المؤلفون: N. Derrier, Paulius Sakalas, Andrej Rumiantsev, Didier Celi, Michael Schroter

المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ISBN: 9781003338994

مصطلحات موضوعية: Data set, Accuracy and precision, Materials science, Heterojunction bipolar transistor, Electronic engineering, Calibration, Sensitivity (control systems), BiCMOS, Residual, Signal

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f34ec3177f572383b42da38407cf9987
https://doi.org/10.1201/9781003338994-24

المؤلفون: Didier Celi, Zoltan Huszka, Anjan Chakravorty, K Nidhin

المصدر: IEEE Transactions on Electron Devices. 68:491-496

مصطلحات موضوعية: 010302 applied physics, Materials science, Thermal resistance, Spice, Transistor, Bipolar junction transistor, Order (ring theory), Hardware_PERFORMANCEANDRELIABILITY, 01 natural sciences, Electronic, Optical and Magnetic Materials, Computational physics, law.invention, Silicon-germanium, chemistry.chemical_compound, Thermal conductivity, chemistry, law, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, Junction temperature, Electrical and Electronic Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ca5a2558838e469d360f17c9c0dedac8
https://doi.org/10.1109/ted.2020.3045688

المؤلفون: Sebastien Fregonese, Chhandak Mukherjee, Holger Rucker, Pascal Chevalier, Gerhard Fischer, Didier Celi, Marina Deng, Marine Couret, Francois Marc, Cristell Maneux, Thomas Zimmer

المصدر: 2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9d7b28b5757ba10ce9bec781a0089fc7
https://doi.org/10.1109/bcicts50416.2021.9682476

المؤلفون: Didier Celi, Nicolas Derrier, Thomas Zimmer, Magali De Matos, Marina Deng, Sebastien Fregonese

المساهمون: Laboratoire de l'intégration, du matériau au système (IMS), Université Sciences et Technologies - Bordeaux 1 (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics, IPCEI NANO 2022, European Project: 737454,H2020,H2020-ECSEL-2016-1-RIA-two-stage,TARANTO(2017)

المصدر: IEEE Transactions on Electron Devices
IEEE Transactions on Electron Devices, 2021, 68 (12), pp.6007-6014. ⟨10.1109/TED.2021.3118671⟩

مصطلحات موضوعية: [SPI]Engineering Sciences [physics], business.industry, Optoelectronics, Figure of merit, Electrical and Electronic Engineering, business, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::41e2d8a2afa08333731a5907c286e976
https://hal.science/hal-03776416/file/IEEE_TED_Fregonese_Probes_110GHz_AFT_review_3_clean.pdf

المؤلفون: Marco Cabbia, Thomas Zimmer, Didier Celi, Chandan Yadav, Arnaud Curutchet, Magali De Matos, Marina Deng, Sebastien Fregonese

المساهمون: Laboratoire de l'intégration, du matériau au système (IMS), Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université Sciences et Technologies - Bordeaux 1, Projet Région Nouvelle Aquitaine FAST, European Project: 737454,H2020,H2020-ECSEL-2016-1-RIA-two-stage,TARANTO(2017), Université Sciences et Technologies - Bordeaux 1 (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS)

المصدر: 2020 50th European Microwave Conference (EuMC)
2020 50th European Microwave Conference (EuMC), Jan 2021, Utrecht, France. pp.979-982, ⟨10.23919/EuMC48046.2021.9338177⟩

مصطلحات موضوعية: Materials science, business.industry, Heterojunction bipolar transistor, 020208 electrical & electronic engineering, 020206 networking & telecommunications, 02 engineering and technology, Displacement (vector), Electric power transmission, Optics, Transmission line, 11. Sustainability, 0202 electrical engineering, electronic engineering, information engineering, Meander, Calibration, Wafer, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, business, ComputingMilieux_MISCELLANEOUS

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::afd940cfef196726e34cbd4032720b71
https://hal.archives-ouvertes.fr/hal-03173013

المؤلفون: A. Fleury, J. Azevedo Goncalves, I. Sicard, J. Uginet, C. Renard, Charles-Alexandre Legrand, E. Brezza, Nicolas Guitard, Frederic Paillardet, G. Bertrand, M.-L. Rellier, Raphael Paulin, Nathalie Vulliet, M. Buczko, Patrice Garcia, Y. Mourier, Olivier Kermarrec, L. Boissonnet, Cedric Durand, J. Borrel, Pascal Chevalier, D. Ney, Sebastien Cremer, Alexis Gauthier, N. Pelloux, Patrick Scheer, F. Foussadier, Frederic Monsieur, L. Garchery, J. Lajoinie, V. Milon, Didier Celi, E. Canderle, C. Diouf, Eric Granger, N. Derrier, Daniel Gloria, Andre Juge, D. Muller, Frederic Gianesello, A. Pallotta

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: Computer science, Wireless network, business.industry, Electrical engineering, 020206 networking & telecommunications, Soi cmos, 02 engineering and technology, Integrated circuit, BiCMOS, Silicon-germanium, law.invention, chemistry.chemical_compound, chemistry, CMOS, law, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Radio frequency, business, 5G

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2a34e8815f02575f307fe67f0ec7b291
https://doi.org/10.1109/iedm13553.2020.9371954

المؤلفون: Didier Celi, M. Schruter, M. Krattenmacher, A. Mukherjee, A. Pawlak

المصدر: BCICTS

مصطلحات موضوعية: chemistry.chemical_compound, Focus (computing), chemistry, Computer science, Bipolar junction transistor, Industry standard, Code (cryptography), Semiconductor device modeling, Electronic engineering, Silicon-germanium

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b329e106c3378778c28ffa7b2c711251
https://doi.org/10.1109/bcicts48439.2020.9392954

المؤلفون: Soumya Ranjan Panda, Magali De Matos, Marina Deng, Didier Celi, Sebastien Fregonese, Chandan Yadav, Thomas Zimmer, Marco Cabbia, Anjan Chakravorty

المساهمون: Laboratoire de l'intégration, du matériau au système (IMS), Université Sciences et Technologies - Bordeaux 1-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS), National Institute of Technology Calicut, Indian Institute of Technology Madras (IIT Madras), STMicroelectronics [Crolles] (ST-CROLLES), The research leading to these results has received funding from the European Union's Horizon 2020 research and innovation programme under grant agreement no. 737454, project 'TARANTO'., European Project: 737454,H2020,H2020-ECSEL-2016-1-RIA-two-stage,TARANTO(2017), Université Sciences et Technologies - Bordeaux 1 (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS)

المصدر: IEEE Transactions on Electron Devices
IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2020, 67 (11), pp.4770-4776. ⟨10.1109/TED.2020.3022603⟩
IEEE Transactions on Electron Devices, 2020, 67 (11), pp.4770-4776. ⟨10.1109/TED.2020.3022603⟩

مصطلحات موضوعية: EM simulation, Terahertz radiation, Computer science, Spice, thru-reflect-line (TRL), high-current model (bipolar transistor circuits) (HICUM), 01 natural sciences, law.invention, MOSFET, law, compact model, 0103 physical sciences, Frequency measurement, Scattering parameters, Calibration, Electronic engineering, Hardware_INTEGRATEDCIRCUITS, millimeter-wave, maximum oscillation frequency (fMAX), Electronics, Electrical and Electronic Engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, s-parameter measurement, 010302 applied physics, Coupling, on-wafer, Transistor, high frequency, terahertz (THz), Electronic, Optical and Magnetic Materials, heterojunction bipolar transistor (HBT), de-embedding, Extremely high frequency, Solid modeling, high electron mobility transistor (HEMT), Probes, Heterojunction bipolar transistors

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1d9f7f1ed65ed6bed0b10cc5122a4185
https://hal.archives-ouvertes.fr/hal-03015012

المؤلفون: Cristell Maneux, François Marc, Didier Celi, Klaus Aufinger, G.G. Fischer, Chhandak Mukherjee, Thomas Zimmer, Mathieu Jaoul, Marine Couret

المساهمون: Laboratoire de l'intégration, du matériau au système (IMS), Université Sciences et Technologies - Bordeaux 1-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics [Crolles] (ST-CROLLES)

المصدر: Solid-State Electronics
Solid-State Electronics, Elsevier, 2020, 163, pp.107635. ⟨10.1016/j.sse.2019.107635⟩

مصطلحات موضوعية: 010302 applied physics, Materials science, Heterojunction bipolar transistor, Transistor, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Engineering physics, Electronic, Optical and Magnetic Materials, law.invention, Safe operating area, law, 0103 physical sciences, Materials Chemistry, Electrical and Electronic Engineering, Diffusion (business), [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 0210 nano-technology, Recombination current, Hot carrier degradation, ComputingMilieux_MISCELLANEOUS, Dynamic stress, Degradation (telecommunications)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f5089db6744eb7688e1d13db48a9e464
https://hal.archives-ouvertes.fr/hal-02475429/document

المؤلفون: Sebastien Fregonese, Didier Celi, M. De Matos, Marco Cabbia, Thomas Zimmer, Marina Deng

المصدر: 2020 94th ARFTG Microwave Measurement Symposium (ARFTG)

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Heterojunction bipolar transistor, 020206 networking & telecommunications, 02 engineering and technology, 01 natural sciences, Capacitance, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Calibration, Embedding, Optoelectronics, Device under test, Wafer, Parasitic extraction, business, Realization (systems)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2b86ce4bd557be685673cd7e93c97462
https://doi.org/10.1109/arftg47584.2020.9071733