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1مؤتمر
المؤلفون: Kung, C.H., Devaney, M.J., Wu, P.T., Hsiao, H.H., Lee, Y.C.
المصدر: 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE. 1:639-643 2005
Relation: 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings
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2مؤتمر
المؤلفون: Eren, L., Baskirt, O., Devaney, M.J.
المصدر: 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE. 2:834-837 2005
Relation: 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings
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3مؤتمر
المؤلفون: Chau-Shing Wang, Devaney, M.J., Shih-Wei Yang
المصدر: Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Instrumentation and measurement technology Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE. 2:1378-1382 Vol.2 2004
Relation: Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference
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4مؤتمر
المؤلفون: Eren, L., Karahoca, A., Devaney, M.J.
المصدر: Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Instrumentation and measurement technology Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE. 3:1657-1660 Vol.3 2004
Relation: Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference
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5مؤتمر
المؤلفون: Eren, L., Unal, M., Devaney, M.J.
المصدر: Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Instrumentation and measurement technology Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE. 3:2111-2114 Vol.3 2004
Relation: Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference
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6مؤتمر
المؤلفون: Chau-Shing Wang, Devaney, M.J.
المصدر: Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Instrumentation and measurement technology Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE. 1:355-360 2003
Relation: 2003 Instrumentation and Measurement Technology Conference (IMTC 2003)
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7مؤتمر
المؤلفون: Eren, L., Devaney, M.J.
المصدر: Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Instrumentation and measurement technology Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE. 1:411-414 2003
Relation: 2003 Instrumentation and Measurement Technology Conference (IMTC 2003)
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8مؤتمر
المؤلفون: Eren, L., Devaney, M.J.
المصدر: IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Instrumentation and measurement technology Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE. 2:1039-1042 vol.2 2002
Relation: IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference
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9مؤتمر
المؤلفون: Eren, L., Devaney, M.J.
المصدر: IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Instrumentation and measurement technology Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE. 2:1467-1470 vol.2 2002
Relation: IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference
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10مؤتمر
المؤلفون: Eren, L., Devaney, M.J.
المصدر: IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Instrumentation and measurement technology Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE. 2:1643-1647 vol.2 2002
Relation: IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference