يعرض 1 - 10 نتائج من 387 نتيجة بحث عن '"Di Si"', وقت الاستعلام: 1.40s تنقيح النتائج
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    مؤتمر

    المصدر: 2023 IEEE MTT-S International Wireless Symposium (IWS) Wireless Symposium (IWS), 2023 IEEE MTT-S International. :1-3 May, 2023

    Relation: 2023 IEEE MTT-S International Wireless Symposium (IWS)

  3. 3
    مؤتمر

    المصدر: 2023 International Conference on Microwave and Millimeter Wave Technology (ICMMT) Microwave and Millimeter Wave Technology (ICMMT), 2023 International Conference on. :1-3 May, 2023

    Relation: 2023 International Conference on Microwave and Millimeter Wave Technology (ICMMT)

  4. 4
    مؤتمر

    المصدر: 2021 IEEE Asia-Pacific Microwave Conference (APMC) Microwave Conference (APMC), 2021 IEEE Asia-Pacific. :491-493 Nov, 2021

    Relation: 2021 IEEE Asia-Pacific Microwave Conference (APMC)

  5. 5
    مؤتمر

    المصدر: 2021 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) Advanced Materials and Processes for RF and THz Applications (IMWS-AMP), 2021 IEEE MTT-S International Microwave Workshop Series on. :65-67 Nov, 2021

    Relation: 2021 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)

  6. 6
    مؤتمر

    المصدر: 2021 IEEE MTT-S International Wireless Symposium (IWS) Wireless Symposium (IWS), 2021 IEEE MTT-S International. :1-3 May, 2021

    Relation: 2021 IEEE MTT-S International Wireless Symposium (IWS)

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    مؤتمر

    المصدر: 2020 IEEE MTT-S International Wireless Symposium (IWS) Wireless Symposium (IWS), 2020 IEEE MTT-S International. :1-3 Sep, 2020

    Relation: 2020 IEEE MTT-S International Wireless Symposium (IWS)

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    مؤتمر

    المؤلفون: Jin, Jian, Di, Si, Hua, Yu, Qi, Jiadong

    المصدر: 2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2018 IEEE International Conference on. :23-27 Aug, 2018

    Relation: 2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)