يعرض 1 - 10 نتائج من 251 نتيجة بحث عن '"Di Guglielmo, G."', وقت الاستعلام: 1.17s تنقيح النتائج
  1. 1
    دورية أكاديمية

    المصدر: IEEE Embedded Systems Letters IEEE Embedded Syst. Lett. Embedded Systems Letters, IEEE. 13(4):194-197 Dec, 2021

  2. 2
    دورية أكاديمية

    المصدر: Journal of Lightwave Technology J. Lightwave Technol. Lightwave Technology, Journal of. 38(10):2815-2825 May, 2020

  3. 3
    دورية أكاديمية
  4. 4
    دورية أكاديمية

    المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 37(11):2685-2696 Nov, 2018

  5. 5
    مؤتمر

    المصدر: Eleventh IEEE European Test Symposium (ETS'06) European Test Symposium Test Symposium, 2006. ETS '06. Eleventh IEEE European. :179-184 2006

    Relation: Eleventh IEEE European Test Symposium

  6. 6
    دورية أكاديمية

    المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 36(3):435-448 Mar, 2017

  7. 7
    مؤتمر

    المصدر: 2008 IEEE International High Level Design Validation and Test Workshop High Level Design Validation and Test Workshop, 2008. HLDVT '08. IEEE International. :117-124 Nov, 2008

    Relation: 2008 IEEE International High Level Design Validation and Test Workshop (HLDVT)

  8. 8
    مؤتمر

    المصدر: 2008 11th International Biennial Baltic Electronics Conference Electronics Conference, 2008. BEC 2008. 11th International Biennial Baltic. :143-146 Oct, 2008

    Relation: 2008 International Biennial Baltic Electronics Conference (BEC2008)

  9. 9
    مؤتمر

    المصدر: 2005 Sixth International Workshop on Microprocessor Test and Verification Microprocessor Test and Verification, 2005. MTV '05. Sixth International Workshop on. :70-75 Nov, 2005

    Relation: 2005 Sixth International Workshop on Microprocessor Test and Verification

  10. 10