Midi-Pyrénées, Équipe Matériaux et Procédés pour la Nanoélectronique (LAAS-MPN), STMicroelectronics [Crolles] (ST-CROLLES), CNR Istituto Officina dei Materiali (IOM), Consiglio Nazionale delle Ricerche [Roma] (CNR), European Project: 871813,H2020-EU.2.1.1. - INDUSTRIAL LEADERSHIP - Leadership in enabling and industrial technologies - Information and Communication Technologies (ICT) ,MUNDFAB (2020), Université Toulouse Capitole (UT Capitole), Université de Toulouse (UT)-Université de Toulouse (UT)-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université Toulouse - Jean Jaurès (UT2J), Université de Toulouse (UT)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Université Toulouse Capitole (UT Capitole), Université de Toulouse (UT), National Research Council of Italy | Consiglio Nazionale delle Ricerche (CNR)
المصدر: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Sep 2021, Dallas, United States. ⟨10.1109/SISPAD54002.2021.9592580⟩
2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Sep 2021, Dallas, United States. pp.219-223, ⟨10.1109/SISPAD54002.2021.9592580⟩
International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Sep 2021, Dallas, United States. pp.219-223, ⟨10.1109/SISPAD54002.2021.9592580⟩مصطلحات موضوعية: 010302 applied physics, [PHYS]Physics [physics], Materials science, TCAD, Silicon, Monte Carlo method, chemistry.chemical_element, 02 engineering and technology, Kinetic Monte Carlo, 021001 nanoscience & nanotechnology, process simulation, 01 natural sciences, Computational physics, chemistry, Ab initio quantum chemistry methods, 0103 physical sciences, Boron-Oxygen complex, Process simulation, Diffusion (business), 0210 nano-technology, Technology CAD, Refining (metallurgy)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::45228f73c6e2fcd96d8186290f1d55eb
https://hal.laas.fr/hal-03366600 -
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المؤلفون: Remi Helleboid, Denis Rideau, Isobel Nicholson, Norbert Moussy, Olivier Saxod, Marie Basset, Jeremy Grebot, Antonin Zimmerman, Bastien Mamdy, Dominique Golanski, Megan Agnew, Sara Pellegrini, Mathieu Sicre
المصدر: ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9889f3e0e75fe986a2d3e83d51efd9a0
https://doi.org/10.1109/essderc53440.2021.9631801